Electrical characteristics assessment and noise analysis of pocket-doped multi source T-shaped gate tunnel FET (Englisch)
- Neue Suche nach: Kumari, Sushmita
- Neue Suche nach: Ghosh, Puja
- Weitere Informationen zu Ghosh, Puja:
- https://orcid.org/0000-0003-2347-4332
- Neue Suche nach: Kumari, Sushmita
- Neue Suche nach: Ghosh, Puja
- Weitere Informationen zu Ghosh, Puja:
- https://orcid.org/0000-0003-2347-4332
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Electrical characteristics assessment and noise analysis of pocket-doped multi source T-shaped gate tunnel FET
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Beteiligte:Kumari, Sushmita ( Autor:in ) / Ghosh, Puja ( Autor:in )
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Verlag:
- Neue Suche nach: Elsevier Ltd
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Erscheinungsdatum:04.12.2023
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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