Friction on the atomic scale: An ultrahigh vacuum atomic force microscopy study on ionic crystals (Englisch)
- Neue Suche nach: Lüthi, R.
- Neue Suche nach: Meyer, E.
- Neue Suche nach: Bammerlin, M.
- Neue Suche nach: Howald, L.
- Neue Suche nach: Haefke, H.
- Neue Suche nach: Lehmann, T.
- Neue Suche nach: Loppacher, C.
- Neue Suche nach: Güntherodt, H.‐J.
- Neue Suche nach: Gyalog, T.
- Neue Suche nach: Thomas, H.
- Neue Suche nach: Lüthi, R.
- Neue Suche nach: Meyer, E.
- Neue Suche nach: Bammerlin, M.
- Neue Suche nach: Howald, L.
- Neue Suche nach: Haefke, H.
- Neue Suche nach: Lehmann, T.
- Neue Suche nach: Loppacher, C.
- Neue Suche nach: Güntherodt, H.‐J.
- Neue Suche nach: Gyalog, T.
- Neue Suche nach: Thomas, H.
In:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
;
14
, 2
;
1280-1284
;
1996
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Friction on the atomic scale: An ultrahigh vacuum atomic force microscopy study on ionic crystals
-
Weitere Titelangaben:Friction on the atomic scale: An UHV AFM
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Beteiligte:Lüthi, R. ( Autor:in ) / Meyer, E. ( Autor:in ) / Bammerlin, M. ( Autor:in ) / Howald, L. ( Autor:in ) / Haefke, H. ( Autor:in ) / Lehmann, T. ( Autor:in ) / Loppacher, C. ( Autor:in ) / Güntherodt, H.‐J. ( Autor:in ) / Gyalog, T. ( Autor:in ) / Thomas, H. ( Autor:in )
-
Erschienen in:
-
Verlag:
- Neue Suche nach: American Vacuum Society
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Erscheinungsdatum:01.03.1996
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Format / Umfang:5 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 14, Ausgabe 2
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 585
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Nanocluster formation by spin coating: Quantitative atomic force microscopy and Rutherford backscattering spectrometry analysisPartridge, A. / Toussaint, S. L. G. / Flipse, C. F. J. / van IJzendoorn, L. J. / van den Oetelaar, L. C. A. et al. | 1996
- 593
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Direct observation of fullerene‐adsorbed tips by scanning tunneling microscopyKelly, K. F. / Sarkar, Dipankar / Prato, Stefano / Resh, J. S. / Hale, G. D. / Halas, N. J. et al. | 1996
- 597
-
Microfabrication of near‐field optical probesRuiter, A. G. T. / Moers, M. H. P. / van Hulst, N. F. / de Boer, M. et al. | 1996
- 602
-
Scanning force microscopy for the study of domain structure in ferroelectric thin filmsGruverman, A. / Auciello, O. / Tokumoto, H. et al. | 1996
- 606
-
Electron trajectories and light emitting images of starlike thin‐film field emittersKaneko, Akira / Sumita, Isao et al. | 1996
- 612
-
Fabrication of Si field emitters by dry etching and mask erosionRakhshandehroo, M. R. / Pang, S. W. et al. | 1996
- 617
-
Ballistic electron emission microscopy studies of electron scattering in Au/GaAs Schottky diodes damaged by focused ion beam implantationMcNabb, J. W. / Craighead, H. G. et al. | 1996
- 623
-
Atomic scale roughness of GaAs(001)2×4 surfacesFan, Y. / Karpov, I. / Bratina, G. / Sorba, L. / Gladfelter, W. / Franciosi, A. et al. | 1996
- 632
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Application of phase‐sensitive photoreflectance spectroscopy to a study of undoped AlGaAs/GaAs quantum well structuresHughes, P. J. / Weiss, B. L. et al. | 1996
- 638
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Nonlinear characteristics induced by carrier accumulation in InAs/GaAs superlattice cap layer on GaAs/GaAlAs multi‐quantum well structureMatsui, Y. / Kusumi, Y. et al. | 1996
- 642
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Strain relaxation in compositionally graded epitaxial layersKim, Sam‐Dong / Lord, Susan M. / Harris, James S. et al. | 1996
- 647
-
Characterization of oxide desorption from InSb(001) substratesLiu, W. K. / Santos, M. B. et al. | 1996
- 652
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Thermal stability and degradation mechanism of WSiN/InGaP Schottky diodesShiojima, Kenji / Nishimura, Kazumi / Hyuga, Fumiaki et al. | 1996
- 657
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High‐temperature stable Ir–Al/n‐GaAs Schottky diodes: Effect of the barrier height controllingLalinský, T. / Osvald, J. / Machajdík, D. / Mozolová, Z̆. / S̆is̆olák, J. / Constantinidis, G. / Kobzev, A. P. et al. | 1996
- 662
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Electron beam induced deposition from W(CO)6 at 2 to 20 keV and its applicationsHoyle, P. C. / Cleaver, J. R. A. / Ahmed, H. et al. | 1996
- 674
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Properties of TaNx films as diffusion barriers in the thermally stable Cu/Si contact systemsTakeyama, Mayumi / Noya, Atsushi / Sase, Touko / Ohta, Akira / Sasaki, Katsutaka et al. | 1996
- 679
-
Simulation of uniformity and lifetime effects in collimated sputteringTait, R. N. / Dew, S. K. / Tsai, W. / Hodul, D. / Smy, T. / Brett, M. J. et al. | 1996
- 687
-
Number of voids formed on a line: Parameter for electromigration lifetimeHinode, Kenji / Kondo, Seiichi / Deguchi, Osamu et al. | 1996
- 691
-
Study of the H2 remote plasma cleaning of InP substrate for epitaxial growthLosurdo, M. / Capezzuto, P. / Bruno, G. et al. | 1996
- 698
-
Optical properties of reactive‐ion‐etched Si/Si1−xGex heterostructuresKöster, T. / Gondermann, J. / Hadam, B. / Spangenberg, B. / Schütze, M. / Roskos, H. G. / Kurz, H. / Brunner, J. / Abstreiter, G. et al. | 1996
- 707
-
Enhanced dry etching of silicon with deuterium plasmaIwakuro, Hiroaki / Kuroda, Tsukasa / Shen, Dian‐Hong / Lin, Zhangda et al. | 1996
- 710
-
SiO2 to Si selectivity mechanisms in high density fluorocarbon plasma etchingKirmse, K. H. R. / Wendt, A. E. / Disch, S. B. / Wu, J. Z. / Abraham, I. C. / Meyer, J. A. / Breun, R. A. / Woods, R. Claude et al. | 1996
- 716
-
MxP+: A new dielectric etcher with enabling technology, high productivity, and low cost‐of‐consumablesShan, Hongching / Lee, Evans / Welch, Michael / Pu, Bryan / Carducci, James / Ke, Kuang‐Han / Gao, Hua / Luscher, Paul / Crean, Gerard / Wang, Rynn et al. | 1996
- 724
-
Effect of fluorine concentration on the etch characteristics of fluorinated tetraethylorthosilicate filmsAllen, Lynn R. et al. | 1996
- 727
-
Effects of native oxide removal from silicon substrate and annealing on SiO2 films deposited at 120 °C by plasma enhanced chemical vapor deposition using disilane and nitrous oxideSong, Juho / Ajmera, P. K. / Lee, G. S. et al. | 1996
- 732
-
Inductively coupled plasma for polymer etching of 200 mm wafersForgotson, N. / Khemka, V. / Hopwood, J. et al. | 1996
- 738
-
Investigation of low temperature SiO2 plasma enhanced chemical vapor depositionDeshmukh, Shashank C. / Aydil, Eray S. et al. | 1996
- 744
-
Real time investigation of nucleation and growth of silicon on silicon dioxide using silane and disilane in a rapid thermal processing systemHu, Y. Z. / Diehl, D. J. / Zhao, C. Y. / Wang, C. L. / Liu, Q. / Irene, E. A. / Christensen, K. N. / Venable, D. / Maher, D. M. et al. | 1996
- 751
-
Rugged surface polycrystalline silicon film deposition and its application in a stacked dynamic random access memory capacitor electrodeIno, M. / Miyano, J. / Kurogi, H. / Tamura, H. / Nagatomo, Y. / Yoshimaru, M. et al. | 1996
- 757
-
Reliability of ultimate ultrathin silicon oxide films produced by the continuous ultradry processYamada, Hiroshi et al. | 1996
- 763
-
Quantitative depth profiling of boron in shallow BF+2‐implanted silicon by using laser‐ionization sputtered neutral mass spectrometryHigashi, Yasuhiro / Maruo, Tetsuya / Homma, Yoshikazu / Miyake, Masayasu et al. | 1996
- 768
-
Growth of copper nanocrystallites on copper seed cones: Evidence for the presence of a liquid phase on an ion‐impacting cone surfaceOkuyama, F. et al. | 1996
- 772
-
Role of gas phase reactions in subatmospheric chemical‐vapor deposition ozone/TEOS processes for oxide depositionShareef, I. A. / Rubloff, G. W. / Gill, W. N. et al. | 1996
- 789
-
Biosensor based on force microscope technologyBaselt, David R. / Lee, Gil U / Colton, Richard J. et al. | 1996
- 794
-
Scanning local‐acceleration microscopyBurnham, N. A. / Kulik, A. J. / Gremaud, G. / Gallo, P.‐J. / Oulevey, F. et al. | 1996
- 800
-
Scanning near‐field optical microscopy/spectroscopy of thin organic filmsNagahara, L. A. / Tokumoto, H. et al. | 1996
- 804
-
Characteristics of photon scanning tunneling microscope read‐outKobayashi, Kiyoshi / Watanuki, Osaaki et al. | 1996
- 809
-
Molecular orientation in polymers from near‐field optical polarization measurementsWilliamson, R. L. / Miles, M. J. et al. | 1996
- 812
-
Imaging of organic molecular films using a scanning near‐field optical microscope combined with an atomic force microscopeYamada, Hirofumi / Tokumoto, Hiroshi / Akamine, Shinya / Fukuzawa, Kenji / Kuwano, Hiroki et al. | 1996
- 816
-
Scattering of electromagnetic waves by silicon‐nitride tipsBouju, X. / Dereux, A. / Vigneron, J. P. / Girard, C. et al. | 1996
- 820
-
Heterostructure interface characterization using scanning tunneling microscope excited time‐resolved luminescenceHorn, J. / Vogt, A. / Aller, I. / Hartnagel, H. L. / Stehle, M. et al. | 1996
- 824
-
Study of luminescent porous polycrystalline silicon thin filmsHan, P. G. / Poon, M. C. / Ko, P. K. / Sin, J. K. O. / Wong, H. et al. | 1996
- 827
-
Design and performance analysis of a three‐dimensional sample translation device used in ultrahigh vacuum scanned probe microscopySchlittler, R. R. / Gimzewski, J. K. et al. | 1996
- 832
-
Thermal imaging of thin films by scanning thermal microscopeOesterschulze, E. / Stopka, M. / Ackermann, L. / Scholz, W. / Werner, S. et al. | 1996
- 838
-
Microwave tunneling current from the resonant interaction of an amplitude modulated laser with a scanning tunneling microscopeHagmann, Mark J. et al. | 1996
- 842
-
Voltage contrast in submicron integrated circuits by scanning force microscopyBöhm, Christoph / Sprengepiel, Jörg / Otterbeck, Markus / Kubalek, Erich et al. | 1996
- 845
-
Normal and lateral force images, sub‐angstrom height resolution, and midlevel lateral resolution with a phonograph cartridge as scanning force sensorMariani, Tullio / Frediani, Carlo / Ascoli, Cesare et al. | 1996
- 849
-
Shearing stress on the surface topography by scanning shearing stress microscopyIwata, Futoshi / Sasaki, Akira / Kawaguchi, Makoto / Katsumata, Akira / Aoyama, Hisayuki et al. | 1996
- 852
-
Gamble mode: Resonance contact mode in atomic force microscopyO’Connor, S. D. / Gamble, R. C. / Eby, R. K. / Baldeschwieler, J. D. et al. | 1996
- 856
-
Atomic force microscopy and lateral force microscopy using piezoresistive cantileversLinnemann, R. / Gotszalk, T. / Rangelow, I. W. / Dumania, P. / Oesterschulze, E. et al. | 1996
- 861
-
New optoelectronic tip design for ultrafast scanning tunneling microscopyGroeneveld, R. H. M. / Rasing, Th. / Kaufmann, L. M. F. / Smalbrugge, E. / Wolter, J. H. / Melloch, M. R. / van Kempen, H. et al. | 1996
- 864
-
Driven nonlinear atomic force microscopy cantilevers: From noncontact to tapping modes of operationSarid, Dror / Ruskell, Todd G. / Workman, Richard K. / Chen, Dong et al. | 1996
- 868
-
Direct measurement of laser momentum transfer to dense media by means of atomic force microscopy cantileversLabardi, M. / La Rocca, G. C. / Mango, F. / Bassani, F. / Allegrini, M. et al. | 1996
- 872
-
Scanning force microscopy with two optical levers for detection of deformations of the cantileverKawakatsu, Hideki / Saito, Takashi et al. | 1996
- 877
-
Acoustic and dynamic force microscopy with ultrasonic probesMurdfield, Th. / Fischer, U. C. / Fuchs, H. / Volk, R. / Michels, A. / Meinen, F. / Beckman, E. et al. | 1996
- 882
-
Strain‐imaging observation of a Pb(Zr,Ti)O3 thin filmTakata, Keiji et al. | 1996
- 887
-
Imaging mechanism and effects of adsorbed water in contact‐type scanning capacitance microscopyNakagiri, Nobuyuki / Yamamoto, Takuma / Sugimura, Hiroyuki / Suzuki, Yoshihiko et al. | 1996
- 892
-
Imaging conducting surfaces and dielectric films by a scanning capacitance microscopeLányi, Š. / Török, J. / Řehůřek, P. et al. | 1996
- 897
-
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacementsPicotto, G. B. / Desogus, S. / Lányi, Š. / Nerino, R. / Sosso, A. et al. | 1996
- 901
-
Scanning force microscopy in the dynamic mode using microfabricated capacitive sensorsBlanc, N. / Brugger, J. / de Rooij, N. F. / Dürig, U. et al. | 1996
- 906
-
Atomic structure of the steps on Si(001) studied by scanning tunneling microscopyKomura, T. / Yoshimura, M. / Yao, T. et al. | 1996
- 909
-
Scanning tunneling microscopy investigation of the dimer vacancy–dimer vacancy interaction on the Si(001) 2×n surfaceSmith, A. R. / Men, F. K. / Chao, K.‐J. / Zhang, Zhenyu / Shih, C. K. et al. | 1996
- 914
-
Variable low‐temperature scanning tunneling microscopy study of Si(001): Nature of the 2×1→c(2×4) phase transitionSmith, A. R. / Men, F. K. / Chao, K.‐J. / Shih, C. K. et al. | 1996
- 918
-
Laser desorption from and reconstruction on Si(100) surfaces studied by scanning tunneling microscopyXu, Jun / Overbury, S. H. / Wendelken, J. F. et al. | 1996
- 925
-
Low‐temperature scanning tunneling microscopy on vicinal Ge(100)Röttger, B. / Bertrams, Th. / Neddermeyer, H. et al. | 1996
- 929
-
Atomic structure of the diamond (100) surface studied using scanning tunneling microscopyStallcup II, R. E. / Villarreal, L. M. / Lim, S. C. / Akwani, I. / Aviles, A. F. / Perez, J. M. et al. | 1996
- 933
-
Scanning tunneling microscopy study of SiC(0001) surface reconstructionsOwman, Fredrik / Mårtensson, Per et al. | 1996
- 938
-
Surface structure of 3C–SiC(111) fabricated by C60 precursor: A scanning tunneling microscopy and high‐resolution electron energy loss spectroscopy studyHu, C.‐W. / Kasuya, A. / Suto, S. / Wawro, A. / Nishina, Y. et al. | 1996
- 943
-
(2×4)/c(2×8) to (4×2)/c(8×2) transition on GaAs(001) surfacesMoriarty, P. / Beton, P. H. / Ma, Y.‐R. / Dunn, A. W. / Henini, M. / Woolf, D. A. et al. | 1996
- 948
-
Application of scanning tunneling microscopy to determine the exact charge states of surface point defectsChao, K.‐J. / Smith, A. R. / Shih, C. K. et al. | 1996
- 953
-
Atomic resolution imaging of InP(110) surface observed with ultrahigh vacuum atomic force microscope in noncontact modeSugawara, Y. / Ohta, M. / Ueyama, H. / Morita, S. / Osaka, F. / Ohkouchi, S. / Suzuki, M. / Mishima, S. et al. | 1996
- 957
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InSb(1̄ 1̄ 1̄)3×1: New surface reconstructionBjörkqvist, M. / Göthelid, M. / Olsson, L. Ö. / Kanski, J. / Karlsson, U. O. et al. | 1996
- 961
-
Intrinsic defects at TiO2(110) surfaces studied with scanning tunneling microscopyFischer, Stefan / Munz, Andreas W. / Schierbaum, Klaus‐Dieter / Göpel, Wolfgang et al. | 1996
- 966
-
Scanning tunneling microscopy of the UO2 (111) surfaceCastell, M. R. / Muggelberg, C. / Briggs, G. A. D. / Goddard, D. T. et al. | 1996
- 970
-
Layer‐by‐layer etching of HgI2 films and crystals by scanning force microscopyLang, H. P. / Erler, B. / Rossberg, A. / Piechotka, M. / Kaldis, E. / Güntherodt, H.‐J. et al. | 1996
- 974
-
Growth of a uniaxial incommensurate C60 lattice on Ge(100)2×1Klyachko, D. / Chen, Dongmin et al. | 1996
- 979
-
Adsorption and decomposition of C60 molecules on Si(111) surfacesChen, Dong / Workman, Richard K. / Sarid, Dror et al. | 1996
- 982
-
Low coverage adsorption of Sb4 on Si(113) studied by scanning tunneling microscopyMüssig, H.‐J. / Da̧browski, J. / Arabczyk, W. / Hinrich, S. / Wolff, G. et al. | 1996
- 988
-
Atomic‐hydrogen‐induced Ag cluster formation on Si(111)‐√3×√3–Ag surface observed by scanning tunneling microscopyOura, Kenjiro / Ohnishi, Hideaki / Yamamoto, Yasuji / Katayama, Itsuo / Ohba, Yasuyuki et al. | 1996
- 992
-
Ga‐induced restructuring of Si(112) and Si(337)Baski, A. A. / Whitman, L. J. et al. | 1996
- 995
-
Initial stages of In adsorption on Si(111) 7×7Lin, X. F. / Mai, H. A. / Chizhov, I. / Willis, R. F. et al. | 1996
- 1000
-
Scanning tunneling microscopy of Sr adsorption on the Si(100)‐2×1 surfaceBakhtizin, R. Z. / Kishimoto, J. / Hashizume, T. / Sakurai, T. et al. | 1996
- 1005
-
Pb/Si(111) investigation at the ultralow‐coverage rangeGómez‐Rodríguez, J. M. / Veuillen, J.‐Y. / Cinti, R. C. et al. | 1996
- 1010
-
Submonolayer Pb deposition on Si(100) studied by scanning tunneling microscopyVeuillen, J.‐Y. / Gómez‐Rodríguez, J.‐M. / Cinti, R. C. et al. | 1996
- 1015
-
Studies of low coverage adsorption of Li on Si(001): Observation of negative differential resistance and electron trappingJohansson, Mikael K.‐J. / Gray, Struan M. / Johansson, Lars S. O. et al. | 1996
- 1019
-
High‐temperature scanning tunneling microscopy study of the Li/Si(111) surfaceOlthoff, S. / Welland, M. E. et al. | 1996
- 1024
-
Island, trimer, and chain formation on the Sb‐terminated GaAs(111)B surfaceMoriarty, P. / Beton, P. H. / Henini, M. / Woolf, D. A. et al. | 1996
- 1029
-
Scanning tunneling microscopy study of the interfacial structure of nickel silicidesYoshimura, M. / Shinabe, S. / Yao, T. et al. | 1996
- 1032
-
Interaction of vinyltrimethylsilane with the Si(111)‐(7×7) surfaceAndersohn, L. / Kochanski, G. P. / Norman, J. A. T. / Hinch, B. J. et al. | 1996
- 1038
-
Combined scanning tunneling microscopy and infrared spectroscopy study of the interaction of diborane with Si(001)Wang, Yajun / Shan, Jun / Hamers, Robert J. et al. | 1996
- 1043
-
Nanoscale roughening of Si(001) by oxide desorption in ultrahigh vacuumGray, Struan M. / Johansson, Mikael K.‐J. / Johansson, Lars S. O. et al. | 1996
- 1048
-
Initial stages of the nitridation of the Si(111) surface observed by scanning tunneling microscopyYoshimura, M. / Takahashi, E. / Yao, T. et al. | 1996
- 1051
-
Adsorption and reaction of NO on Si(111) studied by scanning tunneling microscopyRöttger, B. / Kliese, R. / Neddermeyer, H. et al. | 1996
- 1055
-
Correlation between contact‐electrified charge groups on a thin silicon oxideUchihashi, Takayuki / Okusako, Takahiro / Sugawara, Yasuhiro / Yamanishi, Yoshiki / Oasa, Takahiko / Morita, Seizo et al. | 1996
- 1060
-
Structure and electronic states on reduced BaTiO3 (100) surface observed by scanning tunneling microscopy and spectroscopyBando, Hiroshi / Shimitzu, Tetsushi / Aiura, Yoshihiro / Haruyama, Yuichi / Oka, Kunihiko / Nishihara, Yoshikazu et al. | 1996
- 1064
-
Probing complex low‐dimensional solids with scanning probe microscopes: From charge density waves to high‐temperature superconductivityLiu, Jie / Huang, Jin‐Lin / Lieber, Charles M. et al. | 1996
- 1070
-
Spatial and energy variation of the local density of states in the charge density wave phase of 2H–NbSe2Mallet, P. / Sacks, W. / Roditchev, D. / Défourneau, D. / Klein, J. et al. | 1996
- 1075
-
Moiré patterns in scanning tunneling microscopy images of layered materialsKobayashi, Katsuyoshi et al. | 1996
- 1079
-
Scanning tunneling microscope investigations of lead–phthalocyanine on MoS2Strohmaier, R. / Ludwig, C. / Petersen, J. / Gompf, B. / Eisenmenger, W. et al. | 1996
- 1083
-
Atomic force microscopy of mercury iodide crystal growth from porous media at room temperatureHenderson, D. O. / Tung, Y. S. / Mu, R. / Ueda, A. / Collins, W. E. / Burger, A. / Chen, K. T. / Frazier, D. O. et al. | 1996
- 1090
-
Atomic force microscopy study of mercuric iodide surfacesTung, Y. S. / Henderson, D. O. / Mu, R. / Collins, W. E. / Chen, K. T. / George, M. A. / Burger, A. et al. | 1996
- 1096
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Layered heavy metal iodides examined by atomic force microscopyGeorge, M. A. / Chen, K.‐T. / Collins, W. E. / Burger, A. / Nason, D. / Boatner, L. et al. | 1996
- 1105
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Surface morphology of metalorganic vapor phase epitaxy grown InAs and InGaAs observed by atomic force microscopyHsu, C. C. / Xu, J. B. / Wilson, I. H. et al. | 1996
- 1109
-
Molecular arrangement of copper phthalocyanine on hydrogen‐terminated Si(111): Influence of surface roughnessNakamura, M. / Morita, Y. / Mori, Y. / Ishitani, A. / Tokumoto, H. et al. | 1996
- 1114
-
Atomic scale reaction regulated in one‐dimensional channels evidenced by scanning tunneling microscopyMatsumoto, Yuji / Tanaka, Ken‐ichi et al. | 1996
- 1117
-
Tip‐induced lifting of the Au{100} (hex)‐phase reconstruction in a low temperature ultrahigh vacuum scanning tunneling microscopeBuisset, J. / Rust, H.‐P. / Schweizer, E. K. / Cramer, L. / Bradshaw, A. M. et al. | 1996
- 1121
-
Comparative study of the interface roughness of Ag/Au and Cu/Au multilayers with scanning tunneling microscopy and x‐ray diffractionHeyvaert, I. / Temst, K. / Van Haesendonck, C. / Bruynseraede, Y. et al. | 1996
- 1126
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Structure of epitaxial thin TiOx films on W(110) as studied by low energy electron diffraction and scanning tunneling microscopyHerman, G. S. / Gallagher, M. C. / Joyce, S. A. / Peden, C. H. F. et al. | 1996
- 1131
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Equilibrium morphology of Au(111) vicinal surfaces revealed by scanning tunneling microscopyRousset, S. / Pourmir, F. / Gauthier, S. / Lacaze, E. / Sotto, M. / Klein, J. / Lecoeur, J. et al. | 1996
- 1136
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Spatially and rotationally oriented adsorption of molecular adsorbates on Ag(111) investigated using cryogenic scanning tunneling microscopyChen, X. / Frank, E. R. / Hamers, R. J. et al. | 1996
- 1141
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Growth of NiO(100) layers on Ag(100): Characterization by scanning tunneling microscopyBertrams, Th. / Neddermeyer, H. et al. | 1996
- 1145
-
Diffusion of atoms on Au(111) by the electric field gradient in scanning tunneling microscopyMéndez, J. / Gómez‐Herrero, J. / Pascual, J. I. / Sáenz, J. J. / Soler, J. M. / Baró, A. M. et al. | 1996
- 1149
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Vicinal surfaces of Au(110) and Ag(110) investigated by scanning tunneling microscopyLi, J. T. / Berndt, R. / Gaisch, R. / Schneider, W.‐D. et al. | 1996
- 1153
-
Tapping mode atomic force microscopy observation of self‐affine fractal roughness in electrochemically roughened silver electrode surfacesOtsuka, I. / Iwasaki, T. et al. | 1996
- 1157
-
Atomic force microscopy investigations of loaded crack tips in NiAlGöken, M. / Vehoff, H. / Neumann, P. et al. | 1996
- 1162
-
In situ scanning tunneling microscope investigation of passivation and stainless steels and ironSchreyer, A. / Eng, L. / Böhni, H. et al. | 1996
- 1167
-
Vacuum plasma sprayed hydroxyapatite coatings on titanium alloy substrates: Surface characterization and observation of dissolution processes using atomic force microscopyCampbell, P. A. / Gledhill, H. C. / Brown, S. R. / Turner, I. G. et al. | 1996
- 1173
-
Scanning tunneling microscopy and spectroscopy on thin Fe3O4 (110) films on MgOJansen, R. / van Kempen, H. / Wolf, R. M. et al. | 1996
- 1176
-
Spatially resolved electron tunneling spectroscopy on single crystalline Rb3C60Jess, P. / Hubler, U. / Behler, S. / Thommen‐Geiser, V. / Lang, H. P. / Güntherodt, H.‐J. et al. | 1996
- 1180
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Surface structure of ferroelectric domains on the triglycine sulfate (010) surfaceBluhm, H. / Wiesendanger, R. / Meyer, K.‐P. et al. | 1996
- 1184
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Magnetic force microscopy analysis of the micromagnetization mode of double‐layered perpendicular magnetic recording mediaHomma, T. / Kurokawa, Y. / Nakamura, T. / Osaka, T. / Otsuka, I. et al. | 1996
- 1188
-
Growth structure of Fe on the Cu(001) surfaceNoh, H. P. / Choi, Y. J. / Park, J. Y. / Jeong, I. C. / Suh, Y. D. / Kuk, Y. et al. | 1996
- 1191
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Deconvolution of topographic and ferroelectric contrast by noncontact and friction force microscopyEng, L. M. / Friedrich, M. / Fousek, J. / Günter, P. et al. | 1996
- 1197
-
Low‐temperature magnetic resonance force detectionWago, K. / Züger, O. / Kendrick, R. / Yannoni, C. S. / Rugar, D. et al. | 1996
- 1202
-
Scanning Hall probe microscopy of superconductors and magnetic materialsOral, A. / Bending, S. J. / Henini, M. et al. | 1996
- 1206
-
Scanning tunneling microscope for magneto‐optical imagingPrins, M. W. J. / Groeneveld, R. H. M. / Abraham, D. L. / Schad, R. / van Kempen, H. / van Kesteren, H. W. et al. | 1996
- 1210
-
Vortex images in thin films of YBa2Cu3O7−x and Bi2Sr2Ca1Cu2O8+x obtained by low‐temperature magnetic force microscopyYuan, C. W. / Zheng, Z. / de Lozanne, A. L. / Tortonese, M. / Rudman, D. A. / Eckstein, J. N. et al. | 1996
- 1214
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Domain structure of Co/Pt multilayers studied by magnetic force microscopyLöhndorf, M. / Wadas, A. / Wiesendanger, R. / van Kesteren, H. W. et al. | 1996
- 1217
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Spectroscopic study of the CuO chains in YBa2Cu3O7−xEdwards, Hal / Derro, D. J. / Barr, A. L. / Markert, J. T. / de Lozanne, A. L. et al. | 1996
- 1221
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Schottky barrier height measurement on NiSi2/Si(100) by capacitance microscopeKhang, Y. / Mang, K. M. / Booh, K. H. / Kuk, Y. et al. | 1996
- 1224
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Scanning tunneling spectroscopy on low‐ and high‐Tc superconductorsMielke, F. / Memmert, U. / Golubov, A. A. / Hartmann, U. et al. | 1996
- 1229
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Observation of Coulomb staircase and negative differential resistance at room temperature by scanning tunneling microscopyRadojkovic, P. / Schwartzkopff, M. / Enachescu, M. / Stefanov, E. / Hartmann, E. / Koch, F. et al. | 1996
- 1234
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Charge injection and extraction on organic dot structures by atomic force microscopyHieda, Hiroyuki / Tanaka, Kuniyoshi / Gemma, Nobuhiro et al. | 1996
- 1238
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Role of interface microstructure in rectifying metal/semiconductor contacts: Ballistic electron emission observations correlated to microstructureMorgan, Brent A. / Ring, Ken M. / Kavanagh, Karen L. / Talin, A. Alec / Williams, R. Stanley / Yasuda, Takashi / Yasui, Takanari / Segawa, Yusaburo et al. | 1996
- 1243
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Energy band of manipulated atomic structures on an insulator substrateYamada, Toshishige / Yamamoto, Yoshihisa / Harrison, Walter A. et al. | 1996
- 1250
-
Elastic deformations of tip and sample during atomic force microscope measurementsHeuberger, Manfred / Dietler, Giovanni / Schlapbach, Louis et al. | 1996
- 1255
-
Friction forces on hydrogen passivated (110) silicon and silicon dioxide studied by scanning force microscopyScandella, L. / Meyer, E. / Howald, L. / Lüthi, R. / Guggisberg, M. / Gobrecht, J. / Güntherodt, H. ‐J. et al. | 1996
- 1259
-
Study of plastic flow in ultrasmall Au contactsStalder, A. / Dürig, U. et al. | 1996
- 1264
-
Influence of humidity on friction measurements of supported MoS2 single layersSchumacher, A. / Kruse, N. / Prins, R. / Meyer, E. / Lüthi, R. / Howald, L. / Güntherodt, H.‐J. / Scandella, L. et al. | 1996
- 1268
-
Nanometer‐scale modification of tribomechanical properties of Si(111):H surfaces performed and investigated by a conducting‐probe scanning force microscopeTeuschler, T. / Mahr, K. / Miyazaki, S. / Hundhausen, M. / Ley, L. et al. | 1996
- 1272
-
Study of molecular scale friction on stearic acid crystals by friction force microscopyTakano, Hajime / Fujihira, Masamichi et al. | 1996
- 1276
-
Dewetting dynamics and nucleation of polymers observed by elastic and friction force microscopyOverney, R. M. / Leta, D. P. / Fetters, L. J. / Liu, Y. / Rafailovich, M. H. / Sokolov, J. et al. | 1996
- 1280
-
Friction on the atomic scale: An ultrahigh vacuum atomic force microscopy study on ionic crystalsLüthi, R. / Meyer, E. / Bammerlin, M. / Howald, L. / Haefke, H. / Lehmann, T. / Loppacher, C. / Güntherodt, H.‐J. / Gyalog, T. / Thomas, H. et al. | 1996
- 1285
-
Site‐specific friction force spectroscopyMeyer, E. / Lüthi, R. / Howald, L. / Bammerlin, M. / Guggisberg, M. / Güntherodt, H.‐J. et al. | 1996
- 1289
-
Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscopeCarpick, R. W. / Agraït, N. / Ogletree, D. F. / Salmeron, M. et al. | 1996
- 1296
-
Scanning force and friction microscopy at highly oriented polycrystalline graphite and CuP2(100) surfaces in ultrahigh vacuumMüller, T. / Kässer, T. / Labardi, M. / Lux‐Steiner, M. / Marti, O. / Mlynek, J. / Krausch, G. et al. | 1996
- 1302
-
Tip–sample interactions: Extraction of single molecular pair potentials from force curvesUnger, Marc A. / O’Connor, Stephen D. / Baldeschwieler, John D. et al. | 1996
- 1308
-
Materials’ properties measurements: Choosing the optimal scanning probe microscope configurationBurnham, N. A. / Gremaud, G. / Kulik, A. J. / Gallo, P.‐J. / Oulevey, F. et al. | 1996
- 1313
-
Transient response of tapping scanning force microscopy in liquidsChen, G. Y. / Warmack, R. J. / Oden, P. I. / Thundat, T. et al. | 1996
- 1318
-
Atomic force microscopy images obtained with C60 modified tipsKim, Sanghee / Park, Sang‐Kyu / Park, Chan / Jeon, Il Cheol et al. | 1996
- 1322
-
Direct patterning of Si(001) surfaces by atomic manipulationSalling, Craig T. et al. | 1996
- 1327
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Low‐voltage electron‐beam lithography with scanning tunneling microscopy in air: A new method for producing structures with high aspect ratiosKragler, K. / Günther, E. / Leuschner, R. / Falk, G. / von Seggern, H. / Saemann‐Ischenko, G. et al. | 1996
- 1331
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Application of scanning tunneling microscopy nanofabrication process to single electron transistorMatsumoto, Kazuhiko / Ishii, Masami / Segawa, Kazuhito et al. | 1996
- 1336
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Electron‐stimulated desorption of hydrogen from the Si(111) surface by scanning tunneling microscopySchwartzkopff, M. / Radojkovic, P. / Enachescu, M. / Hartmann, E. / Koch, F. et al. | 1996
- 1341
-
Imaging and manipulation of nanometer‐size liquid droplets by scanning polarization force microscopyHu, Jun / Carpick, Robert W. / Salmeron, Miquel / Xiao, Xu‐dong et al. | 1996
- 1344
-
Scanning tunneling microscopy induced chemical‐vapor deposition of semiconductor quantum dotsSamara, D. / Williamson, J. R. / Shih, C. K. / Banerjee, S. K. et al. | 1996
- 1349
-
Ultrahigh density data storage on Ag–TDCN thin films by scanning tunneling microscopyGao, H. J. / Wang, D. W. / Liu, N. / Xue, Z. Q. / Pang, S. J. et al. | 1996
- 1353
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Information storage using conductance change of Langmuir–Blodgett film and atomic force microscope/scanning tunneling microscopeYano, K. / Kuroda, R. / Shimada, Y. / Shido, S. / Kyogaku, M. / Matsuda, H. / Takimoto, K. / Eguchi, K. / Nakagiri, T. et al. | 1996
- 1356
-
Critical humidity for removal of atoms from the gold surface with scanning tunneling microscopyLebreton, C. / Wang, Z. Z. et al. | 1996
- 1360
-
Morphology and dissolution processes of metal sulfide minerals observed with the electrochemical scanning tunneling microscopeHiggins, S. R. / Hamers, R. J. et al. | 1996
- 1365
-
Stability of surface atomic structures of ionic crystals studied by atomic force microscopy observation of various faces of CaSO4 crystal in solutionsShindo, H. / Seo, A. / Itasaka, M. / Odaki, T. / Tanaka, K. et al. | 1996
- 1369
-
Atomic structures and growth mechanisms of electrodeposited Ag and Te films as discerned by atomic force microscopyIkemiya, Norihito / Yamada, Koji / Hara, Shigeta et al. | 1996
- 1373
-
In situ studies of potassium hydrogen phthalate crystal dissolution using scanning probe microscopyCampbell, P. A. / Ester, G. R. / Halfpenny, P. J. et al. | 1996
- 1378
-
Effects of electric potentials on surface forces in electrolyte solutionsArai, Toyoko / Fujihira, Masamichi et al. | 1996
- 1383
-
Atomic force microscopy stress sensors for studies in liquidsO’Shea, S. J. / Welland, M. E. / Brunt, T. A. / Ramadan, A. R. / Rayment, T. et al. | 1996
- 1386
-
Approaching the liquid/air interface with scanning force microscopyEng, L. M. / Seuret, Ch. / Looser, H. / Günter, P. et al. | 1996
- 1390
-
Atomic force microscopy of biomoleculesHansma, Helen G. et al. | 1996
- 1395
-
Atomic force microscopy observation of native neurons and modifications induced by glutamateCricenti, A. / De Stasio, G. / Generosi, R. / Scarselli, M. A. / Perfetti, P. / Ciotti, M. T. / Mercanti, D. et al. | 1996
- 1399
-
Combination of fluorescence in situ hybridization and scanning force microscopy for the ultrastructural characterization of defined chromatin regionsFritzsche, W. / Takács, L. / Vereb, G. / Schlammadinger, J. / Jovin, T. M. et al. | 1996
- 1405
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Reconstruction of ribosomal subunits and rDNA chromatin imaged by scanning force microscopyFritzsche, Wolfgang / Martin, Linda / Dobbs, Drena / Jondle, Daniel / Miller, Richard / Vesenka, James / Henderson, Eric et al. | 1996
- 1410
-
Atomic force microscope imaging of ribosome and chromosomeLi, Min‐Qian / Xu, Lei / Ikai, Atsushi et al. | 1996
- 1413
-
Atomic force microscopy reconstruction of G‐wire DNAa)Vesenka, James / Marsh, Thomas / Miller, Richard / Henderson, Eric et al. | 1996
- 1418
-
Modified DNA immobilized on bioreactive self‐assembled monolayer on gold for dynamic force microscopy imaging in aqueous buffer solutionHegner, M. / Dreier, M. / Wagner, P. / Semenza, G. / Güntherodt, H. J. et al. | 1996
- 1422
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Covalent immobilization of immunoglobulins G and Fab′ fragments on gold substrates for scanning force microscopy imaging in liquidsDroz, Eric / Taborelli, Mauro / Descouts, Pierre / Wells, Timothy N. C. / Werlen, Raymond C. et al. | 1996
- 1427
-
Dynamical and mechanical study of immobilized microtubules with atomic force microscopyVinckier, Anja / Dumortier, Chantal / Engelborghs, Yves / Hellemans, Louis et al. | 1996
- 1432
-
Hydrogen bonding molecules and their effect on scanning tunneling microscope image contrast of covalently immobilized protein moleculesParker, Marie‐Claire / Davies, Martyn C. / Tendler, Saul J. B. et al. | 1996
- 1438
-
Chromosome classification by atomic force microscopy volume measurementMcMaster, T. J. / Winfield, M. O. / Baker, A. A. / Karp, A. / Miles, M. J. et al. | 1996
- 1444
-
Improvements in atomic force microscopy protocols for imaging fibrous proteinsHallett, P. / Tskhovrebova, L. / Trinick, J. / Offer, G. / Miles, M. J. et al. | 1996
- 1449
-
Studying membranes with scanning force microscopy and patch‐clamp techniqueMosbacher, J. / Häberle, W. / Hörber, J. K. H. et al. | 1996
- 1453
-
Butanethiol self‐assembly on Au(001): The 1×4 Au missing row, c(2×8) molecular latticePoirier, G. E. et al. | 1996
- 1461
-
Comparative scanning tunneling microscopy observation of a homologous series of n‐alkyloxy‐cyanobiphenylesWalzer, K. / Hietschold, M. et al. | 1996
- 1466
-
ω‐functionalized self‐assembled monolayers chemisorbed on ultraflat Au(111) surfaces for biological scanning probe microscopy in aqueous buffersWagner, Peter / Zaugg, Frank / Kernen, Peter / Hegner, Martin / Semenza, Giorgio et al. | 1996
- 1472
-
Current imaging tunneling spectroscopy of an alkyl cyanobiphenyl liquid crystalRivera, M. / Williamson, R. L. / Miles, M. J. et al. | 1996
- 1476
-
Structural investigation of cytochrome f Langmuir–Blodgett films with scanning tunneling microscopy: Protein aggregationTazi, A. / Boussaad, S. / DeRose, J. A. / Leblanc, R. M. et al. | 1996
- 1481
-
Atomic force microscope study of chromatic transitions in polydiacetylene thin filmsLio, A. / Reichert, A. / Nagy, J. O. / Salmeron, M. / Charych, D. H. et al. | 1996
- 1486
-
Scanning thermal microscopy: Subsurface imaging, thermal mapping of polymer blends, and localized calorimetryHammiche, A. / Hourston, D. J. / Pollock, H. M. / Reading, M. / Song, M. et al. | 1996
- 1492
-
Characterization of mixed miscible and nonmiscible phospholipid Langmuir–Blodgett films by atomic force microscopySolletti, J. M. / Botreau, M. / Sommer, F. / Duc, Tran Minh / Celio, M. R. et al. | 1996
- 1498
-
Scanning tunneling microscopy based on the conductivity of surface adsorbed water. Charge transfer between tip and sample via electrochemistry in a water meniscus or via tunneling?Heim, M. / Eschrich, R. / Hillebrand, A. / Knapp, H. F. / Guckenberger, R. / Cevc, G. et al. | 1996
- 1503
-
Combined scanning force, lateral force, and scanning surface potential microscopy on phase‐separated Langmuir–Blodgett filmsJacobi, S. / Chi, L. F. / Fuchs, H. et al. | 1996
- 1509
-
Scanning force microscopy of polyolefinic rubbers in homopolypropylene matricesLabardi, M. / Allegrini, M. / Marchetti, E. / Sgarzi, P. et al. | 1996
- 1513
-
Minimizing the size of force‐controlled point contacts on silicon for carrier profilingSnauwaert, J. / Blanc, N. / De Wolf, P. / Vandervorst, W. / Hellemans, L. et al. | 1996
- 1518
-
Scanned probe microscope tip characterization without calibrated tip characterizersVillarrubia, J. S. et al. | 1996
- 1522
-
In situ control and analysis of the scanning tunneling microscope tip by formation of sharp needles on the Si sample and W tipHeike, S. / Hashizume, T. / Wada, Y. et al. | 1996
- 1527
-
Pt:SnO2 thin films for gas sensor characterized by atomic force microscopy and x‐ray photoemission spectromicroscopyCricenti, A. / Generosi, R. / Scarselli, M. A. / Perfetti, P. / Siciliano, P. / Serra, A. / Tepore, A. / Almeida, J. / Coluzza, C. / Margaritondo, G. et al. | 1996
- 1531
-
International intercomparison of scanning tunneling microscopyBarbato, G. / Carneiro, K. / Cuppini, D. / Garnaes, J. / Gori, G. / Hughes, G. / Jensen, C. P. / Jo/rgensen, J. F. / Jusko, O. / Livi, S. et al. | 1996
- 1536
-
Direct imaging of SiO2 thickness variation on Si using modified atomic force microscopeMang, K. M. / Khang, Y. / Park, Y. J. / Kuk, Young / Lee, S. M. / Williams, C. C. et al. | 1996
- 1540
-
Increasing the value of atomic force microscopy process metrology using a high‐accuracy scanner, tip characterization, and morphological image analysisSchneir, J. / Villarrubia, J. S. / McWaid, T. H. / Tsai, V. W. / Dixson, R. et al. | 1996
- 1547
-
Kelvin probe force microscopy for characterization of semiconductor devices and processesTanimoto, Masafumi / Vatel, Olivier et al. | 1996
- 1552
-
Blind restoration method of scanning tunneling and atomic force microscopy imagesDongmo, Samuel / Troyon, Michel / Vautrot, Philippe / Delain, Etienne / Bonnet, Noél et al. | 1996
- 1557
-
Blind reconstruction of scanning probe image dataWilliams, P. M. / Shakesheff, K. M. / Davies, M. C. / Jackson, D. E. / Roberts, C. J. / Tendler, S. J. B. et al. | 1996
- 1563
-
Neural network correction of nonlinearities in scanning probe microscope imagesHadjiiski, L. / Münster, S. / Oesterschulze, E. / Kassing, R. et al. | 1996