Variation in band offsets at ZnO/Sn:In2O3 heterojunctions measured by x-ray photoelectron spectroscopy (Englisch)
- Neue Suche nach: Kaspar, Tiffany C.
- Neue Suche nach: Droubay, Tim C.
- Neue Suche nach: Kaspar, Tiffany C.
- Neue Suche nach: Droubay, Tim C.
In:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
;
30
, 4
;
7
;
2012
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Variation in band offsets at ZnO/Sn:In2O3 heterojunctions measured by x-ray photoelectron spectroscopy
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Weitere Titelangaben:Variation in band offsets at ZnO/ITO heterojunctions measured
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Beteiligte:Kaspar, Tiffany C. ( Autor:in ) / Droubay, Tim C. ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: American Vacuum Society
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Erscheinungsdatum:01.07.2012
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Format / Umfang:7 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 30, Ausgabe 4
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