Suppression of surface leakage currents using molecular beam epitaxy-grown unipolar barriers (Englisch)
- Neue Suche nach: Savich, G. R.
- Neue Suche nach: Pedrazzani, J. R.
- Neue Suche nach: Maimon, S.
- Neue Suche nach: Wicks, G. W.
- Neue Suche nach: Savich, G. R.
- Neue Suche nach: Pedrazzani, J. R.
- Neue Suche nach: Maimon, S.
- Neue Suche nach: Wicks, G. W.
In:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
;
28
, 3
;
C3H18-C3H21
;
2010
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Suppression of surface leakage currents using molecular beam epitaxy-grown unipolar barriers
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Weitere Titelangaben:Suppression of surface leakage currents using molecular beam epitaxy-grown unipolar barriers
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Beteiligte:Savich, G. R. ( Autor:in ) / Pedrazzani, J. R. ( Autor:in ) / Maimon, S. ( Autor:in ) / Wicks, G. W. ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: American Vacuum Society
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Erscheinungsdatum:01.05.2010
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Format / Umfang:4 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 28, Ausgabe 3
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- C4D5
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Noncontact scanning nonlinear dielectric microscopy imaging of surfacesKin, Nobuhiro / Cho, Yasuo et al. | 2010
- C4D11
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Local dielectric spectroscopy of nanocomposite materials interfacesLabardi, Massimiliano / Prevosto, Daniele / Nguyen, Kim Hung / Capaccioli, Simone / Lucchesi, Mauro / Rolla, Pierangelo et al. | 2010
- C4D18
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Investigation of interface between fullerene molecule and surface by noncontact scanning nonlinear dielectric microscopyKobayashi, Shin-ichiro / Cho, Yasuo et al. | 2010
- C4D24
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Visualization of anisotropic conductance in polydiacetylene crystal by dual-probe frequency-modulation atomic force microscopy/Kelvin-probe force microscopyTsunemi, Eika / Kobayashi, Kei / Matsushige, Kazumi / Yamada, Hirofumi et al. | 2010
- C4D29
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Local surface photovoltage spectroscopy of Cu-phthalocyanine clusters on different substratesSadewasser, S. / Lux-Steiner, M. Ch. et al. | 2010
- C4D34
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Contacting self-ordered molecular wires by nanostencil lithographyGross, L. / Schlittler, R. R. / Meyer, G. / Fendt, L.-A. / Diederich, F. / Glatzel, Th. / Kawai, S. / Koch, S. / Meyer, E. et al. | 2010
- C4D40
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Potential dependent change in local structure of ferrocenyl-terminated molecular islands by electrochemical frequency modulation atomic force microscopyUmeda, Ken-ichi / Fukui, Ken-ichi et al. | 2010
- C4E1
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Numerical analysis of dynamic force spectroscopy using a dual-oscillator sensorSolares, Santiago D. / Hölscher, Hendrik et al. | 2010
- C4E12
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Application of the KolibriSensor® to combined atomic-resolution scanning tunneling microscopy and noncontact atomic-force microscopy imagingTorbrügge, Stefan / Schaff, Oliver / Rychen, Jörg et al. | 2010
- C4E21
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Very compact design for a low-temperature tuning fork atomic force microscopeWintjes, N. / Lange, M. / van Vörden, D. / Karacuban, H. / Utzat, D. / Möller, R. et al. | 2010
- C4E24
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Internal damping for noncontact atomic force microscopy cantileversZypman, Fredy et al. | 2010
- C4E28
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Preparation of light-atom tips for scanning probe microscopy by explosive delaminationHofmann, T. / Welker, J. / Giessibl, F. J. et al. | 2010
- C4E31
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Vertical and lateral drift corrections of scanning probe microscopy imagesRahe, P. / Bechstein, R. / Kühnle, A. et al. | 2010
- C4E39
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Open source scanning probe microscopy control software package GXSMZahl, Percy / Wagner, Thorsten / Möller, Rolf / Klust, Andreas et al. | 2010
- L21
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Visualizing contact line phenomena on microstructured superhydrophobic surfacesCannon, A. H. / King, W. P. et al. | 2010
- L25
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Development of ion sources from ionic liquids for microfabricationPerez-Martinez, Carla / Guilet, Stéphane / Gogneau, Noëlle / Jegou, Pascale / Gierak, Jacques / Lozano, Paulo et al. | 2010
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Casimir Forces Potential contributions of noncontact atomic force microscopy for the future Casimir force measurementsKim, W J et al. | 2010
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Structures An international journal devoted to Microelectronics and Nanometer Processing, Measurement, and Phenomena| 2010
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EPITAXY PAPERS FROM THE 26th NORTH AMERICAN CONFERENCE ON MOLECULAR BEAM Preface| 2010
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NC-AFM Imaging and Charges Simultaneous atomic force and scanning tunneling microscopy study of the Ge(111)-c(2×8) surfaceSawada, Daisuke et al. | 2010
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Optoelectronic Devices Investigation of multistack InAs/InGaAs/GaAs self-assembled quantum dots-in-double-well structures for infrared detectorsSharma, Yagya D et al. | 2010
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III-V Low Dimensional Structures Strongly correlated vtot=1 state in an intrinsically density-matched electron bilayer system and its two-terminal resistanceSchmult, S et al. | 2010
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Oxide Materials High-quality molecular-beam-epitaxy-grown Ga2O3(Gd2O3) on Ge (100): Electrical and chemical characterizationsChu, R L et al. | 2010
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Nitrides and Diluted Nitrides Molecular beam epitaxy as a method for the growth of freestanding zinc-blende (cubic) GaN layers and substratesNovikov, S V et al. | 2010
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FORCE MICROSCOPY PAPERS FROM THE 12th INTERNATIONAL CONFERENCE ON NONCONTACT ATOMIC Preface| 2010
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Letters Visualizing contact line phenomena on microstructured superhydrophobic surfacesCannon, A H et al. | 2010
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II-VI Semiconductors Controlled growth of (100) or (111) CdTe epitaxial layers on (100) GaAs by molecular beam epitaxy and study of their electron spin relaxation timesZhang, Qiang et al. | 2010
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MBE Technology Modulated beam mass spectrometer studies of a Mark V Veeco crackerCampion, R P et al. | 2010
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Electronic Devices Molecular beam epitaxial growth and properties of GaAs pseudomorphic high electron mobility transistors on silicon composite substratesHoke, W E et al. | 2010
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Novel Materials Epitaxial growth and structure of Ge-Sb-Te phase change materials on GaSbShayduk, Roman et al. | 2010
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NC-AFM in Liquids Theoretical simulation of noncontact atomic force microscopy in liquidsTsukada, M et al. | 2010
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Material Characterization Temperature dependent lattice constant of Al0.90Ga0.10ASySb1-yBreivik, Magnus et al. | 2010
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Broadening of intersubband transitions in InGaN/AllnN multiquantum wellsCywinski, G et al. | 2010
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Measurements of Short-Range Forces Three-dimensional force spectroscopy of KBr(001) by tuning fork-based cryogenic noncontact atomic force microscopySuch, Bartosz et al. | 2010
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Instrumentation and Method Development Numerical analysis of dynamic force spectroscopy using a dual-oscillator sensorSolares, Santiago D et al. | 2010