Topology of conductive clusters in sputtered high-quality VO2 thin films on the brink of percolation threshold during insulator-to-metal and metal-to-insulator transitions (Englisch)
- Neue Suche nach: Koughia, Cyril
- Neue Suche nach: Gunes, Ozan
- Neue Suche nach: Zhang, Chunzi
- Neue Suche nach: Wen, Shi-Jie
- Neue Suche nach: Wong, Rick
- Neue Suche nach: Yang, Qiaoqin
- Neue Suche nach: Kasap, Safa O.
- Neue Suche nach: Koughia, Cyril
- Neue Suche nach: Gunes, Ozan
- Neue Suche nach: Zhang, Chunzi
- Neue Suche nach: Wen, Shi-Jie
- Neue Suche nach: Wong, Rick
- Neue Suche nach: Yang, Qiaoqin
- Neue Suche nach: Kasap, Safa O.
In:
Journal of Vacuum Science & Technology A
;
38
, 6
;
12
;
2020
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Topology of conductive clusters in sputtered high-quality VO2 thin films on the brink of percolation threshold during insulator-to-metal and metal-to-insulator transitions
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Beteiligte:Koughia, Cyril ( Autor:in ) / Gunes, Ozan ( Autor:in ) / Zhang, Chunzi ( Autor:in ) / Wen, Shi-Jie ( Autor:in ) / Wong, Rick ( Autor:in ) / Yang, Qiaoqin ( Autor:in ) / Kasap, Safa O. ( Autor:in )
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Erschienen in:Journal of Vacuum Science & Technology A ; 38, 6 ; 12
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Verlag:
- Neue Suche nach: American Vacuum Society
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Erscheinungsdatum:01.12.2020
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Format / Umfang:12 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 38, Ausgabe 6
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