Low thermal power electron beam annealing of scanning tunneling microscope tips (Englisch)
Nationallizenz
- Neue Suche nach: Scholz, R.
- Neue Suche nach: Agne, M.
- Neue Suche nach: Breitenstein, O.
- Neue Suche nach: Jenniches, H.
- Neue Suche nach: Scholz, R.
- Neue Suche nach: Agne, M.
- Neue Suche nach: Breitenstein, O.
- Neue Suche nach: Jenniches, H.
In:
Review of Scientific Instruments
;
68
, 8
;
3262-3263
;
1997
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Low thermal power electron beam annealing of scanning tunneling microscope tips
-
Beteiligte:Scholz, R. ( Autor:in ) / Agne, M. ( Autor:in ) / Breitenstein, O. ( Autor:in ) / Jenniches, H. ( Autor:in )
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Erschienen in:Review of Scientific Instruments ; 68, 8 ; 3262-3263
-
Verlag:
- Neue Suche nach: American Institute of Physics
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Erscheinungsdatum:01.08.1997
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 68, Ausgabe 8
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