Artificial patina formation onto copper-based alloys: Chloride and sulphate induced corrosion processes (Englisch)
- Neue Suche nach: Di Carlo, G.
- Neue Suche nach: Giuliani, C.
- Neue Suche nach: Riccucci, C.
- Neue Suche nach: Pascucci, M.
- Neue Suche nach: Messina, E.
- Neue Suche nach: Fierro, G.
- Neue Suche nach: Lavorgna, M.
- Neue Suche nach: Ingo, G.M.
- Neue Suche nach: Di Carlo, G.
- Neue Suche nach: Giuliani, C.
- Neue Suche nach: Riccucci, C.
- Neue Suche nach: Pascucci, M.
- Neue Suche nach: Messina, E.
- Neue Suche nach: Fierro, G.
- Neue Suche nach: Lavorgna, M.
- Neue Suche nach: Ingo, G.M.
In:
Applied Surface Science
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421
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120-127
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2017
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Artificial patina formation onto copper-based alloys: Chloride and sulphate induced corrosion processes
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Beteiligte:Di Carlo, G. ( Autor:in ) / Giuliani, C. ( Autor:in ) / Riccucci, C. ( Autor:in ) / Pascucci, M. ( Autor:in ) / Messina, E. ( Autor:in ) / Fierro, G. ( Autor:in ) / Lavorgna, M. ( Autor:in ) / Ingo, G.M. ( Autor:in )
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Erschienen in:Applied Surface Science ; 421 ; 120-127
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Verlag:
- Neue Suche nach: The Authors
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Erscheinungsdatum:09.01.2017
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Format / Umfang:8 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 421
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Retrieval of the non-depolarizing components of depolarizing Mueller matrices by using symmetry conditions and least squares minimizationKuntman, Ertan / Canillas, Adolf / Arteaga, Oriol et al. | 2016
- 702
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Back-focal plane Mueller matrix microscopy: Mueller conoscopy and Mueller diffractrometryArteaga, Oriol / Nichols, Shane M. / Antó, Joan et al. | 2016
- 707
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Ellipsometric study of peptide layers – island-like character, depolarization and quasi-absorptionPápa, Z. / Ramakrishnan, S. / Martin, M. / Cloitre, T. / Zimányi, L. / Tóth, Z. / Gergely, C. / Budai, J. et al. | 2017
- 714
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Spectroscopic ellipsometric investigation of graphene and thin carbon films from the point of view of depolarization effectsPápa, Z. / Csontos, J. / Smausz, T. / Toth, Z. / Budai, J. et al. | 2016
- 722
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Atomic Force Microscopy and Spectroscopic Ellipsometry combined analysis of Small Ubiquitin-like Modifier adsorption on functional monolayersSolano, Ilaria / Parisse, Pietro / Gramazio, Federico / Ianeselli, Luca / Medagli, Barbara / Cavalleri, Ornella / Casalis, Loredana / Canepa, Maurizio et al. | 2016
- 728
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IR-Mueller matrix ellipsometry of self-assembled nanopatterned gold grid polarizerPeinado, A. / Kildemo, M. / Aas, L.M.S. / Martella, C. / Giordano, M.C. / Chiappe, D. / de Mongeot, F. Buatier / Borondics, F. / Garcia-Caurel, E. et al. | 2016
- 738
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Occurrence and significance of evanescent fields in structured samplesPerin, Jean-Pierre / Hingerl, Kurt et al. | 2016
- 744
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Optical properties of Zr and ZrO2Petrik, P. / Sulyok, A. / Novotny, T. / Perez-Feró, E. / Kalas, B. / Agocs, E. / Lohner, T. / Lehninger, D. / Khomenkova, L. / Nagy, R. et al. | 2016
- 748
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Spectroscopic ellipsometry and X-ray diffraction studies on Si1-xGex/Si epifilms and superlatticesXie, Deng / Qiu, Zhi Ren / Wan, Lingyu / Talwar, Devki N. / Cheng, Hung-Hsiang / Liu, Shiyuan / Mei, Ting / Feng, Zhe Chuan et al. | 2017
- 755
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Functionalization of gold and graphene electrodes by p-maleimido-phenyl towards thiol-sensing systems investigated by EQCM and IR ellipsometric spectroscopyNeubert, Tilmann J. / Rösicke, Felix / Sun, Guoguang / Janietz, Silvia / Gluba, Marc A. / Hinrichs, Karsten / Nickel, Norbert H. / Rappich, Jörg et al. | 2016
- 761
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Nonlinear ellipsometry of Si(111) by second harmonic generationReitböck, Cornelia / Stifter, David / Alejo-Molina, Adalberto / Hardhienata, Hendradi / Hingerl, Kurt et al. | 2016
- 766
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Control of slanting angle, porosity, and anisotropic optical constants of slanted columnar thin films via in situ nucleation layer tailoringRice, Charles / Mock, Alyssa / Sekora, Derek / Schmidt, Daniel / Hofmann, Tino / Schubert, Eva / Schubert, Mathias et al. | 2017
- 772
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Characterization of thin SiGe layers on Si (001) by spectroscopic ellipsometry for Ge fractions from 0 to 100%Schmidt, Jan / Eilert, Marius / Peters, Sven / Wietler, Tobias F. et al. | 2016
- 778
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Optical properties of graphene oxide and reduced graphene oxide determined by spectroscopic ellipsometrySchöche, Stefan / Hong, Nina / Khorasaninejad, Mohammadreza / Ambrosio, Antonio / Orabona, Emanuele / Maddalena, Pasqualino / Capasso, Federico et al. | 2017
- 783
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Optical and structural properties of cobalt-permalloy slanted columnar heterostructure thin filmsSekora, Derek / Briley, Chad / Schubert, Mathias / Schubert, Eva et al. | 2016
- 788
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Anisotropic optical constants and inter-band optical transitions in layered semiconductor TlGaSe2Shim, YongGu / Itoh, Yoshiaki / Wakita, Kazuki / Mamedov, Nazim et al. | 2016
- 794
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Optical and microstructural properties of decorative Al/Ti/TiO2 interference coatingsSkowronski, L. / Wachowiak, A.A. / Wachowiak, W. et al. | 2017
- 802
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An original method to determine complex refractive index of liquids by spectroscopic ellipsometry and illustrated applicationsStchakovsky, M. / Battie, Y. / Naciri, A. En et al. | 2016
- 807
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Visualization of low-contrast surface modifications: Thin films, printed pattern, laser-induced changes, imperfections, impurities, and degradationStockmann, J. / Hertwig, A. / Beck, U. et al. | 2016
- 813
-
Optical properties of InP from infrared to vacuum ultraviolet studied by spectroscopic ellipsometrySubedi, Indra / Slocum, Michael A. / Forbes, David V. / Hubbard, Seth M. / Podraza, Nikolas J. et al. | 2017
- 819
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Analyzing optical properties of thin vanadium oxide films through semiconductor-to-metal phase transition using spectroscopic ellipsometrySun, Jianing / Pribil, Greg K. et al. | 2016
- 824
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Optical constants of electroplated gold from spectroscopic ellipsometrySynowicki, R.A. / Herzinger, Craig M. / Hall, James T. / Malingowski, Andrew et al. | 2017
- 831
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Optical anisotropy studies of silver nanowire/polymer composite films with Mueller matrix ellipsometryTomiyama, Takeo / Yamazaki, Hiroshi et al. | 2017
- 837
-
Optical properties of lithium gallium oxideTumėnas, S. / Mackonis, P. / Nedzinskas, R. / Trinkler, L. / Berzina, B. / Korsaks, V. / Chang, L. / Chou, M.M.C. et al. | 2017
- 843
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Quartz crystal microbalance with coupled spectroscopic ellipsometry-study of temperature-responsive polymer brush systemsAdam, Stefan / Koenig, Meike / Rodenhausen, Keith Brian / Eichhorn, Klaus-Jochen / Oertel, Ulrich / Schubert, Mathias / Stamm, Manfred / Uhlmann, Petra et al. | 2017
- 852
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Spectroscopic ellipsometry determination of optical and electrical properties of aluminum doped zinc oxideUprety, Prakash / Junda, Maxwell M. / Ghimire, Kiran / Adhikari, Dipendra / Grice, Corey R. / Podraza, Nikolas J. et al. | 2017
- 859
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Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1−xN/AlN/Si structuresWang, Chennan / Caha, Ondřej / Münz, Filip / Kostelník, Petr / Novák, Tomáš / Humlíček, Josef et al. | 2017
- 866
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Temperature dependence of optical constants of La0.7Sr0.3MnO3 thin filmsYamada, Yasusei / So, Jongmin / Asano, Hidefumi / Tazawa, Masato / Yoshimura, Kazuki et al. | 2017
- 870
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Experimental study of thickness dependence of polarization and depolarization properties of anisotropic turbid media using Mueller matrix polarimetry and differential decompositionYoo, Sang Hyuk / Ossikovski, Razvigor / Garcia-Caurel, Enric et al. | 2017
- 878
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Convergence and precision characteristics of finite difference time domain method for the analysis of spectroscopic ellipsometry data at oblique incidenceFoo, Yishu / Zapien, Juan Antonio et al. | 2016
- 884
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Optical properties of thickness-controlled MoS2 thin films studied by spectroscopic ellipsometryLi, Dahai / Song, Xiongfei / Xu, Jiping / Wang, Ziyi / Zhang, Rongjun / Zhou, Peng / Zhang, Hao / Huang, Renzhong / Wang, Songyou / Zheng, Yuxiang et al. | 2016
- 891
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Structural and optical properties of highly (110)-oriented non-polar ZnO evaporated films on Si substratesYang, Shang-Dong / Zheng, Yu-Xiang / Yang, Liao / Liu, Zhun-Hua / Zhou, Wen-Jie / Wang, Song-You / Zhang, Rong-Jun / Chen, Liang-Yao et al. | 2017
- 899
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Ellipsometric study on temperature dependent optical properties of topological bismuth filmYang, Liao / Zheng, Yu-Xiang / Yang, Shang-Dong / Liu, Zhun-Hua / Zhang, Jin-Bo / Zhang, Rong-Jun / Wang, Song-You / Zhang, Dong-Xu / Chen, Liang-Yao et al. | 2016
- 905
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Temperature dependence of the interband critical points of bulk Ge and strained Ge on SiFernando, Nalin S. / Nunley, T. Nathan / Ghosh, Ayana / Nelson, Cayla M. / Cooke, Jacqueline A. / Medina, Amber A. / Zollner, Stefan / Xu, Chi / Menendez, Jose / Kouvetakis, John et al. | 2016
- 913
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Temperature-dependent dielectric function of nickelZollner, Stefan / Nathan Nunley, T. / Trujillo, Dennis P. / Pineda, Laura G. / Abdallah, Lina S. et al. | 2016
- i
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Editorial Board| 2017