X-ray analysis of spontaneous lateral modulation in (InAs)n/(AlAs)m short-period superlattices (Englisch)
Nationallizenz
- Neue Suche nach: Li, J. H.
- Neue Suche nach: Holy´, V.
- Neue Suche nach: Zhong, Z.
- Neue Suche nach: Kulik, J.
- Neue Suche nach: Moss, S. C.
- Neue Suche nach: Norman, A. G.
- Neue Suche nach: Mascarenhas, A.
- Neue Suche nach: Reno, J. L.
- Neue Suche nach: Follstaedt, D. M.
- Neue Suche nach: Li, J. H.
- Neue Suche nach: Holy´, V.
- Neue Suche nach: Zhong, Z.
- Neue Suche nach: Kulik, J.
- Neue Suche nach: Moss, S. C.
- Neue Suche nach: Norman, A. G.
- Neue Suche nach: Mascarenhas, A.
- Neue Suche nach: Reno, J. L.
- Neue Suche nach: Follstaedt, D. M.
In:
Applied Physics Letters
;
78
, 2
;
219-221
;
2001
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:X-ray analysis of spontaneous lateral modulation in (InAs)n/(AlAs)m short-period superlattices
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Beteiligte:Li, J. H. ( Autor:in ) / Holy´, V. ( Autor:in ) / Zhong, Z. ( Autor:in ) / Kulik, J. ( Autor:in ) / Moss, S. C. ( Autor:in ) / Norman, A. G. ( Autor:in ) / Mascarenhas, A. ( Autor:in ) / Reno, J. L. ( Autor:in ) / Follstaedt, D. M. ( Autor:in )
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Erschienen in:Applied Physics Letters ; 78, 2 ; 219-221
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Verlag:
- Neue Suche nach: American Institute of Physics
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Erscheinungsdatum:08.01.2001
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 78, Ausgabe 2
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