Aspect ratio dependent strains in InAs/InP quantum dots measured by synchrotron radiation x-ray diffraction (Englisch)
- Neue Suche nach: Kim, Kihong
- Neue Suche nach: Yoon, Sukho
- Neue Suche nach: Yoon, Euijoon
- Neue Suche nach: Koo, Yang Mo
- Neue Suche nach: Lee, Jong-Lam
- Neue Suche nach: Kim, Kihong
- Neue Suche nach: Yoon, Sukho
- Neue Suche nach: Yoon, Euijoon
- Neue Suche nach: Koo, Yang Mo
- Neue Suche nach: Lee, Jong-Lam
In:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
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21
, 1
;
183-185
;
2003
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Aspect ratio dependent strains in InAs/InP quantum dots measured by synchrotron radiation x-ray diffraction
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Beteiligte:Kim, Kihong ( Autor:in ) / Yoon, Sukho ( Autor:in ) / Yoon, Euijoon ( Autor:in ) / Koo, Yang Mo ( Autor:in ) / Lee, Jong-Lam ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: American Vacuum Society
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Erscheinungsdatum:01.01.2003
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Format / Umfang:3 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 21, Ausgabe 1
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