Board level drop test and simulation of leaded and lead-free BGA-PCB assembly (Englisch)
- Neue Suche nach: Qu, Xin
- Neue Suche nach: Chen, Zhaoyi
- Neue Suche nach: Qi, Bo
- Neue Suche nach: Lee, Taekoo
- Neue Suche nach: Wang, Jiaji
- Neue Suche nach: Qu, Xin
- Neue Suche nach: Chen, Zhaoyi
- Neue Suche nach: Qi, Bo
- Neue Suche nach: Lee, Taekoo
- Neue Suche nach: Wang, Jiaji
In:
Microelectronics and Reliability
;
47
, 12
;
2197-2204
;
2006
-
ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Board level drop test and simulation of leaded and lead-free BGA-PCB assembly
-
Beteiligte:Qu, Xin ( Autor:in ) / Chen, Zhaoyi ( Autor:in ) / Qi, Bo ( Autor:in ) / Lee, Taekoo ( Autor:in ) / Wang, Jiaji ( Autor:in )
-
Erschienen in:Microelectronics and Reliability ; 47, 12 ; 2197-2204
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Verlag:
- Neue Suche nach: Elsevier Ltd
-
Erscheinungsdatum:21.08.2006
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Format / Umfang:8 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 47, Ausgabe 12
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