Simultaneous measurement of temperature, stress, and electric field in GaN HEMTs with micro-Raman spectroscopy (Englisch)
- Neue Suche nach: Bagnall, Kevin R.
- Neue Suche nach: Moore, Elizabeth A.
- Neue Suche nach: Badescu, Stefan C.
- Neue Suche nach: Zhang, Lenan
- Neue Suche nach: Wang, Evelyn N.
- Neue Suche nach: Bagnall, Kevin R.
- Neue Suche nach: Moore, Elizabeth A.
- Neue Suche nach: Badescu, Stefan C.
- Neue Suche nach: Zhang, Lenan
- Neue Suche nach: Wang, Evelyn N.
In:
Review of Scientific Instruments
;
88
, 11
;
16
;
2017
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Simultaneous measurement of temperature, stress, and electric field in GaN HEMTs with micro-Raman spectroscopy
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Weitere Titelangaben:Bagnall et al.
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Beteiligte:Bagnall, Kevin R. ( Autor:in ) / Moore, Elizabeth A. ( Autor:in ) / Badescu, Stefan C. ( Autor:in ) / Zhang, Lenan ( Autor:in ) / Wang, Evelyn N. ( Autor:in )
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Erschienen in:Review of Scientific Instruments ; 88, 11 ; 16
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Verlag:
- Neue Suche nach: AIP Publishing LLC
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Erscheinungsdatum:01.11.2017
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Format / Umfang:16 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 88, Ausgabe 11
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