Elliptically bent crystal x-ray spectrometer for time-resolved laser plasma experiments (Englisch)
- Neue Suche nach: Wang, R. R.
- Neue Suche nach: An, H. H.
- Neue Suche nach: Guo, E. F.
- Neue Suche nach: Fang, Z. H.
- Neue Suche nach: Xie, Z. Y.
- Neue Suche nach: Jia, G.
- Neue Suche nach: Wang, W.
- Neue Suche nach: Wang, R. R.
- Neue Suche nach: An, H. H.
- Neue Suche nach: Guo, E. F.
- Neue Suche nach: Fang, Z. H.
- Neue Suche nach: Xie, Z. Y.
- Neue Suche nach: Jia, G.
- Neue Suche nach: Wang, W.
In:
Review of Scientific Instruments
;
89
, 9
;
4
;
2018
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Elliptically bent crystal x-ray spectrometer for time-resolved laser plasma experiments
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Weitere Titelangaben:Wang et al.
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Beteiligte:Wang, R. R. ( Autor:in ) / An, H. H. ( Autor:in ) / Guo, E. F. ( Autor:in ) / Fang, Z. H. ( Autor:in ) / Xie, Z. Y. ( Autor:in ) / Jia, G. ( Autor:in ) / Wang, W. ( Autor:in )
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Erschienen in:Review of Scientific Instruments ; 89, 9 ; 4
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Verlag:
- Neue Suche nach: AIP Publishing LLC
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Erscheinungsdatum:01.09.2018
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Format / Umfang:4 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 89, Ausgabe 9
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