Ion–surface interactions during thin film deposition (Englisch)
- Neue Suche nach: Takagi, T.
- Neue Suche nach: Takagi, T.
In:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
;
2
, 2
;
382-388
;
1984
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Ion–surface interactions during thin film deposition
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Weitere Titelangaben:Ion–surface interactions
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Beteiligte:Takagi, T. ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: American Vacuum Society
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Erscheinungsdatum:01.04.1984
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Format / Umfang:7 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 2, Ausgabe 2
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Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 97
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Device physics and technology of III–V compoundsWieder, H. H. et al. | 1984
- 104
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History of the American Vacuum Society and the International Union for Vacuum Science, Technique, and ApplicationsLafferty, J. M. et al. | 1984
- 110
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Early applications of vacuum, from Aristotle to LangmuirMadey, Theodore E. et al. | 1984
- 118
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Comments on the history of vacuum pumpsHablanian, M. H. et al. | 1984
- 126
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The development of valves, connectors, and traps for vacuum systems during the 20th centurySingleton, J. H. et al. | 1984
- 132
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The measurement of vacuum pressuresRedhead, P. A. et al. | 1984
- 139
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Atoms and electrons at surfaces: A modern scientific revolutionDuke, C. B. et al. | 1984
- 144
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The future of vacuum technologyHobson, J. P. et al. | 1984
- 150
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Effect of gas composition on vacuum measurementPoulter, K. F. et al. | 1984
- 159
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Causes of unstable and nonreproducible sensitivities in Bayard–Alpert ionization gaugesArnold, P. C. / Bills, D. G. et al. | 1984
- 163
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New ionization gauge geometries providing stable and reproducible sensitivitiesBills, D. G. / Arnold, P. C. / Dodgen, S. L. / Van Cleve, C. B. et al. | 1984
- 168
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Unidirectional vacuum gauge by means of detecting excited neutralsArakawa, I. / Kim, M. / Tuzi, Y. et al. | 1984
- 172
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Summary Abstract: Industrial vacuum measurement and controlEnglish, J. et al. | 1984
- 174
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Vacuum pump fluidsO’Hanlon, John F. et al. | 1984
- 182
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Advanced turbomolecular pumps used to pump reactive and abrasive mediaGotz, D. G. / Henning, H.‐H. / Augustine, C. M. et al. | 1984
- 187
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Use of refrigerator‐cooled cryopumps in sputtering plantsKlein, H.‐H. / Heisig, R. / Augustine, C. M. et al. | 1984
- 191
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A Zr–Al composite‐cathode sputter‐ion pumpOkano, T. / Ohsaki, A. / Tuzi, Y. et al. | 1984
- 195
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Use of discharge intensity for evaluation of pumping characteristics of a sputter ion pumpPierini, M. et al. | 1984
- 198
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Summary Abstract: Quantitative particulate contamination studies utilizing reduced turbulence pumping and ventingHoh, Peter D. et al. | 1984
- 200
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Perspectives on residual gas analysisLichtman, D. et al. | 1984
- 206
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Vacuum outgassing of various materialsErikson, E. D. / Beat, T. G. / Berger, D. D. / Frazier, B. A. et al. | 1984
- 212
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Preparation of surfaces for high quality interface formationVossen, J. L. / Thomas, J. H. / Maa, J.‐S. / O’Neill, J. J. et al. | 1984
- 216
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Summary Abstract: Current metallization issues in microelectronic devicesTu, K. N. et al. | 1984
- 218
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Grain structure variation with temperature for evaporated metal filmsHentzell, H. T. G. / Grovenor, C. R. M. / Smith, D. A. et al. | 1984
- 220
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Lot‐to‐lot variations in electromigration performance for thin film microcircuitsSmith, P. M. / Lloyd, J. R. / Prokop, G. S. et al. | 1984
- 225
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The effect of hydrogen chemisorption on the conductivity of evaporated aluminum filmsShih, D. Y. / Ficalora, P. J. et al. | 1984
- 231
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Optimized process parameters for high volume wafer metallizationReineck, Stefan / Lenz, Werner et al. | 1984
- 237
-
Radio frequency magnetron sputtering of radio frequency biased quartz on a scanning palletMumtaz, A. / Drapkin, I. / Mathew, R. et al. | 1984
- 241
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Summary Abstract: Electromigration studies of Al‐intermetallic structuresKwok, T. / Ho, P. S. / Huang, H.‐C. W. et al. | 1984
- 242
-
Summary Abstract: The effects of contaminants on aluminum film propertiesReimer, J. D. et al. | 1984
- 244
-
Plasma‐enhanced CVD: Oxides, nitrides, transition metals, and transition metal silicidesHess, Dennis W. et al. | 1984
- 253
-
Chemical reaction and silicide formation at the Pt/Si interfaceMatz, R. / Purtell, R. J. / Yokota, Y. / Rubloff, G. W. / Ho, P. S. et al. | 1984
- 259
-
MO/Ti bilayer metallization for a self‐aligned TiSi2 processPark, H. K. / Sachitano, J. / Eiden, G. / Lane, E. / Yamaguchi, T. et al. | 1984
- 264
-
Effects of ion implantation doping on the formation of TiSi2Park, H. K. / Sachitano, J. / McPherson, M. / Yamaguchi, T. / Lehman, G. et al. | 1984
- 269
-
Summary Abstract: Electronic structure investigation of epitaxial nickel silicides on Si(001)Gignac, W. J. / Kim, S. / Williams, R. S. et al. | 1984
- 270
-
Summary Abstract: Formation of silicides by the interaction of thin films of codeposited refractory metals with Si: Alloying V with Ta versus alloying V with TiAppelbaum, A. / Eizenberg, M. et al. | 1984
- 271
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Summary Abstract: Electronic transport properties of refractory metal disilicidesMalhotra, V. / Martin, T. L. / Huang, M. T. / Mahan, J. E. et al. | 1984
- 273
-
Barrier layers: Principles and applications in microelectronicsWittmer, Marc et al. | 1984
- 281
-
Reactively sputtered ZrN used as an Al/Si diffusion barrier in a Zr contact to siliconÖstling, M. / Nygren, S. / Petersson, C. S. / Norström, H. / Wiklund, P. / Buchta, R. / Blom, H‐O. / Berg, S. et al. | 1984
- 284
-
Characteristics of dc magnetron, reactively sputtered TiNx films for diffusion barriers in III–V semiconductor metallizationNoël, J.‐P. / Houghton, D. C. / Este, G. / Shepherd, F. R. / Plattner, H. et al. | 1984
- 288
-
Comparative study of Nb and TiW barrier layers between Au and a‐SiO2Liehr, M. / Delrue, J. P. / Caudano, R. / Herbots, N. / Vanden Berghe, R. A. L. / Vlaeminck, R. / Loos, H. et al. | 1984
- 292
-
Properties of interfaces in (CdZn)S/CuInSe2 heterojunctionsKazmerski, L. L. / Ahrenkiel, R. K. / Matson, R. J. / Massopust, T. P. / Dick, J. R. / Osterwald, C. R. / Ireland, P. J. / Jones, K. M. et al. | 1984
- 296
-
Anomalous transport properties of a new compositionally modulated semiconductor–semimetal system: PbTe–BiShin, Sung C. / Hilliard, J. E. / Ketterson, J. B. et al. | 1984
- 300
-
Summary Abstract: Investigation of diffusion barriers by Auger spectroscopyLewis, J. E. / Ho, P. S. / Köster, U. et al. | 1984
- 301
-
Summary Abstract: Preparation and optical properties of reactively evaporated VO2 thin filmsNyberg, Glen A. / Buhrman, R. A. et al. | 1984
- 303
-
Radio frequency magnetron sputtering of multicomponent ferroelectric oxidesKrupanidhi, S. B. / Sayer, M. et al. | 1984
- 307
-
Reactive sputtered copper indium diselenide films for photovoltaic applicationsThornton, John A. / Cornog, David G. / Hall, R. B. / Shea, S. P. / Meakin, J. D. et al. | 1984
- 312
-
Preparation–physical structure relations in SiC sputtered filmsRoy, R. A. / Messier, R. et al. | 1984
- 316
-
Electrical transport properties of AlN/Al cermets produced by voltage controlled, reactive, dc, planar magnetron sputteringAffinito, J. / Fortier, N. / Parsons, R. R. et al. | 1984
- 322
-
Radio frequency sputter deposited boron nitride filmsWiggins, M. D. / Aita, C. R. / Hickernell, F. S. et al. | 1984
- 326
-
Planar magnetron sputtering of a‐Si:H and a‐Ge:H thin filmsRudder, R. A. / Cook, J. W. / Schetzina, J. F. / Lucovsky, G. et al. | 1984
- 330
-
Summary Abstract: Relationships between stress and local hydrogen bonding in sputtered SiN:HMartin, P. M. et al. | 1984
- 332
-
Highly photoconducting O2‐doped CdS films deposited by spray pyrolysisRichards, D. / El‐Korashy, A. M. / Stirn, R. J. / Karulkar, P. C. et al. | 1984
- 336
-
Modification of the electrochromic response of WO3 thin films by oxygen backfillingSun, S.‐S. / Holloway, P. H. et al. | 1984
- 341
-
The preparation and characterization of optical thin films produced by ion‐assisted depositionMartin, P. J. / Netterfield, R. P. / Sainty, W. G. / Pacey, C. G. et al. | 1984
- 346
-
Defect measurements in digital optical disksShrawagi, S. / Chen, D. / Robinson, R. S. / Rossnagel, S. M. et al. | 1984
- 350
-
Growth morphology determination in the initial stages of epitaxy by XPSEgelhoff, W. F. et al. | 1984
- 353
-
Coupled local mode vibrations in a‐Si alloy filmsLucovsky, G. / Chao, S. S. / Yang, J. / Tyler, J. E. / Czubatyj, W. et al. | 1984
- 358
-
Auger studies on rapid grain boundary diffusion of Ge through AuIngrey, S. / MacLaurin, B. et al. | 1984
- 362
-
Summary Abstract: Characterization of sputtered zinc sulfide filmsEmma, T. / McDonough, M. et al. | 1984
- 364
-
Summary Abstract: On NiO and CoO solar thermal absorbersCook, J. G. et al. | 1984
- 365
-
Summary Abstract: Optical, Raman, and photoemission results on amorphous ‘‘diamondlike’’ carbon filmsMathine, David / Dillon, Rodney O. / Khan, A. Azim / Bu‐Abbud, George / Woollam, John A. / Liu, David C. / Banks, Bruce / Domitz, Stan et al. | 1984
- 367
-
Summary Abstract: Submicron x‐ray lithography using laser produced plasma as a sourceYaakobi, B. / Kim, H. / Soures, J. M. / Deckman, H. W. / Dunsmuir, J. et al. | 1984
- 369
-
Properties and applications of diamondlike carbon filmsAisenberg, S. et al. | 1984
- 372
-
The use of ion beam sputtered optical coatings as protective overcoatsCole, B. E. / Moravec, T. J. / Ahonen, R. G. / Ehlert, L. B. et al. | 1984
- 376
-
X‐ray photoelectron spectroscopy of ion beam sputter deposited SiO2, TiO2, and Ta2O5Rossnagel, S. M. / Sites, J. R. et al. | 1984
- 380
-
Summary Abstract: Styrene and vinyldimethylethoxysilane plasma polymerization and plasma copolymerizationProhaska, G. W. / Evans, J. F. et al. | 1984
- 382
-
Ion–surface interactions during thin film depositionTakagi, T. et al. | 1984
- 389
-
Direct‐current‐magnetron deposition of molybdenum and tungsten with rf‐substrate biasBensaoula, A. / Wolfe, J. C. / Ignatiev, A. / Fong, F‐O. / Leung, T‐S. et al. | 1984
- 393
-
Accelerated ion doping in Si MBEOta, Yusuke et al. | 1984
- 401
-
Metal clusters in plasma polymerized fluorocarbon films: Cobalt–aluminumKay, Eric / Hecq, M. et al. | 1984
- 405
-
Summary Abstract: A quantitative ion beam process applied to the deposition of aluminum nitride thin filmsHarper, J. M. E. / Hentzell, H. T. G. / Cuomo, J. J. et al. | 1984
- 406
-
Summary Abstract: Model calculations for thermal and accelerated beam doping in semiconductor films grown by molecular beam epitaxyBarnett, S. A. / Rockett, A. / Bajor, G. / Greene, J. E. et al. | 1984
- 409
-
The preparation of materials for optoelectronic applications by molecular beam epitaxyTsang, W. T. et al. | 1984
- 415
-
Epitaxial relations in alkaline earth fluoride–semiconductor systemsPhillips, Julia M. / Yashinovitz, C. J. et al. | 1984
- 418
-
Epitaxial growth and electronic structure of CdTe filmsPessa, M. / Jylhä, O. / Huttunen, P. / Herman, M. A. et al. | 1984
- 423
-
Growth of CdTe films on alternative substrates by molecular beam epitaxyBicknell, R. N. / Myers, T. H. / Schetzina, J. F. et al. | 1984
- 427
-
Summary Abstract: A review of the epitaxial growth of compound and alloy semiconductors by sputter depositionGreene, J. E. et al. | 1984
- 428
-
Summary Abstract: Epitaxial InP/fluoride/InP(001) double heterostructures grown by molecular‐beam epitaxyTu, C. W. / Forrest, S. R. / Johnston, W. D. et al. | 1984
- 429
-
Plasma enhanced chemical vapor deposition of thin crystalline semiconductor and conductor filmsReif, Rafael et al. | 1984
- 436
-
GexSi1−x/Si strained‐layer superlattice grown by molecular beam epitaxyBean, J. C. / Feldman, L. C. / Fiory, A. T. / Nakahara, S. / Robinson, I. K. et al. | 1984
- 441
-
Reactivity of intermetallic thin films formed by the surface mediated decomposition of main group organometallic compoundsDubois, L. H. / Nuzzo, R. G. et al. | 1984
- 446
-
The adsorption of PH3 on Si(100) and its effect on the coadsorption of SiH4Yu, Ming L. / Meyerson, B. S. et al. | 1984
- 450
-
Homogeneous chemical vapor depositionScott, B. A. / Olbricht, W. L. / Meyerson, B. A. / Reimer, J. A. / Wolford, D. J. et al. | 1984
- 457
-
Atomic correlations during the first stages of epitaxyPimbley, J. M. / Lu, T.‐M. et al. | 1984
- 461
-
Alternate method to fabricate doped hydrogenated amorphous silicon filmHuang, F. S. / Wang, Y. Y. et al. | 1984
- 464
-
Dry etching for submicron structuresWolf, E. D. / Adesida, I. / Chinn, J. D. et al. | 1984
- 470
-
Self‐limiting etch depths using simultaneous sputter etching/deposition techniqueBerg, S. / Gelin, B. / Östling, M. / Babulanam, S. M. et al. | 1984
- 474
-
Hydrogen mixing effects on reactive ion etching of GaAs in chlorine containing gasesSemura, Shigeru / Saitoh, Hiroshi et al. | 1984
- 477
-
Etching of diamond with argon and oxygen ion beamsWhetten, Timothy J. / Armstead, Angela A. / Grzybowski, Thomas A. / Ruoff, Arthur L. et al. | 1984
- 481
-
End point detection in ion milling processes by sputter‐induced optical emission spectroscopyLu, C. / Dorian, M. / Tabei, M. / Elsea, A. et al. | 1984
- 485
-
Summary Abstract: High‐contrast end point detection and plasma diagnostics for the polysilicon/oxide interfaceMonahan, Kevin M. et al. | 1984
- 487
-
Ion‐assisted etching of silicon by molecular chlorineSanders, F. H. M. / Kolfschoten, A. W. / Dieleman, J. / Haring, R. A. / Haring, A. / de Vries, A. E. et al. | 1984
- 492
-
SIMS study of ion assisted etching of Si by Cl2Vitkavage, D. J. / Ameen, M. S. / Mayer, T. M. et al. | 1984
- 496
-
Microwave plasma stream transport system for low temperature plasma oxidationMiyake, Kiyoshi / Kimura, Shin’ichiro / Warabisako, Terunori / Sunami, Hideo / Tokuyama, Takashi et al. | 1984
- 500
-
Revised structure zone model for thin film physical structureMessier, R. / Giri, A. P. / Roy, R. A. et al. | 1984
- 504
-
Summary Abstract: Low‐temperature deposition and removal of material using laser‐induced chemistryOsgood, R. M. / Gilgen, H. H. / Brewer, Peter et al. | 1984
- 505
-
Summary Abstract: CF4/Si surface reactions: Evidence for parallel etching mechanisms from modulated ion beam studiesMcNevin, S. C. / Becker, G. E. et al. | 1984
- 506
-
Summary Abstract: Laser‐controlled plasma etchingReksten, Grace / Holber, W. / Osgood, R. M. et al. | 1984
- 508
-
Order, disorder, and band discontinuities at ZnSe–Ge heterojunctionsMargaritondo, G. / Capasso, C. / Patella, F. / Perfetti, P. / Quaresima, C. / Savoia, A. / Sette, F. et al. | 1984
- 511
-
LEED and AES characterization of the GaAs(110)–ZnSe interfaceTu, D.‐W. / Kahn, A. et al. | 1984
- 515
-
The atomic geometries of GaP(110) and ZnS(110) revisited: A structural ambiguity and its resolutionDuke, C. B. / Paton, A. / Kahn, A. et al. | 1984
- 519
-
Plasmons and intersubband plasmons of a superlatticeBloss, W. L. et al. | 1984
- 524
-
Schottky barrier formation on amorphous semiconductors: Au on Ge(111), a‐Ge, and hydrogenated a‐GeQuaresima, C. / Perfetti, P. / Daniels, R. R. / Margaritondo, G. et al. | 1984
- 527
-
Summary Abstract: Molecular beam epitaxial growth of CdTe films on InSbFarrow, R. F. C. / Noreika, A. J. / Shirland, F. A. / Takei, W. J. / Wood, S. / Greggi, J. / Francombe, M. H. et al. | 1984
- 528
-
Summary Abstract: Lattice‐matched single‐crystalline dielectric films (BaxSr1−xF2) on InP(001) grown by molecular‐beam epitaxyTu, C. W. / Sheng, T. T. / Macrander, A. T. / Phillips, J. M. / Guggenheim, H. J. et al. | 1984
- 529
-
Summary Abstract: Intrinsic unoccupied surface states at GaP(110)Straub, D. / Altmann, W. / Scheidt, H. / Dose, V. et al. | 1984
- 531
-
Summary Abstract: Basic mechanisms of metal/SiC interface formationBermudez, V. M. et al. | 1984
- 532
-
Summary Abstract: Measurements of surface recombination velocity on CdS surfaces and Au interfacesHuppert, D. / Evenor, M. / Shapira, Y. et al. | 1984
- 534
-
Characterization of the surface net and electronic structure of AuGa2(001)Nelson, Jeffrey G. / Lince, Jeffrey R. / Gignac, William J. / Williams, R. Stanley et al. | 1984
- 538
-
Structure study of Au–GaAs(001) interfaces by HEIS, XPS, and RHEEDNarusawa, Tadashi / Watanabe, Nozomu / Kobayashi, Keisuke L. I. / Nakashima, Hisao et al. | 1984
- 542
-
The interaction of Pd with the InP(110) surfaceKendelewicz, T. / Petro, W. G. / Lindau, I. / Spicer, W. E. et al. | 1984
- 546
-
Deposition of Au overlayers onto cleaved (Hg,Cd)Te surfacesDavis, G. D. / Beck, W. A. / Byer, N. E. / Daniels, R. R. / Margaritondo, G. et al. | 1984
- 551
-
Photoemission studies of atomic redistribution at gold–silicon and aluminum–silicon interfacesBrillson, L. J. / Katnani, A. D. / Kelly, M. / Margaritondo, G. et al. | 1984
- 556
-
Raman spectroscopy of silicide formation at the Pt/crystalline Si interfaceTsang, J. C. / Matz, R. / Yokota, Y. / Rubloff, G. W. et al. | 1984
- 561
-
Noble metal/Si(111) interfaces studied by MeV ion scatteringIto, T. / Gibson, W. M. et al. | 1984
- 566
-
Summary Abstract: GaAs(110)–Al interfaces formed at low temperatureBonapace, C. R. / Li, K. / Kahn, A. et al. | 1984
- 567
-
Summary Abstract: Effect of ion sputtering on the interface chemistry and electrical properties of Au/n‐GaAs(100) Schottky contactsWang, Y. X. / Holloway, P. H. et al. | 1984
- 569
-
Characteristics of the material improvement process for silicon on sapphire by solid phase epitaxial regrowthRichmond, Eliezer Dovid / Knudson, Alvin R. / Magee, T. J. / Kawayoshi, H. / Leung, C. et al. | 1984
- 574
-
The Si–SiO2 interface: Correlation of atomic structure and electrical propertiesHahn, P. O. / Henzler, M. et al. | 1984
- 584
-
Electron escape depth variation in thin SiO2 films measured with variable photon energyHecht, M. H. / Grunthaner, F. J. / Pianetta, P. / Johansson, L. I. / Lindau, I. et al. | 1984
- 588
-
Thermal oxidation of GaPKato, Y. / Geib, K. M. / Gann, R. G. / Brusenback, P. R. / Wilmsen, C.W. et al. | 1984
- 593
-
Species‐specific densities of states of Ga and As in the chemisorption of H2O on GaAs(110)Childs, K. D. / Luo, W.‐A. / Lagally, M. G. et al. | 1984
- 597
-
Summary Abstract: A review of silicon‐on‐insulator formation by oxygen ion implantationPinizzotto, Russell F. et al. | 1984
- 598
-
Summary Abstract: Photoenhanced oxidation of gallium arsenideBermudez, V. M. et al. | 1984
- 600
-
Summary Abstract: Nondestructive analysis of native oxides and interfaces on Hg1−xCdxTeAspnes, D. E. / Arwin, H. et al. | 1984
- 619
-
Depolarization of D–T plasmas by recycling in material wallsGreenside, H. S. / Budny, R. V. / Post, D. E. et al. | 1984
- 630
-
Gas release from first wall coatings under electron impactAuciello, O. / Haasz, A. A. / Stangeby, P. C. et al. | 1984
- 634
-
Summary Abstract: Plasma‐materials interactions and the design of high heat flux componentsGauster, W. B. / Koski, J. A. / Watson, R. D. et al. | 1984
- 635
-
Summary Abstract: A specialization of low‐energy ion scattering spectroscopy and its application to surface studies of TiCAono, Masakazu et al. | 1984
- 636
-
Summary Abstract: Permeation of hydrogen through CVD silicon carbideSinharoy, S. / Lange, W. J. et al. | 1984
- 638
-
Summary Abstract: Ion impact desorption mechanisms—the role of the substrateBastasz, R. et al. | 1984
- 639
-
Summary Abstract: The origin of electron bombardment enhanced reactivity of graphite with hydrogenAshby, C. I. H. et al. | 1984
- 641
-
Pellet acceleration study with a railgun for magnetic fusion reactor refuelingHonig, J. / Kim, K. et al. | 1984
- 645
-
Preparation and analysis of carbon foils implanted with 100 μCi cm−2 of tritiumTimberlake, J. / Kerst, R. / Causey, R. / Cohen, S. / Fennimore, J. / Manos, D. / Strachan, J. et al. | 1984
- 649
-
Inertial fusion target fabrication using polystyrene mandrelsKim, Hyo‐gun / Powers, Thomas F. / Mason, James F. et al. | 1984
- 653
-
Summary Abstract: Control of gas input and background pressure in the end plug regions of the TMX‐U thermal barrier experimentTurner, W. C. / Nexsen, W. E. / Allen, S. L. / Hooper, E. B. / Hunt, A. L. / Lang, D. D. / Margolies, D. S. / Pickles, W. L. / Simonen, T. C. et al. | 1984
- 655
-
Neutral beam heating of tokamaks: Past performance and future applicationsEubank, H. P. et al. | 1984
- 660
-
Neutral beams for mirrorsFink, J. H. et al. | 1984
- 666
-
The design and fabrication of a 30 s pulsed plasma generatorBiagi, L. A. / Ehlers, K. W. / Lietzke, A. F. / Matuk, C. A. / Maruyama, Y. / Paterson, J. A. / Tanabe, J. T. et al. | 1984
- 670
-
Generation of H−, D− ions on composite surfaces with application to surface/plasma ion source systemsHiskes, J. R. / Karo, A. M. / Wimmer, E. / Freeman, A. J. / Chubb, S. R. et al. | 1984
- 675
-
Summary Abstract: Radio frequency ion source development for neutral beam applicationLeung, K. N. / Ehlers, K. W. / Kippenhan, D. / Vella, M. C. et al. | 1984
- 676
-
Summary Abstract: H− production from partially cesiated surfaces in the presence of a hydrogen plasmaWada, M. / Pyle, R. V. / Stearns, J. W. et al. | 1984
- 677
-
Summary Abstract: Correlation of the sputter yield of negative hydrogen ions with electronic work functionGreer, J. A. / Seidl, M. et al. | 1984
- 679
-
Characterization of the first wall of TEXTOR with respect to hydrogen recyclingWinter, J. / Waelbroeck, F. G. / Wienhold, P. / Rota, E. / Banno, T. et al. | 1984
- 686
-
Characterization of the TEXTOR plasma edge using deposition probe techniquesZuhr, R. A. et al. | 1984
- 689
-
Edge region hydrogen line emission in the PDX tokamakMcNeill, D. H. / Bell, M. G. / Grek, B. / LeBlanc, B. et al. | 1984
- 693
-
Velocity and electronic state distributions of sputtered Fe atoms by laser‐induced fluorescence spectroscopyYoung, C. E. / Calaway, W. F. / Pellin, M. J. / Gruen, D. M. et al. | 1984
- 698
-
Ground state and excited state sputtering Doppler‐shift laser‐fluorescence studies of Cr and Ca targetsHusinsky, W. / Betz, G. / Girgis, I. et al. | 1984
- 702
-
DITE Langmuir probe results showing probe‐size and limiter‐shadow effectsStangeby, P. C. / McCracken, G. M. / Erents, S. K. / Matthews, G. et al. | 1984
- 707
-
Summary Abstract: Measurement of the ionization length for neutral iron near the wall in the ISX‐B tokamak using laser‐induced fluorescenceCook, T. B. / King, P. W. / Roberto, J. B. et al. | 1984
- 708
-
Summary Abstract: Measurement of impurities in a neutral beam by laser induced fluorescenceBurrell, C. F. / Schlachter, A. S. / Pyle, R. V. / Searle, C. E. et al. | 1984
- 710
-
Evolution of the mirror machineDamm, C. C. et al. | 1984
- 717
-
Electrolytic gettering of tritium from airSouers, P. C. / Tsugawa, R. T. / Stevens, C. G. et al. | 1984
- 721
-
Summary Abstract: Recovery of tritium from tritiated water by reaction with uraniumSwansiger, W. A. / Gabrielson, V. K. / Bradshaw, R. W. et al. | 1984
- 722
-
Summary Abstract: Description and performance of uranium beds used to pump tritium–deuterium at the Tritium Systems Test AssemblyWalthers, Charles R. et al. | 1984
- 723
-
Summary Abstract: Reduction of tritium permeation through iron using aluminum ion implantationMusket, R. G. / Steward, S. A. / Brown, D. W. / Uribe, F. S. et al. | 1984
- 726
-
Beam techniques for the analysis of poorly conducting materialsWerner, H. W. / Warmoltz, N. et al. | 1984
- 732
-
Mechanisms of electron stimulated desorption from soda–silica glass surfacesWang, Y. X. / Ohuchi, F. / Holloway, P. H. et al. | 1984
- 738
-
Glass reactivity in aqueous solutionsBaer, D. R. / Pederson, L. R. / McVay, G. L. et al. | 1984
- 744
-
Characterization of the treated surfaces of silicon alloyed pyrolytic carbon and SiCSmith, K. L. / Black, K. M. et al. | 1984
- 748
-
On the development and use of fast atom beams for the SIMS analysis of polymers and insulatorsRoss, M. M. / Colton, R. J. / Rose, S. L. / Wyatt, J. R. / DeCorpo, J. J. / Campana, J. E. et al. | 1984
- 751
-
Interfacial reaction during metallization of cured polyimide: An XPS studyChou, N. J. / Tang, C. H. et al. | 1984
- 756
-
Chemical bonding at the polyimide surfaceHahn, P. O. / Rubloff, G. W. / Ho, P. S. et al. | 1984
- 761
-
Summary Abstract: Mass spectrometric analysis of organosilanes covalently bonded to metal oxide surfaces: SIMS versus ESDHayes, T. R. / Evans, J. F. et al. | 1984
- 763
-
Use of surface behavior diagrams to study hydration/corrosion of aluminum and steel surfacesDavis, G. D. / Ahearn, J. S. / Venables, J. D. et al. | 1984
- 767
-
XPS characterization of erbium sesquioxide and erbium hydroxideSwami, G. T. K. / Stageberg, F. E. / Goldman, A. M. et al. | 1984
- 771
-
An x‐ray photoelectron and electron energy loss study of the oxidation of leadTaylor, J. Ashley / Perry, Dale L. et al. | 1984
- 775
-
SAM determination of oxygen gradients in Zircaloy‐4Aitchison, I. / Davidson, R. D. et al. | 1984
- 780
-
Deuterium transport kinetics for zirconium and Zircaloys with surface oxidesMitchell, Dean J. et al. | 1984
- 784
-
An Auger/SEM study of the corrosion of β‐brass alloyed with tinBevolo, A. J. / Baikerikar, K. G. / Hansen, R. S. et al. | 1984
- 787
-
Summary Abstract: Surface preparation and corrosion of aluminum and titanium alloysBaun, W. L. / McDevitt, N. T. et al. | 1984
- 788
-
Summary Abstract: SIMS, Auger, and nuclear reaction analysis of N‐implanted Fe alloysBone, W. M. / Colton, R. J. / Singer, I. L. / Gossett, C. R. et al. | 1984
- 789
-
Summary Abstract: Oxygen transport in growing oxide films on chromium as studied by 18O/SIMSMitchell, D. F. / Hussey, R. J. / Graham, M. J. et al. | 1984
- 792
-
Observation of surface states on gold films by electron tunneling spectroscopyLambe, John / Thakoor, A. P. / Khanna, S. K. et al. | 1984
- 795
-
Catalyzed reactions at illuminated semiconductor interfacesWrighton, Mark S. et al. | 1984
- 802
-
Surface characterization by photoemission of adsorbed xenon (PAX)Wandelt, K. et al. | 1984
- 808
-
Rare gas titration studies of Si(111) surfacesDemuth, J. E. / Schell‐Sorokin, A. J. et al. | 1984
- 812
-
Summary Abstract: Naked atom clusters: Models for molecular surfacesCox, D. M. / Rohlfing, E. A. / Trevor, D. / Kaldor, A. et al. | 1984
- 813
-
Summary Abstract: The effect of surface and interface roughness on thin film quantum size effectsJonker, B. T. / Park, Robert L. et al. | 1984
- 813
-
Summary Abstract: Measurement of the conduction electron spin scattering cross sections of rare gas adsorbates on lithiumEigler, D. M. / Schultz, S. et al. | 1984
- 815
-
Probing valence states with photoemission and inverse photoemissionHimpsel, F. J. / Fauster, Th. et al. | 1984
- 822
-
Derivation of the density of unoccupied states in polycrystalline ferromagnetic Fe, Co, and Ni from highly resolved appearance potential spectraSchulz, S. W. / Schleicher, K.‐Th. / Rück, D. M. / Chun, H.‐U. et al. | 1984
- 826
-
Core electron energy loss spectroscopy of cerium: Surface oxidationStrasser, Gregor / Netzer, Falko P. et al. | 1984
- 831
-
GaAs(110)–In: The black sheep in a well‐behaved interface familyDaniels, R. R. / Zhao, Te‐Xiu / Margaritondo, G. et al. | 1984
- 835
-
Noble metal interactions with the InP(110) surfacePetro, W. G. / Kendelewicz, T. / Babalola, I. A. / Lindau, I. / Spicer, W. E. et al. | 1984
- 839
-
Summary Abstract: Exchange split empty energy bands of Fe(110)Dose, V. / Glöbl, M. / Scheidt, H. / Kirschner, J. et al. | 1984
- 840
-
Summary Abstract: Comparison of L3‐shell excitation energies of 3d transition metals obtained by XPS, AEAPS, and EELSErickson, N. E. / Powell, C. J. et al. | 1984
- 841
-
Summary Abstract: The study of surfaces using both ions and metastable atomsHagstrum, H. D. / Chaban, E. E. / Petrie, P. et al. | 1984
- 842
-
Summary Abstract: The influence of O2 and H2O on the surface electronic structure of corundum transition‐metal oxidesKurtz, Richard L. / Henrich, Victor E. et al. | 1984
- 844
-
Initial ordering kinetics of a randomly stepped GaAs(110) surfaceClearfield, H. M. / Lagally, M. G. et al. | 1984
- 847
-
Direct determination of surface structures from photoelectron diffractionBarton, J. J. / Bahr, C. C. / Hussain, Z. / Robey, S. W. / Klebanoff, L. E. / Shirley, D. A. et al. | 1984
- 852
-
An angle‐resolved UPS study of the oxygen‐induced reconstruction of Cu(110)DiDio, R. A. / Zehner, D. M. / Plummer, E. W. et al. | 1984
- 856
-
Surface phases for sulfur and oxygen coadsorbed on Ni60Fe40(100)Lad, R. J. / Schrott, A. G. / Blakely, J. M. et al. | 1984
- 861
-
Summary Abstract: Diffraction from stepped surfacesLent, C. S. / Cohen, P. I. et al. | 1984
- 862
-
Summary Abstract: Pseudodipole selection rules for extended fine structure in APS: Calculations and applicationsMehl, M. J. / Einstein, T. L. / Bryant, G. W. et al. | 1984
- 863
-
Summary Abstract: Multilayer reconstruction of the (2×2) GaAs(111) surfaceTong, S. Y. / Xu, G. / Mei, W. N. et al. | 1984
- 864
-
Summary Abstract: Cleaved Si(111) 2×1 surface studied by MeV ion scatteringIto, T. / Aristov, V. Y. / Gibson, W. M. et al. | 1984
- 866
-
Alkali‐promoted gas adsorption and surface reactions on metalsBonzel, H. P. et al. | 1984
- 873
-
Impurity modification of surface catalyzed reactions: Cyclopropane over sulfided nickelGoodman, D. W. et al. | 1984
- 877
-
Interaction of hydrogen and oxygen on tungsten{100}Smith, A. Horlacher / Chung, J. W. / Estrup, P. J. et al. | 1984
- 881
-
Summary Abstract: The coadsorption of CO and K on Rh(111): An HREELS, TPD, AES, and LEED studyCrowell, J. E. / Somorjai, G. A. et al. | 1984
- 882
-
Summary Abstract: Correlation of surface electronic properties and poison/promoter effects on the reactivity of Ni(100)Houston, J. E. / Rogers, J. W. / Goodman, D. W. / Belton, D. N. et al. | 1984
- 883
-
Summary Abstract: Carbon monoxide and deuterium adsorption on potassium‐dosed Ni(100)Sun, Y.‐M. / Luftman, H. S. / White, J. M. et al. | 1984
- 885
-
Summary Abstract: The reaction of NO with CO on Rh(111): Kinetics and coveragesRoot, T. W. / Schmidt, L. D. / Fisher, G. B. et al. | 1984
- 886
-
Summary Abstract: The reaction of oxygen and aluminum on Rh(111)Semancik, S. et al. | 1984
- 888
-
Finite size effects on reconstruction domains of tungsten(001) surfacesWendelken, J. F. / Wang, G.‐C. et al. | 1984
- 893
-
Summary Abstract: Orientational ordering of an incommensurate sodium layer on Ru(001)Doering, Dale L. / Semancik, Steve et al. | 1984
- 894
-
Summary Abstract: Model for the surface reconstruction phase transition of clean and hydrogen adsorbed W(001) surface and approximate solutionRoelofs, L. D. / Ying, S. C. / Hu, G. Y. et al. | 1984
- 895
-
Summary Abstract: Physical realization of the hard‐square model: Chlorine on Ag(100)Taylor, David E. / Williams, Ellen D. / Park, Robert L. et al. | 1984
- 896
-
Summary Abstract: Adsorption of molecular N2 on Ni(110): The effect of phase transitions on thermodynamic and kinetic phenomenaGrunze, M. / Unertl, W. N. / Golze, M. et al. | 1984
- 898
-
Summary Abstract: Low‐energy electron diffraction study of the phases and phase transitions of oxygen physisorbed on graphiteToney, Michael F. / Fain, Samuel C. et al. | 1984
- 899
-
Theoretical studies of metal clusters and of chemisorption on metalsMessmer, R. P. et al. | 1984
- 905
-
The nature of the metal–CO interaction and bondingBagus, P. S. / Nelin, C. J. / Bauschlicher, C. W. et al. | 1984
- 910
-
X‐ray photoelectron and Auger electron spectroscopic study of the CdTe surface resulting from various surface pretreatments: Correlation of photoelectrochemical and capacitance‐potential behavior with surface chemical compositionRicco, Antonio J. / White, Henry S. / Wrighton, Mark S. et al. | 1984
- 916
-
Differences between positrons and electrons in elastic and inelastic processes at surfacesCanter, K. F. / Lynn, K. G. et al. | 1984
- 922
-
Many‐electron effects in the photoelectron spectra of condensed nitric oxideKao, C. M. / Caves, T. C. / Messmer, R. P. et al. | 1984
- 927
-
A study of the electric field dependence of subthreshold photoemissionReifenberger, R. / Egert, C. M. / Haavig, D. L. et al. | 1984
- 931
-
Summary Abstract: Surface energies in d‐band metalsGay, J. G. / Smith, J. R. / Richter, Roy / Arlinghaus, F. J. / Wagoner, R. H. et al. | 1984
- 932
-
Summary Abstract: Surface electronic structure changes induced by chemisorptionEgelhoff, W. F. et al. | 1984
- 933
-
Summary Abstract: Autoionization emission from transition metals: An electron stimulated analog of resonant photoemissionZajac, G. / Bader, S. D. / Zak, J. et al. | 1984
- 935
-
A method for the calculation of LEED angular profiles to estimate overlayer spacings and island size distributionsSaloner, D. / Lagally, M. G. et al. | 1984
- 939
-
Medium energy ion scattering studies of clean and CO covered Ni(110)Törnqvist, E. / Adams, E. D. / Copel, M. / Gustafsson, T. / Graham, W. R. et al. | 1984
- 943
-
Helium scattering from (1×1) H–Pt(111)Batra, Inder P. / Barker, J. A. / Auerbach, D. J. et al. | 1984
- 948
-
Multiple bonding on C(111)‐2×1 surfaces: Surface structural determination from energy minimizationChadi, D. J. et al. | 1984
- 952
-
Structural models for Si(111)‐(7×7)Himpsel, F. J. / Batra, Inder P. et al. | 1984
- 957
-
Carbon 1s studies of diamond(111): Surface shifts, hydrogenation, and electron escape lengthsPate, B. B. / Oshima, M. / Silberman, J. A. / Rossi, G. / Lindau, I. / Spicer, W. E. et al. | 1984
- 961
-
The L1L23V and L1L23M1 Coster–Kronig transitions in hydrogenated amorphous siliconMadden, H. H. et al. | 1984
- 964
-
Low energy Auger transitions of boron in several boron compoundsHanke, G. / Müller, K. et al. | 1984
- 969
-
Resonance of 4f partial photoionization cross section of Yb and Eu near the 5p thresholdYeh, J. J. / Nogami, J. / Rossi, G. / Lindau, I. et al. | 1984
- 973
-
Threshold electron excitation of Auger‐electron and x‐ray emissions in LaChamberlain, M. B. / Burr, A. F. / Liefeld, R. J. et al. | 1984
- 978
-
Low energy electron channeling observed by current image diffraction (CID)Jette, A. N. / Nall, B. H. / Bargeron, C. B. et al. | 1984
- 983
-
The electronic structure of c(2×2)S/Fe(100): S 3p‐level dispersions and linewidthsDiDio, R. A. / Plummer, E. W. / Graham, W. R. et al. | 1984
- 987
-
The dependence of H2O adsorption and reaction on the structure of the carbon substrateKelemen, S. R. / Freund, H. / Mims, C. A. et al. | 1984
- 991
-
UPS investigation of poorly crystallized MoS2Liang, K. S. / Hughes, G. J. / Chianelli, R. R. et al. | 1984
- 995
-
Crystallographic anisotropies in the formation and oxidation of carbon on nickelCaracciolo, R. / Schmidt, L. D. et al. | 1984
- 1000
-
Oxide formation on aluminum in the presence of keV electrons and CO2Pitts, J. R. / Bischke, S. D. / Falconer, J. L. / Czanderna, A. W. et al. | 1984
- 1004
-
Summary Abstract: Electron gun and detector for high resolution low energy electron diffractionWilliams, Ellen D. / Hwang, Robert Q. / Park, Robert L. et al. | 1984
- 1005
-
Summary Abstract: Surface structural determination of UO2(111) and (100) using Rutherford backscatteringThompson, K. A. / Valone, S. M. / Ellis, W. P. / Taylor, T. N. / Maggiore, C. J. et al. | 1984
- 1006
-
Summary Abstract: Relationship between many‐parameter lattice gas systems and simpler models: Easy approximations for TcBartelt, N. C. / Einstein, T. L. / Williams, Ellen D. et al. | 1984
- 1008
-
Summary Abstract: Studies of the Mo(100) phase transitionFelter, T. E. et al. | 1984
- 1009
-
Summary Abstract: Effective two dimensional lattice dynamic Hamiltonian for surface structural phase transitionYing, S. C. / Hu, G. Y. et al. | 1984
- 1010
-
Summary Abstract: A carbon Auger line shape study of nitroaromatic explosivesRogers, J. W. / Peebles, H. C. / Rye, R. R. / Houston, J. E. / Binkley, J. S. et al. | 1984
- 1011
-
Summary Abstract: Photon‐stimulated ion desorption from condensed CO and N2Sambe, Hideo / Yousif, Mohamed / Ramaker, David E. et al. | 1984
- 1013
-
Summary Abstract: A core‐level binding‐energy shift analysis of N2 on Ni(100)Egelhoff, W. F. et al. | 1984
- 1014
-
Summary Abstract: Search for precursor states: Molecular adsorption of N2 on Ni(100)Brundle, C. R. / Behm, J. / Auerbach, D. J. / Grunze, M. et al. | 1984
- 1015
-
Summary Abstract: Molecular orientation effects on the electronic excitations of chemisorbed pyridine on Ni(001)DiNardo, N. J. / Demuth, J. E. / Avouris, Ph. et al. | 1984
- 1016
-
Summary Abstract: Electronic structure and chemical reactivity of CO on 3d‐transition metal surfacesTsai, M.‐H. / Rhodin, T. N. / Kasowski, R. V. et al. | 1984
- 1018
-
Summary Abstract: Bromine adsorption on iron(110): LEED and UPS resultsMueller, D. / Sakisaka, Y. / Rhodin, T. et al. | 1984
- 1019
-
Summary Abstract: Kinetics of the adsorption and reaction of H2 and O2 on nickel(110)Villarrubia, John S. / Ho, W. et al. | 1984
- 1021
-
Summary Abstract: C–H bond activation on W(100)–(5×1)–C and W(100)–(2×1)–O surfacesPearlstine, K. A. / Friend, C. M. et al. | 1984
- 1022
-
Summary Abstract: Adsorption and temperature programmed desorption of methanol on MoO3 powder and crystal surfacesOhuchi, F. / Firment, L. E. / Chowdhry, U. / Ferretti, A. et al. | 1984
- 1024
-
Surface science study of selective ethylene epoxidation catalyzed by the Ag(110) surface: Structural sensitivityCampbell, Charles T. et al. | 1984
- 1028
-
The adsorption of oxygen on Pt(100)–(1×1) and hex surfaces at 123 KNorton, P. R. / Bindner, P. E. / Griffiths, K. et al. | 1984
- 1032
-
A Pd–MOS structure as a hydrogen sensor in catalytic reactionsPetersson, L.‐G. / Dannetun, H. M. / Lundström, I. et al. | 1984
- 1036
-
Summary Abstract: Molecule–surface interactions and dynamicsCavanagh, Richard R. / King, David S. et al. | 1984
- 1037
-
Summary Abstract: A study of desorption using a simple quantum modelHood, Eric / Metiu, Horia et al. | 1984
- 1038
-
Summary Abstract: How many metal atoms are involved in dissociative chemisorption?Brundle, C. R. / Behm, J. / Barker, J. A. et al. | 1984
- 1040
-
Summary Abstract: Decomposition of NO on Ag(111) at low temperaturesBehm, R. J. / Brundle, C. R. et al. | 1984
- 1042
-
Ab initio studies of He–Ni and He–Cu interaction potentialsBeckmann, H. O. / Whitten, J. L. / Batra, Inder P. et al. | 1984
- 1047
-
Summary Abstract: Diffusion and evaporation of nitrogen on W(100)Coulman, Donald J. / Ehrlich, Gert et al. | 1984
- 1048
-
Summary Abstract: Kinetics of antiphase domains coarsening in an overlayerWang, G.‐C. / Lu, T.‐M. et al. | 1984
- 1049
-
Summary Abstract: Many‐body effects in the CVV Auger spectra of metals: Mg versus TiJennison, D. R. / Hillebrecht, F. U. / Fuggle, J. C. et al. | 1984
- 1050
-
Summary Abstract: Excited states of physisorbed and chemisorbed adsorbates and their decay mechanismsAvouris, Ph. / Demuth, J. E. / DiNardo, N. J. et al. | 1984
- 1051
-
Summary Abstract: High resolution photon‐stimulated desorption of H+ from H2O on Pd and PtStulen, R. H. / Rosenberg, R. A. et al. | 1984
- 1053
-
Summary Abstract: Mechanisms for photon stimulated desorption of O+ from Cr(110)Stockbauer, R. / Ramaker, D. E. / Bertel, E. / Kurtz, R. L. / Madey, T. E. et al. | 1984
- 1055
-
Phonon inelastic scattering of He atoms from single crystal surfacesToennies, J. Peter et al. | 1984
- 1066
-
Inelastic helium scattering from Ag(001) and Ag(001)c(2×2)ClLambert, W. R. / Trevor, P. L. / Doak, R. B. / Cardillo, M. J. et al. | 1984
- 1069
-
Vibrational spectroscopy of chemisorbed molecules by infrared emissionChiang, S. / Tobin, R. G. / Richards, P. L. et al. | 1984
- 1075
-
Theoretical study of the adsorption of oxygen on Si(100)Batra, Inder P. / Bagus, P. S. / Hermann, K. et al. | 1984
- 1079
-
High resolution electron energy loss spectroscopy of an anisotropic insulator surface: A test for the dielectric theoryLiehr, M. / Thiry, P. A. / Pireaux, J. J. / Caudano, R. et al. | 1984
- 1083
-
Summary Abstract: Acetylene decomposition on Pd(100) and Pd(111): EELS evidence for CCH formationKesmodel, L. L. et al. | 1984
- 1084
-
Summary Abstract: Correlation between anomalous electronic and vibrational properties of chemisorbed systemsHeskett, D. / Plummer, E. W. / Messmer, R. P. et al. | 1984
- 1086
-
Summary Abstract: High resolution electron energy loss spectroscopic studies of thin silver overlayers on gallium arsenideDubois, L. H. / Schwartz, G. P. / Camley, R. E. / Mills, D. L. et al. | 1984
- 1089
-
Effect of ion mass and ion energy on the surface composition of two sputtered tin–lead alloysFrankenthal, R. P. / Siconolfi, D. J. et al. | 1984
- 1093
-
On the surface diffusion of tin on gold in air at room temperatureTompkins, Harland G. et al. | 1984
- 1097
-
Surface chemistry of wear scarsThomas, M. T. / Glaeser, W. A. et al. | 1984
- 1102
-
Characterization of multilayer diffusion barriers by electron probe microanalysis and Auger electron spectroscopyBierlein, John C. / Gaarenstroom, Stephen W. / Waldo, Richard A. / Ottolini, Albert C. et al. | 1984
- 1108
-
X‐ray photoelectron spectroscopy applied to gold‐decorated mineral standards of biological interestLandis, W. J. / Martin, J. R. et al. | 1984
- 1112
-
Fracto‐emission: The role of charge separationDickinson, J. T. / Jensen, L. C. / Jahan‐Latibari, A. et al. | 1984
- 1117
-
Summary Abstract: Surface and interface characterization in the investigation of materials problems involving polymersBriggs, D. et al. | 1984
- 1118
-
Summary Abstract: Segregation of Si and Sn to the Fe(100) surface in the Fe‐6.2% Si‐0.03% Sn alloyZhou, Y. X. / McMahon, C. J. / Plummer, E. W. et al. | 1984
- 1120
-
Determination of grain boundary impurity effects in polycrystalline siliconKazmerski, L. L. / Dick, J. R. et al. | 1984
- 1123
-
Quantitative studies of cleaved and sputtered CuInSe2 surfacesMassopust, T. P. / Ireland, P. J. / Kazmerski, L. L. / Bachmann, K. J. et al. | 1984
- 1129
-
X‐ray photoemission spectra for AlxGa1−xAsIreland, P. J. / Kazmerski, L. L. / Fisher, R. F. et al. | 1984
- 1132
-
Preferential sputtering of brass studied by AES and XPSHammer, G. E. / Shemenski, R. M. et al. | 1984
- 1135
-
Background subtraction techniques in surface analysisGrant, J. T. et al. | 1984
- 1141
-
Quantitative determination of the intensities of known components in spectra obtained from surface analytical techniquesNelson, G. C. et al. | 1984
- 1146
-
Summary Abstract: Understanding localized behavior in the Auger spectra of covalent systems such as graphiteRamaker, D. E. / Hutson, F. L. / Rye, R. R. / Houston, J. E. / Rogers, J. W. et al. | 1984
- 1149
-
Leak detection—common problems and their solutionsSanteler, Don et al. | 1984
- 1157
-
Air mass spectrometer leak detection using the special air leak test (SALT) cartSolomon, G. M. et al. | 1984
- 1162
-
Design considerations for achieving high vacuum integrity in fusion devicesFuller, George M. / Haines, John R. et al. | 1984
- 1170
-
All‐aluminum‐alloy ultrahigh vacuum system for a large‐scale electron–positron colliderIshimaru, Hajime et al. | 1984
- 1176
-
The edge‐loaded metal flange seal—its characteristics and applicationsHiggins, R. W. et al. | 1984
- 1180
-
Vacuum pumping of multimegawatt neutral beam injection linesKim, Jinchoon et al. | 1984
- 1188
-
Initial conditioning of the TFTR vacuum vesselDylla, H. F. / Blanchard, W. R. / Krawchuk, R. B. / Hawryluk, R. J. / Owens, D. K. et al. | 1984
- 1193
-
Performance of Doublet III neutral beam injector cryopumping systemLanghorn, A. R. / Kim, J. / Tupper, M. L. / Williams, J. P. / Fasolo, J. et al. | 1984
- 1197
-
Vacuum double crystal x‐ray monochromator for synchrotron and related usesCrider, C. A. et al. | 1984
- 1201
-
Evaluation of the colliding beam accelerator first string full cell vacuum systemFoerster, C. L. / Briggs, J. / Christianson, C. / Stattel, P. et al. | 1984
- 1207
-
Summary Abstract: New vacuum process demand trends in semiconductor sputter‐coating applicationsde Rijke, J. et al. | 1984
- 1208
-
Summary Abstract: An integrated UHV system for the preparation and characterization of thin metallic, semiconducting, and insulating films or compoundsPireaux, J. J. / Delrue, J. P. / Thiry, P. A. / Caudano, R. et al. | 1984
- 1210
-
Getter pumping speed measurements in the range 10−2 to 10−7 l per sMehrhoff, T. K. / Barnes, L. W. et al. | 1984
- 1214
-
Gettering in fusion devicesCecchi, J. L. / Knize, R. J. et al. | 1984
- 1222
-
Characterization of titanium films in the Tandem Mirror Experiment Upgrade (TMX‐U)Hsu, W. L. / Bastasz, R. / Bauer, W. / Malinowski, M. E. / Mills, B. E. / Allen, S. L. / Clower, C. A. et al. | 1984