Spot-profile-analyzing LEED study of the epitaxial growth of Fe, Co, and Cu on Cu(100) (Englisch)
Nationallizenz
- Neue Suche nach: Nyberg, G. L.
- Neue Suche nach: Kief, M. T.
- Neue Suche nach: Egelhoff Jr., W. F.
- Neue Suche nach: Nyberg, G. L.
- Neue Suche nach: Kief, M. T.
- Neue Suche nach: Egelhoff Jr., W. F.
In:
Physical Review B
;
48
, 19
;
14509-14519
;
1993
-
ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Spot-profile-analyzing LEED study of the epitaxial growth of Fe, Co, and Cu on Cu(100)
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Beteiligte:
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Erschienen in:Physical Review B ; 48, 19 ; 14509-14519
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Verlag:
- Neue Suche nach: The American Physical Society
-
Erscheinungsdatum:15.11.1993
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Format / Umfang:11 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 48, Ausgabe 19
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