Raman spectral study of silicon nanowires: High-order scattering and phonon confinement effects (Englisch)
Nationallizenz
- Neue Suche nach: Wang, Rong-ping
- Neue Suche nach: Zhou, Guang-wen
- Neue Suche nach: Liu, Yu-long
- Neue Suche nach: Pan, Shao-hua
- Neue Suche nach: Zhang, Hong-zhou
- Neue Suche nach: Yu, Da-peng
- Neue Suche nach: Zhang, Ze
- Neue Suche nach: Wang, Rong-ping
- Neue Suche nach: Zhou, Guang-wen
- Neue Suche nach: Liu, Yu-long
- Neue Suche nach: Pan, Shao-hua
- Neue Suche nach: Zhang, Hong-zhou
- Neue Suche nach: Yu, Da-peng
- Neue Suche nach: Zhang, Ze
In:
Physical Review B
;
61
, 24
;
16827-16832
;
2000
-
ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Raman spectral study of silicon nanowires: High-order scattering and phonon confinement effects
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Beteiligte:Wang, Rong-ping ( Autor:in ) / Zhou, Guang-wen ( Autor:in ) / Liu, Yu-long ( Autor:in ) / Pan, Shao-hua ( Autor:in ) / Zhang, Hong-zhou ( Autor:in ) / Yu, Da-peng ( Autor:in ) / Zhang, Ze ( Autor:in )
-
Erschienen in:Physical Review B ; 61, 24 ; 16827-16832
-
Verlag:
- Neue Suche nach: The American Physical Society
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Erscheinungsdatum:15.06.2000
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Format / Umfang:6 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 61, Ausgabe 24
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Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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