Methods for measurement of electron emission yield under low energy electron-irradiation by collector method and Kelvin probe method (Englisch)
- Neue Suche nach: Tondu, Thomas
- Neue Suche nach: Belhaj, Mohamed
- Neue Suche nach: Inguimbert, Virginie
- Neue Suche nach: Tondu, Thomas
- Neue Suche nach: Belhaj, Mohamed
- Neue Suche nach: Inguimbert, Virginie
In:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
;
28
, 5
;
1122-1125
;
2010
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Methods for measurement of electron emission yield under low energy electron-irradiation by collector method and Kelvin probe method
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Weitere Titelangaben:Methods for measurement of electron emission yield
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Beteiligte:
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Erschienen in:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films ; 28, 5 ; 1122-1125
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Verlag:
- Neue Suche nach: American Vacuum Society
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Erscheinungsdatum:01.09.2010
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Format / Umfang:4 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 28, Ausgabe 5
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