Use of vibration‐isolated cryopumps to improve electron microscopes and electron beam lithography units (Englisch)
- Neue Suche nach: Venuti, Guy S.
- Neue Suche nach: Venuti, Guy S.
In:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
;
1
, 2
;
237-240
;
1983
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Use of vibration‐isolated cryopumps to improve electron microscopes and electron beam lithography units
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Weitere Titelangaben:Use of vibration‐isolated cryopumps
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Beteiligte:Venuti, Guy S. ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: American Vacuum Society
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Erscheinungsdatum:01.04.1983
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Format / Umfang:4 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 1, Ausgabe 2
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 111
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The role of the professional society in scientific and technological discoveryThornton, John et al. | 1983
- 119
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The element of luck in research—photocathodes 1930 to 1980Sommer, A. H. et al. | 1983
- 126
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Canadarm and the space shuttleAikenhead, Bruce A. / Daniell, Robert G. / Davis, Frederick M. et al. | 1983
- 133
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Solar‐powered magnetron pump/gageChapman, R. / Hobson, J. P. et al. | 1983
- 136
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Calculation of the pumping speed of turbomolecular vacuum pumps by means of simple mechanical dataBernhardt, K.‐H. et al. | 1983
- 140
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A new sputter ion‐pump elementPierini, M. / Dolcino, L. et al. | 1983
- 143
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New developments in the calculation of the molecular flow conductance of a straight cylinderCarette, J.‐D. / Pandolfo, L. / Dubé, D. et al. | 1983
- 147
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Developments in the transmission for mechanical booster pumpsBudgen, L. J. et al. | 1983
- 150
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Summary Abstract: Pumping speed measurements for water vaporLandfors, A. A. / Hablanian, M. H. / Herrick, R. F. / Vaccarello, D. M. et al. | 1983
- 152
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Reliability of high vacuum measurementsTilford, Charles R. et al. | 1983
- 163
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Theoretical determination of ionization efficiency for an orbitron device and variation with the main working parametersPetit, B. / Feidt, M. L. et al. | 1983
- 168
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Calibration of molecular drag vacuum gagesMcCulloh, K. E. et al. | 1983
- 172
-
A system for vacuum gauge calibration using the comparison techniqueNash, P. J. / Thompson, T. J. et al. | 1983
- 175
-
Computer uses in vacuum equipment and processesKline, F. M. et al. | 1983
- 181
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Application of a microcomputer to automatic testing of production rotary vane pumpsBalfour, D. / Livesey, R. G. / Salmon, A. / Snell, E. J. et al. | 1983
- 184
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Summary Abstract: Computer software package for residual gas analyzerShoemaker, L. / Farden, J. / Holkeboer, D. / Wilson, T. et al. | 1983
- 185
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Summary Abstract: A microprocessor‐controlled surface analysis system for fracture‐related and other surface studiesMcDonnell, L. / Lawless, B. et al. | 1983
- 187
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The Fermilab Tevatron: Vacuum for a superconducting storage ringBartelson, C. L. / Jöstlein, H. / Lee, G. M. / Limon, P. J. / Sauer, L. D. et al. | 1983
- 196
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Final design and status of the NSLS vacuum systemSchuchman, Joseph C. et al. | 1983
- 201
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Vacuum system design for a neutral beam injection systemTanabe, J. et al. | 1983
- 206
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Alpha particle simulation and diagnostics using 3He++ minority ICRF heatingPost, D. / Hwang, D. / Mikkelsen, D. / Seidl, F. et al. | 1983
- 211
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Sealing mechanisms in bakeable vacuum sealsRoth, A. et al. | 1983
- 220
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Thermal cycling and torque analysis of an ultrahigh vacuum flangeFuente, A. O. et al. | 1983
- 224
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A new type of turbomolecular vacuum pump bearingOsterstrom, Gordon E. et al. | 1983
- 228
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Vacuum systems for microelectronicsO’Hanlon, John F. et al. | 1983
- 233
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Pumping chlorinated gases in plasma etchingDuval, Pierre et al. | 1983
- 237
-
Use of vibration‐isolated cryopumps to improve electron microscopes and electron beam lithography unitsVenuti, Guy S. et al. | 1983
- 241
-
Ion plating in a system with a hot cathodeTańcula, M. / Oleszkiewicz, W. / Zdanowski, J. et al. | 1983
- 244
-
Ion milling source with slot extraction systemRangel/ow, I. W. / Radzimski, Z. / Czarczyński, W. et al. | 1983
- 248
-
Sub‐PPMA gas analysis in 40 μl volumes by rf mass spectrometrySchubert, Rudolf / Augis, J. A. et al. | 1983
- 252
-
A performance comparison of vacuum deposition monitors employing atomic absorption (AA) and electron impact emission spectroscopy (EIES)Gogol, C. A. / Reagan, S. H. et al. | 1983
- 257
-
Summary Abstract: New vacuum pumping techniques in sputter coating thin film applicationsEhmann, John / de Rijke, Johan et al. | 1983
- 258
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Summary Abstract: A hollow cathode for ion beam processing plasma sourcesAston, Graeme et al. | 1983
- 260
-
Measurement of oxide growth stress on thin iron filmsAbel, P. B. / Heuer, A. H. / Hoffman, R. W. et al. | 1983
- 263
-
Thermal stability and pore sizes of microporous zirconia gelsRahman, A. A. et al. | 1983
- 267
-
Surface properties of attapulgiteMikhail, R. Sh. / Guindy, N. M. / Hanafi, S. et al. | 1983
- 271
-
Influence of composition and substrate bias on structure and inert gas content of sputter‐deposited Ni–La alloysKnoll, R. W. / McClanahan, E. D. et al. | 1983
- 275
-
Effect of magnetic field and bias potential on the distribution of plasma luminosity during rf sputteringAuner, G. / Hsieh, Y. F. / Padmanabhan, K. R. et al. | 1983
- 279
-
Modifications to the microhardness, adhesion, and resistivity of sputtered TiN films by ion implantationPadmanabhan, K. R. / Hsieh, Y. F. / Chevallier, J. / So/rensen, G. et al. | 1983
- 284
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Summary Abstract: Measurement of deposited masses by means of a spiral centrifuge with quartz sensorsMönig, F. J. / Flachsbart, H. et al. | 1983
- 287
-
Thin film electrodes for an artificial earWhite, R. L. / Roberts, L. A. / Kwon, O. / Cotter, N. et al. | 1983
- 296
-
The effects of palladium–gold on the chemisorptive activities of thin film tin oxideChang, Shih‐Chia et al. | 1983
- 301
-
The effect of oxygen and substrate temperature on the growth of Ti thin films on stainless‐steel substratesSundgren, J.‐E. / Hibbs, M. K. / Helmersson, U. / Jacobson, B. E. / Hentzell, H. T. G. et al. | 1983
- 305
-
Low‐stress diamondlike carbon filmsZelez, Joseph et al. | 1983
- 308
-
Chemisorbed hydrogen on a‐carbon filmsNyaiesh, A. R. / Nowak, W. B. et al. | 1983
- 313
-
Local bonding of oxygen and hydrogen in a‐Si:H:O thin filmsLucovsky, G. / Pollard, W. B. et al. | 1983
- 317
-
Surface chemistry and friction behavior of Ti‐implanted 52100 steelSinger, I. L. / Jeffries, R. A. et al. | 1983
- 322
-
Summary Abstract: Rf‐sputter‐deposited multilayer thin film oxygen sensorsRay, M. A. / Greene, J. E. / Polack, A. J. / Welsh, L. B. et al. | 1983
- 323
-
Ion beam synthesis of cubic boron nitrideShanfield, S. / Wolfson, R. et al. | 1983
- 326
-
Ion‐beam deposition of Nb and Ta refractory superconducting filmsFace, D. W. / Ruggiero, S. T. / Prober, D. E. et al. | 1983
- 331
-
Internal contacts to photovoltaic structures using ion beam millingPotter, R. R. / Sites, J. R. et al. | 1983
- 334
-
Electrical, structural, and bonding changes induced in silicon by H, Ar, and Kr ion‐beam etchingSingh, Ranbir / Fonash, S. J. / Ashok, S. / Caplan, P.J. / Shappirio, J. / Hage‐Ali, M. / Ponpon, J. et al. | 1983
- 337
-
Summary Abstract: Developments in broad‐beam ion source technology and applicationsHarper, J. M. E. / Cuomo, J. J. / Kaufman, H. R. et al. | 1983
- 339
-
Summary Abstract: Ion‐beam‐enhanced diffusion at surfacesZomorrodian, A. / Tougaard, S. / Ignatiev, A. et al. | 1983
- 341
-
Fabrication and characterization of superconducting Pb alloy deposited at −80 °CYoung, P. L. / Josephs, R. M. / Stein, B. F. / Flannery, W. E. / Wang, T. C. / Sheppard, J. E. / Wetterskog, H. et al. | 1983
- 345
-
GeTe thin films: Amorphous and crystalline characteristicsTran, N. T. / Chang, Y. C. / Faragalli, D. A. / Roberts, S. S. / Josefowicz, J. Y. / Shing, Y. H. et al. | 1983
- 348
-
Enhancement of Ta+ flux by substrate biasing during sputter deposition of tantalum–nitrogen filmsAita, C. R. / Myers, T. A. et al. | 1983
- 352
-
High rate planar magnetron deposition of transparent, conducting, and heat reflecting films on glass and plasticBrett, M. J. / McMahon, R. W. / Affinito, J. / Parsons, R. R. et al. | 1983
- 356
-
Microstructure of dielectric thin films formed by e‐beam coevaporationFarabaugh, E. N. / Sanders, D. M. et al. | 1983
- 360
-
Process control of vacuum‐deposited CdS for the fabrication of reproducible 8% efficient solar cellsHench, T. L. / Bragagnolo, J. A. / Delgado, J. E. / Leyman, P. F. / Motta, P. F. et al. | 1983
- 364
-
Summary Abstract: Preparation and properties of granular aluminum in plasma‐polymerized matricesHecq, M. / Zieman, P. / Kay, E. et al. | 1983
- 365
-
Summary Abstract: Low temperature deposition and properties of superconducting NbN by reactive dc magnetron sputteringBacon, D. D. / English, A. T. / Nakahara, S. / Peters, F. G. / Schreiber, H. / Sinclair, W. R. / van Dover, R. B. et al. | 1983
- 366
-
Summary Abstract: Preparation of Pb–Bi film by alloy evaporation II. Microstructure and morphologyHuang, H.‐C. W. / Serrano, C. M. et al. | 1983
- 367
-
Summary Abstract: Crystallographic structure of coevaporated Ni–Al alloy filmsHentzell, H. T. G. / Andersson, B. / Karlsson, S.‐E. et al. | 1983
- 369
-
Summary Abstract: Kinetic theory of subsurface particulate monolayer formation during vacuum evaporation onto softenable substratesKovacs, G. J. / Vincett, P. S. et al. | 1983
- 371
-
Electric conduction in metallic Ag particles—Cs2O semiconductor thin filmsWu, Quan‐De / Liu, Xi‐Qing et al. | 1983
- 376
-
Chemically induced enhancement of nucleation in noble metal depositionAllara, D. L. / Hebard, A. F. / Padden, F. J. / Nuzzo, R. G. / Falcone, D. R. et al. | 1983
- 383
-
Effects of Bi2O3 dissociation on the electrical properties of thermally evaporated films of bismuth oxideDharmadhikari, Vineet S. / Goswami, A. et al. | 1983
- 388
-
Modifications of intrinsic disorder in amorphous siliconPilione, L. J. / Maley, N. / Lustig, N. / Lannin, J. S. et al. | 1983
- 392
-
Trilayer Raman scattering of variably ordered amorphous GeYehoda, Joseph E. / Lannin, Jeffrey S. et al. | 1983
- 395
-
Optical properties and grain boundary effects in CuInSe2Kazmerski, L. L. / Hallerdt, M. / Ireland, P. J. / Mickelsen, R. A. / Chen, W. S. et al. | 1983
- 399
-
Energy bands of thin films of diamond and zinc blende semiconductors (100)Shen, Yuyi et al. | 1983
- 403
-
The dependence of aluminum nitride film crystallography on sputtering plasma compositionAita, C. R. / Gawlak, C. J. et al. | 1983
- 407
-
Measurement of stresses generated in cured polyimide filmsGoldsmith, Charles / Geldermans, P. / Bedetti, F. / Walker, G. A. et al. | 1983
- 410
-
Computer simulation of line edge profiles undergoing ion bombardmentRangel/ow, I. W. et al. | 1983
- 415
-
Stress relief of basal orientation zinc oxide thin films by isothermal annealingGawlak, C. J. / Aita, C. R. et al. | 1983
- 419
-
Carburization of steel surfaces during implantation of Ti ions at high fluencesSinger, I. L. et al. | 1983
- 423
-
Electrical and optical properties of n‐CdS/P–Si and n(Znx– Cd1−x)S/P–Si heterojunction solar cellsAbou Elfotouh, F. A. et al. | 1983
- 426
-
Monte Carlo model of topography development during sputteringRossnagel, S. M. / Robinson, R. S. et al. | 1983
- 430
-
Screening energy involving electrons of remote atoms in photoelectric and Auger transitionsWagner, C. D. / Taylor, J. A. et al. | 1983
- 432
-
Regularities and irregularities in SIMS/FAB spectra of alkali halides analyzed via the bond‐breaking modelDunlap, Brett I. / Campana, Joseph E. / Green, Brian N. / Bateman, Robert H. et al. | 1983
- 437
-
Summary Abstract: Ion beam control of morphology during the growth of aSiHx thin filmsKasdan, A. / Goshorn, D. P. et al. | 1983
- 438
-
Summary Abstract: Cluster formation and the percolation threshold in thin Au filmsLaibowitz, R. B. / Alessandrini, E. I. / Guarnieri, C. R. / Voss, R. F. et al. | 1983
- 440
-
Summary Abstract: Superconducting studies of interfacial reactions in thin‐film alloy couplesMacchioni, C. V. / Rayne, J. A. / Bauer, C. L. et al. | 1983
- 441
-
Summary Abstract: Secondary ion mass spectrometry of organic adsorbates on carbon particles and liquid metal surfacesRoss, Mark M. / Colton, Richard J. et al. | 1983
- 443
-
Contact resistance: Al and Al–Si to diffused N+ and P+ siliconFaith, T. J. / Irven, R. S. / Plante, S. K. / O’Neill, J. J. et al. | 1983
- 449
-
Phase segregation of Cu in Al–Cu thin filmsBurkstrand, J. M. / Hovland, C. T. et al. | 1983
- 452
-
Phase separation in interactions of tantalum–chromium alloy on SiPalmström, C. J. / Gyulai, J. / Mayer, J. W. et al. | 1983
- 455
-
The effect of passivation thickness on the electromigration lifetime of Al/Cu thin film conductorsLloyd, J. R. / Smith, P. M. et al. | 1983
- 459
-
Thermal stability of diffusion barriers for aluminum alloy/platinum silicide contactsMerchant, P. / Amano, Jun et al. | 1983
- 463
-
Summary Abstract: Redistribution of dopants in TiSi2‐polycrystalline bilayers during heat treatmentNorström, H. / Runovc, F. / Buchta, R. / Wiklund, P. / Östling, M. / Petersson, C. S. et al. | 1983
- 465
-
Summary Abstract: Nondestructive electrical monitoring of thin film degradation in microelectronic circuits using pulse nonlinearity techniquesArzigian, J. S. et al. | 1983
- 466
-
Summary Abstract: Alloyed Ohmic contacts to p‐type InPValois, A. J. / Robinson, G. Y. et al. | 1983
- 467
-
Ni/Cr interface width dependence on sputtered depthDavarya, F. / Roush, M. L. / Fine, J. / Andreadis, T. D. / Goktepe, O. F. et al. | 1983
- 471
-
Auger depth profiling and preferential sputtering of platinum nickel silicideMorgan, A. E. / Ellwanger, R. C. et al. | 1983
- 475
-
Low‐temperature oxygen diffusion in alpha titanium characterized by Auger sputter profilingWittberg, T. N. / Wolf, J. Douglas / Keil, R. Gerald / Wang, Pu Sen et al. | 1983
- 479
-
X‐ray and XPS studies of evaporated CuxS thin filmsUppal, P. N. / Burton, L. C. et al. | 1983
- 483
-
AES study on the chemical composition of ferroelectric BaTiO3 thin films rf sputter‐deposited on siliconDharmadhikari, Vineet S. / Grannemann, W. W. et al. | 1983
- 486
-
Summary Abstract: Correlation of the surface composition of C‐ and Ti‐ion‐implanted layers in iron and stainless steel alloys with reduced friction and wearNelson, G. C. / Pope, L. E. / Yost, F. G. et al. | 1983
- 487
-
Sputtering of multicomponent materialsWehner, G. K. et al. | 1983
- 491
-
Influence of a multiple‐energy ion beam on the equilibrium profile of a binary alloyRoush, M. L. / Davarya, F. / Andreadis, T. D. / Goktepe, O. F. et al. | 1983
- 494
-
A review of compositional changes of multicomponent materials (especially biomaterials) induced by ion sputteringKowalski, Zbigniew W. et al. | 1983
- 497
-
A comparison of AES and RBS analysis of the composition of reactively sputtered TiSix filmsBlom, H. O. / Stridh, B. / Berg, S. / Sundgren, J.‐E. et al. | 1983
- 500
-
Effect of surface chemistry and work function in secondary ion mass spectrometryYu, Ming L. et al. | 1983
- 503
-
Sputtered Bi2Te3 and PbTe thin filmsShing, Y. H. / Chang, Y. / Mirshafii, A. / Hayashi, L. / Roberts, S. S. / Josefowicz, J. Y. / Tran, N. et al. | 1983
- 507
-
Summary Abstract: Kinetics of sputter‐enhanced surface segregation at a Ni/Ag interfaceFine, Joseph / Andreadis, T. D. / Davarya, F. et al. | 1983
- 508
-
Summary Abstract: Characteristics of magnetron‐sputtered high atomic number amorphous metal alloysBieg, K. W. / Hills, C. R. et al. | 1983
- 510
-
Summary Abstract: Characterization of rf‐sputtered CuInSe2 filmsKrishnaswamy, S. V. / Manocha, A. S. / Szedon, J. R. et al. | 1983
- 512
-
Correlation between the ion bombardment during film growth of Pd films and their structural and electrical propertiesZiemann, P. / Kay, E. et al. | 1983
- 517
-
Properties of a new molybdenum nitrogen phaseFuller, W. W. / Wolf, S. A. / Gubser, D. U. / Skelton, E. F. / Francavilla, T. L. et al. | 1983
- 520
-
Influence of the microstructure on the corrosion behavior of magnetron sputter‐quenched amorphous metallic alloysThakoor, A. P. / Khanna, S. K. / Williams, R. M. / Landel, R. F. et al. | 1983
- 524
-
Effects of ion implantation doping on electrical and chemisorptive properties of tin oxide thin filmsChang, Shih‐Chia et al. | 1983
- 529
-
Modification of vapor‐deposited WO3 electrochromic films by oxygen backfillingSun, Sey‐Shing / Holloway, Paul H. et al. | 1983
- 534
-
Vacuum ultraviolet driven chemical vapor deposition of localized aluminum thin filmsCalloway, A. R. / Galantowicz, T. A. / Fenner, W. R. et al. | 1983
- 537
-
Summary Abstract: Growth of metastable Cu1−xCrx solid solutions by ion mixing during depositionShin, S. M. / Ray, M. A. / Rigsbee, J. M. / Greene, J. E. / Barnett, S. A. et al. | 1983
- 540
-
Recent developments in silicon molecular beam epitaxyBean, John C. et al. | 1983
- 546
-
Disorder on GaAs(001) surfaces prepared by molecular beam epitaxyVan Hove, J. M. / Cohen, P. I. / Lent, C. S. et al. | 1983
- 551
-
Growth of epitaxial Fe on GaAs by metalorganic CVDKaplan, R. et al. | 1983
- 554
-
Orientation relationships between thin films of Au, {100} substrates of GaAs, and their reaction productsYoshiie, T. / Bauer, C. L. et al. | 1983
- 558
-
Properties of MBE grown InSb and InSb1−xBixNoreika, A. J. / Greggi, J. / Takei, W. J. / Francombe, M. H. et al. | 1983
- 562
-
Summary Abstract: MBE growth of (Hg, Cd, and Te) compoundsChow, P. P. / Greenlaw, D. K. / Johnson, D. et al. | 1983
- 563
-
Summary Abstract: Epitaxial growth of BaF2 on Ge and InPPhillips, J. M. / Feldman, L. C. / Gibson, J. M. / McDonald, M. L. et al. | 1983
- 564
-
Summary Abstract: CaF2 films vacuum deposited on single crystal Ge surfacesSloope, Billy W. et al. | 1983
- 566
-
Schottky barrier formation at Pd, Pt, and Ni/Si(111) interfacesPurtell, R. / Hollinger, G. / Rubloff, G. W. / Ho, P. S. et al. | 1983
- 570
-
Investigations on solid state reactions between tantalum thin films and oxidized silicon crystalsChen, Jiann‐Ruey / Liauh, Her‐Rern / Liu, Yuen‐Chung / Yeh, Fon‐Shan et al. | 1983
- 574
-
Valence band study of Mg2Si by Auger spectroscopyBevolo, A. J. / Shanks, H. R. et al. | 1983
- 578
-
Fabrication of optically enhanced thin film a‐SiHx solar cellsDeckman, H. W. / Wronski, C. R. / Witzke, H. et al. | 1983
- 583
-
Fermi level position and density of states of intrinsic, phosphorus‐doped, and boron‐doped a‐Si:H deposited on stainless steelNielsen, Paul / Gredin, Robert et al. | 1983
- 588
-
An AES–ELEED study of the Al/GaP(110) interfaceBonapace, C. R. / Kahn, A. et al. | 1983
- 592
-
Measuring intensity distributions in electron beams by scanning Auger micrographing of a‐Si:HSchade, H. / Hockings, E. F. et al. | 1983
- 596
-
Characterization of the initial growth of Si on cubic stabilized zirconiaLoebs, V. A. / Haas, T. W. / Solomon, J. S. et al. | 1983
- 600
-
Hydrogen‐related memory traps in thin silicon nitride filmsKapoor, Vikram J. / Bailey, Robert S. / Stein, Herman J. et al. | 1983
- 604
-
Patterning of poly‐para‐xylylenes by reactive ion etchingYeh, J. T. C. / Grebe, K. R. et al. | 1983
- 609
-
RHEED streaks and instrument responseVan Hove, J. M. / Pukite, P. / Cohen, P. I. / Lent, C. S. et al. | 1983
- 614
-
Summary Abstract: Tungsten rich silicide/polysilicon (polycide) for MOS gates and interconnectionsKing, E. M. / Gsteiger, K. E. et al. | 1983
- 615
-
Summary Abstract: Ion beam sputter deposition of molybdenum contacts for Schottky barrier diodesBojarczuk, N. A. / Paz, O. / Auret, F. D. et al. | 1983
- 617
-
Summary Abstract: Experiments on ultrathin Al overlayers on GaAs(110)Daniels, R. R. / Katnani, A. D. / Zhao, Te‐Xiu / Margaritondo, G. / Zunger, Alex et al. | 1983
- 618
-
Summary Abstract: p‐InP surface modification due to indium tin oxide depositionSheldon, P. / Russell, P. E. / Ahrenkiel, R. K. / Hayes, R. E. et al. | 1983
- 619
-
Summary Abstract: Multiple‐wavelength‐angle‐of‐incidence ellipsometry: Application to silicon nitride–gallium arsenide structuresBu‐Abbud, George H. / Alterovitz, Samuel A. / Bashara, N. M. / Woollam, John A. et al. | 1983
- 621
-
Summary Abstract: Surface topography of electronic materials following oxygen and cesium ion bombardmentDuncan, S. / Smith, R. / Sykes, D. E. / Walls, J. M. et al. | 1983
- 622
-
Summary Abstract: Laser‐induced fluorescence diagnostics of glow discharges: Spatially resolved concentration profilesGottscho, Richard A. / Davis, Glenn P. / Burton, Randolph H. et al. | 1983
- 624
-
Summary Abstract: Cathodoluminescence characterization of undoped ZnSe in the scanning electron microscopeChin, T. N. et al. | 1983
- 626
-
Plasma etching of III‐V compound semiconductorsDonnelly, V. M. / Flamm, D. L. / Ibbotson, D. E. et al. | 1983
- 629
-
Anisotropic plasma etching of polysilicon using SF6 and CFCl3Mieth, M. / Barker, A. et al. | 1983
- 636
-
Summary Abstract: Reactive ion etching of Al and Al–Si films with CCl4, N2, and BCl3 mixturesMaa, J.‐S. / O’Neill, J. J. et al. | 1983
- 637
-
Summary Abstract: Surface‐etching kinetics of hydrogen plasma on III‐V compound semiconductorsTu, C. W. / Chang, R. P. H. / Schlier, A. R. et al. | 1983
- 638
-
Summary Abstract: Loading effect curve and etching reactionNishimura, T. / Wani, E. / Tsukada, T. / Fox, R. / Nagasaka, M. et al. | 1983
- 640
-
Oxygen chemisorption and oxide formation on Si(111) and Si(100) surfacesHollinger, G. / Himpsel, F. J. et al. | 1983
- 646
-
The impact of surface analysis technology on the development of semiconductor wafer cleaning processesPhillips, B. F. / Burkman, D. C. / Schmidt, W. R. / Peterson, C. A. et al. | 1983
- 650
-
Influence of aluminum adatoms on the oxidation of germanium at room temperatureKatnani, A. D. / Perfetti, P. / Zhao, Te‐Xiu / Margaritondo, G. et al. | 1983
- 653
-
Surface and interface analysis of GaAs–oxyfluoridesIreland, P. J. / Jamjoum, O. / Kazmerski, L. L. / Ahrenkiel, R. K. / Russell, P. E. / Stanchina, W. / Wager, J. F. et al. | 1983
- 657
-
Thermal stability of oxide films on Cd0.2 Hg0.8Te: A combined SIMS, AES, and XPS studyKaiser, U. / Ganschow, O. / Wiedmann, L. / Benninghoven, A. et al. | 1983
- 662
-
High temperature annealing of InP anodic oxidesFathipour, M. / Makky, W. H. / McLaren, J. / Geib, K. M. / Wilmsen, C. W. et al. | 1983
- 667
-
Summary Abstract: Current problems in silicon oxidationPlummer, James D. et al. | 1983
- 668
-
Summary Abstract: Oxidation of CuInSe2Kazmerski, L. L. / Jamjoum, O. / Wager, J. F. / Ireland, P. J. / Bachmann, K. J. et al. | 1983
- 670
-
Summary Abstract: Composition study of photochemically grown oxides of Hg1−xCdxTeDavis, G. D. / Buchner, S. P. / Byer, N. E. et al. | 1983
- 672
-
Comparison of the atomic geometries of GaSb(110) and ZnTe(110): Failure of ionicity‐structure correlationsDuke, C. B. / Paton, A. / Kahn, A. et al. | 1983
- 676
-
Hydrogen chemisorption on the polar surfaces of GaAsBringans, R. D. / Bachrach, R. Z. et al. | 1983
- 679
-
Adsorption of O2 and CO on cleaved GaAs(110) at low temperaturesFrankel, D. J. / Yukun, Y. / Avci, R. / Lapeyre, G. J. et al. | 1983
- 684
-
Atomic geometries of compound semiconductor surfaces and interfacesKahn, A. et al. | 1983
- 692
-
Heterojunction interface formation: Si on Ge, GaAs, and CdSKatnani, A. D. / Stoffel, N. G. / Daniels, R. R. / Zhao, Te‐Xiu / Margaritondo, G. et al. | 1983
- 695
-
Photoemission determination of dipole layer and VB‐discontinuity formation during the MBE growth of GaAs on Ge(110)Zurcher, Peter / Bauer, Robert S. et al. | 1983
- 701
-
Chemically assisted ion beam etching of GaAs, Ti, and MoChinn, J. D. / Fernandez, A. / Adesida, I. / Wolf, E. D. et al. | 1983
- 705
-
Kinetics of electron‐stimulated oxidation of GaAs(1̄1̄1̄)Alonso, M. / Soria, F. / Sacedón, J. L. et al. | 1983
- 708
-
Plasma etching of niobium with CF4/O2 gasesChen, Mao‐Min / Wang, Run Han et al. | 1983
- 712
-
Aluminum plasma etch rate limitationsPurdes, A. J. et al. | 1983
- 716
-
Summary Abstract: Zone‐melting recrystallization of Si films with a movable strip‐heater ovenGeis, M. W. et al. | 1983
- 717
-
Summary Abstract: Plasma‐enhanced beam deposition of thin dielectric filmsChang, R. P. H. / Darack, S. et al. | 1983
- 718
-
Summary Abstract: Electron‐beam writing and development of inorganic CaF2 thin filmsHarrison, T. R. / Mankiewich, P. M. / Dayem, A. H. et al. | 1983
- 719
-
Summary Abstract: Trench isolation technology: Processing and implementationWenocur, D. W. / Chiang, S. Y. / Rung, R. D. / Cham, K. M. et al. | 1983
- 721
-
Microanalysis needs for device and package fabricationRamsey, J. N. et al. | 1983
- 732
-
Characterization of VLSI materialsMcGuire, G. E. / Church, L. B. / Jones, D. L. / Smith, K. K. / Tuenge, D. T. et al. | 1983
- 739
-
Direct measurement of temperature profiles induced by finely focused beamsIranmanesh, Ali A. / Pease, R. F. W. et al. | 1983
- 743
-
Summary Abstract: The use of backscattered electron imaging with Auger electron spectroscopyThomas, J. H. et al. | 1983
- 745
-
Chemical bonding and Schottky barrier formation at transition metal–silicon interfacesHo, Paul S. et al. | 1983
- 758
-
Silicide formation in lateral diffusion couplesZheng, L. R. / Hung, L. S. / Mayer, J. W. et al. | 1983
- 762
-
Photoemission studies of the Au–InP(110) interfaceBabalola, I. A. / Petro, W. G. / Kendelewicz, T. / Lindau, I. / Spicer, W. E. et al. | 1983
- 766
-
Investigation of InP surface and metal interfaces by surface photovoltage and Auger electron spectroscopiesShapira, Y. / Brillson, L. J. / Heller, A. et al. | 1983
- 771
-
Chemical bonding and reactions at Ti/Si and Ti/oxygen/Si interfacesButz, R. / Rubloff, G. W. / Ho, P. S. et al. | 1983
- 776
-
Interfacial chemistry of electrical contacts on GaAs and Al0.3Ga0.7AsBuonaquisti, A. D. / Wang, Y. ‐X. / Holloway, P. H. et al. | 1983
- 781
-
First spectroscopic investigation of the Yb/Si interface at room temperatureRossi, G. / Nogami, J. / Lindau, I. / Braicovich, L. / Abbati, I. / del Pennino, U. / Nannarone, S. et al. | 1983
- 785
-
Summary Abstract: Metal–amorphous Si interfaces: Structural and electrical propertiesTsai, C. C. / Thompson, M. J. / Nemanich, R. J. / Jackson, W. B. / Stafford, B. L. et al. | 1983
- 811
-
Measurement of plasma density using nuclear techniquesStrachan, J. D. / Chrien, R. E. / Heidbrink, W. W. et al. | 1983
- 818
-
Low energy neutral spectroscopy during pulsed discharge cleaning in PLTRuzic, D. / Cohen, S. / Denne, B. / Schivell, J. et al. | 1983
- 822
-
Laser fluorescence measurements of hydrogen and metal densities in the Doublet III tokamakMuller, C. H. / Eames, D. R. / Burrell, K. H. et al. | 1983
- 827
-
Plasma edge studies using carbon resistance probesWampler, W. R. / Manos, D. M. et al. | 1983
- 831
-
The far UV emission spectrum of H2Terry, J. L. et al. | 1983
- 837
-
Perturbation of tokamak edge plasma by laser blow‐off impurity injectionBudny, R. / Cavallo, A. / Cohen, S. / Daughney, C. / Efthimion, P. / Fonck, R. / Hulse, R. / Hwang, D. / Manos, D. / Pecquet, A‐L. et al. | 1983
- 841
-
Photography of impurity injection into PLT plasmasTimberlake, J. / Cohen, S. / Daughney, C. / Manos, D. et al. | 1983
- 845
-
TFTR prototype electrostatic‐calorimeter probe headManos, D. M. / Budny, R. V. / Cohen, S. A. et al. | 1983
- 849
-
Vacuum applications for the Tritium Systems Test AssemblyAnderson, James L. / Coffin, Don O. / Walthers, Charles R. et al. | 1983
- 856
-
Tritium storage/delivery and associated cleanup systems for TFTRGill, J. T. / Anderson, B. E. / Watkins, R. A. / Pierce, C. W. et al. | 1983
- 865
-
Process monitoring of tritium concentrationEllefson, R. E. et al. | 1983
- 869
-
Chemically polished stainless steel tubing for tritium serviceGill, J. T. / Moddeman, W. E. / Ellefson, R. E. et al. | 1983
- 874
-
Summary Abstract: Reaction rates for the formation of DT under various conditions from T2+D2McConville, G. T. / Menke, D. A. / Ellefson, R. E. et al. | 1983
- 875
-
Summary Abstract: Effect of tritium on accuracy of capacitance manometersEllefson, R. E. / Gibbs, G. E. / Baker, R. W. et al. | 1983
- 877
-
Biased magnetron sputtering of ICF target pusher layersGlocker, David et al. | 1983
- 881
-
The use of an arc plasma rotating in a magnetic field for metal coating glass substratesVukanovic, V. / Butler, S. / Kapur, Sh. / Krakower, E. / Allston, T. / Belfield, K. / Gibson, G. et al. | 1983
- 886
-
A technique for thick polymer coating of inertial‐confinement‐fusion targetsLee, Mark C. / Feng, I‐an / Wang, Taylor G. / Kim, Hyo‐gun et al. | 1983
- 890
-
High‐Z‐doped laser fusion target ablation layers using metal colloids and metal‐substituted‐sulfonated polystyreneKim, H. / Mason, J. / Miller, J. R. et al. | 1983
- 894
-
Fluorescers and filters of unusual chemical composition for low‐energy x‐ray measurementsJorgensen, B. / Liepins, R. / Geanangel, R. A. / Komm, R. et al. | 1983
- 897
-
Temperature effects on the formation of a uniform liquid layer of hydrogen isotopes inside a spherical cryogenic ICF targetMok, L. / Kim, K. / Bernat, T. P. / Darling, D. H. et al. | 1983
- 901
-
Analysis of hydrogen and deuterium by secondary ion mass spectrometry as applied to fusion technologyMagee, Charles W. et al. | 1983
- 907
-
Particle and energy transport in the plasma scrape‐off zone and its impact on limiter designUlrickson, M. / Post, D. E. et al. | 1983
- 911
-
Charge‐exchange wall physical erosion rates for a proposed INTOR/FED limiterHeifetz, D. / Schmidt, J. / Ulrickson, M. / Post, D. et al. | 1983
- 916
-
Initial wall conditioning for the TMX‐U fusion experimentAllen, S. L. / Clower, C. / Drake, R. P. / Hooper, E. B. / Hunt, A. L. / Munger, R. / Bastasz, R. J. / Bauer, W. / Hsu, W. L. et al. | 1983
- 920
-
Methane formation and surface modification of TiC coating by hydrogen ion bombardmentSukenobu, S. / Gomay, Y. et al. | 1983
- 924
-
Gibbsian and radiation‐induced segregation in Cu–Li and Al–Li alloysGruen, D. M. / Krauss, A. R. / Susman, S. / Venugopalan, M. / Ron, M. et al. | 1983
- 929
-
Plasma edge studies in ISX‐B and EBT‐S using surface probes and laser‐induced fluorescenceRoberto, J. B. / Clausing, R. E. / Dullni, E. / Emerson, L. C. / Heatherly, L. / Schweer, B. / Withrow, S. P. / Zuhr, R. A. et al. | 1983
- 933
-
Summary Abstract: Tritium imagingMalinowski, M. E. et al. | 1983
- 934
-
Summary Abstract: Initial wall conditioning in Doublet IIIJackson, G. L. / Clausing, R. E. / Lietzke, A. F. / Ejima, S. / Emerson, L. C. / Heatherly, L. et al. | 1983
- 935
-
Summary Abstract: Photoenhancement of the reaction of graphite with atomic hydrogen by ultraviolet radiationAshby, C. I. H. et al. | 1983
- 937
-
Information management data base for fusion target fabrication processesReynolds, J. et al. | 1983
- 941
-
Inertial fusion target mounting methods: New fabrication procedures reduce the mounting support perturbationBrinker, B. A. / Cavese, J. M. / Miller, J. R. / Noyes, S. G. / Sheble, S. / Whitaker, L. T. et al. | 1983
- 945
-
Rotational‐shearing interferometric characterization of inertial fusion targetsPowers, T. F. / Miller, J. R. et al. | 1983
- 949
-
X‐ray absorption in characterization of laser fusion targetsClement, X. / Coudeville, A. / Eyharts, P. / Perrine, J. P. / Rouillard, R. et al. | 1983
- 952
-
Solid deuterium centrifuge pellet injectorFoster, C. A. et al. | 1983
- 959
-
Performance characterization of pneumatic single pellet injection systemSchuresko, D. D. / Milora, S. L. / Hogan, J. T. / Foster, C. A. / Combs, S. K. et al. | 1983
- 964
-
Pellet injection in TFTRSinger, C. E. / Heifetz, D. B. / Post, D. E. et al. | 1983
- 969
-
Fusion fuel pellet injection with a railgunHawke, R. S. et al. | 1983
- 974
-
Negative ion sources for neutral beam systemsEhlers, K. W. et al. | 1983
- 981
-
Photoelectric work function measurement of a cesiated metal surface and its correlation with the surface‐produced H− ion fluxWada, M. / Berkner, K. H. / Pyle, R. V. / Stearns, J. W. et al. | 1983
- 985
-
Summary Abstract: Sputtering of negative carbon ions from cesiated graphite surfacesPargellis, A. / Seidl, M. et al. | 1983
- 987
-
The Si(111)/Cu interface studied with surface sensitive techniquesRossi, G. / Kendelewicz, T. / Lindau, I. / Spicer, W. E. et al. | 1983
- 991
-
SIMS investigation of very shallow implanted Si layersShepherd, F. R. / Robinson, W. H. / Brown, J. D. / Phillips, B. F. et al. | 1983
- 995
-
Auger line shape studies of carbon species on Rh and Ni surfacesHouston, J. E. / Peebles, D. E. / Goodman, D. W. et al. | 1983
- 1000
-
Interatomic Auger transitions in maximal valent V and Cr compoundsYin, Lo I / Tsang, Tung / Coyle, George J. / Yin, Way / Adler, Isidore et al. | 1983
- 1004
-
Auger analysis of iron–cobalt alloysBevolo, A. J. et al. | 1983
- 1006
-
Analysis of oxygen isotope interfaces using negative molecular ion SIMSMitchell, D. F. / Hussey, R. J. / Graham, M. J. et al. | 1983
- 1009
-
Summary Abstract: Interfacial analysis of metal–semiconductor structuresPoate, J. M. et al. | 1983
- 1010
-
Summary Abstract: Line shape changes of some surface sensitive ‘‘quasiatomic’’ Cu Auger spectra in alloysSundaram, V. S. / Landers, R. / Rogers, L. D. / Laks, B. / Kleiman, G. G. et al. | 1983
- 1011
-
Summary Abstract: Effect of changes in absorber concentration on infrared reflection absorbance of polymer films on metallic substratesWebb, John Day / Jorgensen, Gary / Schissel, Paul / Czanderna, A. W. / Chughtai, A. R. / Smith, D. M. et al. | 1983
- 1013
-
Simultaneous electron and x‐ray analysis and its application in corrosion scienceCastle, J. E. et al. | 1983
- 1021
-
Electron inelastic mean free path (IMFP) in single crystal BeO by Rutherford backscattering (RBS) and Auger electron spectroscopy (AES)Fowler, D. E. / Gyulai, J. / Palmstrom, C. et al. | 1983
- 1026
-
The oxidation of zinc in air studied by XPS and AESHammer, G. E. / Shemenski, R. M. et al. | 1983
- 1029
-
Interfacial layers in high‐temperature‐oxidized NiCrAlLarson, L. A. / Browning, R. / Poppa, H. / Smialek, J. et al. | 1983
- 1033
-
Summary Abstract: Oxidation of cobalt at room temperature, studied by combined static SIMS, static AES, XPS, and work function investigationsKaiser, U. / Ganschow, O. / Wang, N. L. / Wiedmann, L. / Benninghoven, A. et al. | 1983
- 1034
-
Summary Abstract: A low damage SIMS/AES/XPS study of structure inversion in the Ba–O–W systemLamartine, B. C. / Czarnecki, J. v. / Haas, T. W. et al. | 1983
- 1036
-
Summary Abstract: Comparison of thin passive and air‐oxidized iron films using EXAFS and MESFine, J. M. / Rusek, J. J. / Eldridge, J. / Kordesch, M. E. / Mann, J. A. / Hoffman, R. W. / Sandstrom, D. R. et al. | 1983
- 1037
-
Summary Abstract: Surface composition of Cu/Au alloysNelson, G. C. et al. | 1983
- 1039
-
Summary Abstract: The equilibrium surface composition of indium–lead alloysFrankenthal, R. P. / Siconolfi, D. J. et al. | 1983
- 1040
-
Summary Abstract: Surface segregation in liquid Ga–Sn alloys by AESHardy, Stephen / Fine, Joseph et al. | 1983
- 1043
-
Extended‐fine‐structure analysis of oxygen on titaniumMorar, John F. / Park, Robert L. et al. | 1983
- 1047
-
Surface geometries from channeling and blockingTromp, R. M. et al. | 1983
- 1055
-
The structure of atomic oxygen and carbon overlayers on the Mo(001) surface studied by low energy ion scatteringOverbury, S. H. / Stair, P. C. et al. | 1983
- 1059
-
Summary Abstract: Application of high energy ion channeling to GaAs(110)Gossmann, H.‐J. / Gibson, W. M. / Itoh, T. / Feldman, L. C. et al. | 1983
- 1060
-
Summary Abstract: Epitaxial growth of Au on Pd(111)Kuk, Y. / Feldman, L. C. / Silverman, P. J. et al. | 1983
- 1062
-
Summary Abstract: Quantum size effect in electron transmission through Cu and Ag films on W(110)Jonker, B. T. / Bartelt, N. C. / Park, Robert L. et al. | 1983
- 1063
-
Summary Abstract: Molecular orientation studies of adsorbed organic monolayers using angle‐resolved SIMSKarwacki, E. J. / Moon, D. W. / Winograd, N. et al. | 1983
- 1064
-
The molecular and atomic states of oxygen adsorbed on Rh(100): AdsorptionFisher, Galen B. / Schmieg, Steven J. et al. | 1983
- 1070
-
Carbon monoxide oxidation on the kinked Pt(321) surfaceGland, John L. / McClellan, Michael R. / McFeely, F. Read et al. | 1983
- 1074
-
Summary Abstract: Chemisorption on transition‐metal oxides and oxide‐supported noble metalsHenrich, Victor E. / Kurtz, Richard L. / Sadeghi, Hassan R. et al. | 1983
- 1075
-
Summary Abstract: Oxidation of the Ti(0001) surfaceBertel, Erminald / Stockbauer, Roger / Madey, Theodore E. et al. | 1983
- 1077
-
Summary Abstract: The influence of steps on the desorption of NO from Pt(111)Serri, J. A. / Tully, J. C. / Cardillo, M. J. et al. | 1983
- 1078
-
Summary Abstract: Molecular beam scattering from Pt(111) at initial stages of CO adsorptionPoelsema, B. / Palmer, R. L. / de Zwart, S. T. / Comsa, G. et al. | 1983
- 1080
-
Electronic states of ideal Ge–Al interfacesBatra, Inder P. / Herman, Frank et al. | 1983
- 1085
-
Angle‐resolved photoemission studies of the CdS band structureStoffel, N. G. / Margaritondo, G. et al. | 1983
- 1089
-
Self‐consistent surface electronic band structure calculations: Changes upon chemisorptionRichter, Roy / Wilkins, John W. et al. | 1983
- 1095
-
Theory of electronic structure of copper overlayers on transition metal substratesMa, C. Q. / Ramana, M. V. / Cooper, B. R. / Krakauer, H. et al. | 1983
- 1099
-
Summary Abstract: Reconstruction of semiconductor surfaces: Si(111)‐2×1, Si(111)‐7×7, and GaAs(110)Pandey, K. C. et al. | 1983
- 1100
-
Summary Abstract: Investigation of final state effects in the photoemission of inert gases adsorbed on W(110)Opila, R. / Gomer, R. et al. | 1983
- 1101
-
Summary Abstract: Comparison of calculated surface core‐level energy shifts with empirical heats of segregationFeibelman, Peter J. et al. | 1983
- 1102
-
Summary Abstract: Thermochemistry of interface and surface segregation and chemisorption from core level binding energy shiftsEgelhoff, W. F. et al. | 1983
- 1104
-
Inverse photoemissionWoodruff, D. P. / Johnson, P. D. / Smith, N. V. et al. | 1983
- 1111
-
Momentum‐resolved bremsstrahlung spectroscopy with a tunable photon detectorFauster, T. / Himpsel, F. J. et al. | 1983
- 1115
-
Inverse photoemission from Ni(100) and Ni(111) with oriented oxygen overlayersDose, V. / Glöbl, M. / Scheidt, H. et al. | 1983
- 1119
-
New insights from electron spin polarization studies of surfacesPierce, D. T. / Celotta, R. J. et al. | 1983
- 1125
-
The interaction of hydrogen with silicon surfaces: A field ion microscope and pulsed‐laser atom‐probe studyKellogg, G.L. et al. | 1983
- 1130
-
Current image diffraction (CID) of single crystal metal surfacesBargeron, C. B. / Nall, B. H. / Jette, A. N. et al. | 1983
- 1134
-
Summary Abstract: Spin polarization of secondary electrons from Ni(110)Hopster, H. / Raue, R. / Kisker, E. / Campagna, M. / Güntherodt, G. et al. | 1983
- 1135
-
Summary Abstract: Pulsed‐laser time of flight atom‐probe FIM study of surface reactivitiesTsong, T. T. / Kinkus, T. J. et al. | 1983
- 1137
-
Covalent interaction effects in electron/photon‐stimulated desorptionRamaker, David E. et al. | 1983
- 1145
-
Photon‐ and electron‐stimulated desorption from rare earth oxidesLoubriel, G. / Knotek, M. L. / Stulen, R. H. / Koel, B. E. / Parks, C. C. et al. | 1983
- 1149
-
Electron‐stimulated desorption in organic molecular solidsKelber, J. A. / Knotek, M. L. et al. | 1983
- 1154
-
Localization of surface excitations and stimulated desorptionJennison, D. R. / Emin, David et al. | 1983
- 1157
-
Summary Abstract: Surface processes in plasma‐assisted etching environmentsWinters, Harold F. / Coburn, J. W. / Chuang, T. J. et al. | 1983
- 1159
-
Summary Abstract: Ion beam angle dependence of collisionally excited Auger electron emission from Al and Si surfacesAndreadis, T. D. / Fine, Joseph / Matthew, J. A. D. et al. | 1983
- 1160
-
Summary Abstract: Correlations in time of electron and positive ion emission accompanying fractureDickinson, J. T. / Jensen, L. C. et al. | 1983
- 1162
-
Summary Abstract: Electron‐ and photon‐stimulated desorption of condensed molecular films: Relevance to the mechanisms of ion formation and desorptionStockbauer, Roger / Bertel, Erminald / Madey, Theodore E. et al. | 1983
- 1163
-
Summary Abstract: Electron‐stimulated desorption of ions and metastable neutrals from condensed H2O multilayersStulen, R. H. et al. | 1983
- 1165
-
Variation of the threshold energies for core‐electron excitation in electron energy‐loss spectra as a function of incident electron energyErickson, N. E. / Powell, C. J. et al. | 1983
- 1169
-
Threshold electron excitation of Auger‐electron and x‐ray emissions in CeChamberlain, M. B. / Burr, A. F. / Liefeld, R. J. et al. | 1983
- 1174
-
High‐resolution study of the influence of gas adsorption on LEED fine structuresBaribeau, J.‐M. / Carette, J.‐D. et al. | 1983
- 1178
-
Angle‐resolved measurements of the secondary‐electron emission spectrum of Cu(100)Graham, G. W. et al. | 1983
- 1181
-
Photoemission studies of the effect of temperature on the Au–GaAs(110) interfacePetro, W. G. / Babalola, I. A. / Kendelewicz, T. / Lindau, I. / Spicer, W. E. et al. | 1983
- 1185
-
CO interactions with copper‐covered Ru(0001)Bader, S. D. / Richter, L. / Cao, P.‐L. / Ellis, D. E. / Freeman, A. J. et al. | 1983
- 1188
-
A model for the saturated water bilayer on Ru(001) based on a comparison of experimental and calculated LEED patternsWilliams, Ellen D. / Doering, Dale L. et al. | 1983
- 1193
-
First phase nickel silicide nucleation and interface structure at Si(100) surfacesChang, Yu‐Jeng / Erskine, J. L. et al. | 1983
- 1198
-
Catalysis of carbon methanation by small platinum particlesSantiesteban, J. / Fuentes, S. / Yacaman, M. J. et al. | 1983
- 1201
-
Hydrogen‐induced features in the Auger spectra from amorphous siliconMadden, H. H. et al. | 1983
- 1205
-
Charge transfer at surfaces: A model for ionization in SIMSLin, J.‐H. / Garrison, B. J. et al. | 1983
- 1209
-
Summary Abstract: EXELFS in the reflection electron energy loss spectra of Cu and NiTeng, C. H. / Hitchcock, A. P. et al. | 1983
- 1210
-
Summary Abstract: A high‐resolution, low‐energy electron diffractometer based on a field emission sourceMartin, J. A. / Lagally, M. G. et al. | 1983
- 1212
-
Summary Abstract: The MoO3(010) surfaceCaruthers, E. B. / Ferretti, A. / Firment, L. E. / Kasowski, R. V. et al. | 1983
- 1213
-
Summary Abstract: Adsorptive and catalytic properties of zirconium overlayers on Pt(100)Bardi, U. / Somorjai, G. A. / Ross, P. N. et al. | 1983
- 1214
-
Summary Abstract: Transition metal chemisorption on transition metals—theoretical and experimental electronic structure for silver on palladium(100)Capehart, T. W. / Richter, R. / Gay, J. G. / Smith, J. R. / Buchholz, J. C. / Arlinghaus, F. J. et al. | 1983
- 1216
-
Summary Abstract: Detailed structure of acetylide carbon on the surface of lithiumGates, S. M. / Pedersen, L. G. / Jarnagin, R. C. et al. | 1983
- 1217
-
Summary Abstract: (2×2) phase transitions on honeycomb latticesBartelt, N. C. / Einstein, T. L. / Roelofs, L. D. et al. | 1983
- 1219
-
Summary Abstract: The reaction of saturated and unsaturated hydrocarbons with single crystalline surfaces of iridiumSzuromi, P. D. / Weinberg, W. H. et al. | 1983
- 1220
-
Summary Abstract: The adsorption and decomposition of N2O on Ru(001)Madey, T. E. / Avery, N. R. / Anton, A. B. / Toby, B. H. / Weinberg, W. H. et al. | 1983
- 1222
-
Summary Abstract: The formation and decomposition of methanol on Ru(001) studied by EELS, TDMS, and work function measurementHrbek, J. / dePaola, R. A. / Hoffmann, F. M. et al. | 1983
- 1223
-
Summary Abstract: The formation of a surface carbonate species on Ni(100) by reaction between oxygen and CO2Behm, R. J. / Brundle, C. R. et al. | 1983
- 1225
-
Summary Abstract: SIMS and TDS study of the reaction of water and oxygen on Pt(111)Creighton, J. R. / White, J. M. et al. | 1983
- 1226
-
Summary Abstract: Methyl isocyanide adsorption on Rh(111)Semancik, S. / Haller, G. L. / Yates, J. T. et al. | 1983
- 1227
-
Summary Abstract: Structure and bonding in very thin metal depositsLégaré, P. / Rhodin, T. N. / Brucker, C. F. et al. | 1983
- 1229
-
Summary Abstract: Evidence for core hole screening by 3d electrons in third row oxyanionsTurner, N. H. / Ramaker, D. E. et al. | 1983
- 1230
-
Summary Abstract: Angle‐resolved SIMS studies of O2 and CO chemisorption on Ni3Fe(111)Bleiler, R. J. / Diebold, A. C. / Winograd, N. et al. | 1983
- 1232
-
Surface phonons on clean‐ and adsorbate‐covered nickel disilicide (NiSi2) thin filmsDubois, L. H. / Rowe, J. E. et al. | 1983
- 1236
-
Infrared laser photoacoustic spectroscopy of adsorbed speciesChuang, T. J. / Coufal, H. / Träger, F. et al. | 1983
- 1240
-
Summary Abstract: Multichannel Raman spectroscopy of molecules on metal films and tunnel junctionsAvouris, Ph. / Tsang, J. C. / Kirtley, J. R. et al. | 1983
- 1241
-
Summary Abstract: Surface state optical absorption on the clean Si(100)2×1 surfaceChabal, Y. J. / Christman, S. B. / Chaban, E. E. / Yin, M. T. et al. | 1983
- 1242
-
Summary Abstract: Vibrational and rotational excitations of adsorbed moleculesAndersson, S. et al. | 1983
- 1244
-
Summary Abstract: Vibrational modes of acetylene on Ni(001): Angle‐resolved electron energy loss spectroscopy (EELS) studyDiNardo, N. J. / Demuth, J. E. / Avouris, Ph. et al. | 1983
- 1245
-
Summary Abstract: Neutron scattering from adsorbates on platinum blackRush, J. J. / Cavanagh, R. R. / Kelley, R. D. et al. | 1983
- 1247
-
Primary steps in catalytic synthesis of ammoniaErtl, G. et al. | 1983
- 1254
-
The effects of adsorbed sulfur on the adsorption and reaction of CO and methanol on Ni(100)Madix, R. J. / Lee, S. B. / Thornburg, M. et al. | 1983
- 1261
-
Molecular beam mass spectrometric studies of energy transfer and chemical reactions on heated surfacesFoner, S. N. / Hudson, R. L. et al. | 1983
- 1265
-
Summary Abstract: The role of potassium additives in nickel catalysts for CO hydrogenation: A surface science investigationCampbell, C. T. / Goodman, D. W. et al. | 1983
- 1266
-
Summary Abstract: The adsorption of CO on Fe(110)Kurz, Edward A. / Lassig, Stephan / Hudson, John B. et al. | 1983
- 1267
-
Summary Abstract: Internal energy distributions in thermally desorbed moleculesCavanagh, R. R. / King, D. S. et al. | 1983
- 1269
-
Summary Abstract: Rotational state population of NO scattered from clean and absorbate‐covered Pt surfacesDoyen, G. / Ertl, G. / Robota, H. / Segner, J. / Vielhaber, W. / Frenkel, F. / Häger, J. / Krieger, W. / Walther, H. et al. | 1983
- 1270
-
Summary Abstract: Kinetic energy dependence of nitrogen adsorption on W(110)Auerbach, D. J. / Schlaegel, J. E. / Lee, J. / Madix, R. J. et al. | 1983
- 1273
-
Enhanced selective hydrogen desorption from metalsKnize, R. J. / Cecchi, J. L. et al. | 1983
- 1276
-
Pressure dependence of Zr–Al pumping speed for H2Cecchi, J. L. / Knize, R. J. et al. | 1983
- 1279
-
Equilibrium pressures of H2 and D2 for different getter materials and the effect of CO impuritiesBoffito, C. / Ferrario, B. / Martelli, D. et al. | 1983
- 1283
-
Evaluation of Zr–V–Fe getter pump for UHV systemHseuh, H. C. / Lanni, C. et al. | 1983
- 1288
-
Dynamic gas flow during plasma operation in TMX‐UPickles, W. L. / Calderon, M. O. / Carter, M. R. / Clower, C. A. / Drake, R. P. / Hunt, A. L. / Lang, D. / Simonen, T. C. / Turner, W. C. et al. | 1983
- 1293
-
Fast pressure measurements for the TMX‐U fusion experimentHunt, A. L. / Coffield, F. E. / Pickles, W. L. et al. | 1983
- 1297
-
Conditioning of ion sources for mass spectrometry of plasmasDylla, H. F. / Blanchard, W. R. et al. | 1983
- 1302
-
Edge measurements of Te,Ti,n,Er on the DITE tokamak using a biased power bolometerStangeby, P. C. / McCracken, G. M. / Erents, S. K. / Vince, J. E. / Wilden, R. et al. | 1983
- 1306
-
Summary Abstract: Influence of sorbed gases on the oxygen gettering characteristics of Ti and Cr filmsSimpkins, J.E. / Emerson, L. C. / Mioduszewski, P. / Stratton, L. W. et al. | 1983
- 1308
-
The (changing) MFTF vacuum environmentMargolies, David / Valby, Lawrence et al. | 1983
- 1315
-
A continuous cryopump for steady state mirror fusion reactorsBatzer, Thomas H. / Call, Wayne R. et al. | 1983
- 1319
-
Design of a dee vacuum vessel for Doublet IIIDavis, Larry G. et al. | 1983
- 1325
-
The leak‐checking and testing of the first yin–yang magnet for the Mirror Fusion Test Facility (MFTF)Kozman, T. A. / Lathrop, G. H. / Podesta, D. L. et al. | 1983
- 1331
-
Seals for large ports on the Tokamak Fusion Test ReactorMullaney, D. H. / Mozeleski, M. A. / Fleming, R. B. et al. | 1983
- 1335
-
Calculations of gas density in a closely packed multichannel electrostatic quadrupole (MESQ) arrayBurrell, C. F. / Goldberg, D. A. et al. | 1983