To tilt or not to tilt: Correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction (Englisch)
- Neue Suche nach: Sojka, Falko
- Neue Suche nach: Meissner, Matthias
- Neue Suche nach: Zwick, Christian
- Neue Suche nach: Forker, Roman
- Neue Suche nach: Vyshnepolsky, Michael
- Neue Suche nach: Klein, Claudius
- Neue Suche nach: Horn-von Hoegen, Michael
- Neue Suche nach: Fritz, Torsten
- Neue Suche nach: Sojka, Falko
- Neue Suche nach: Meissner, Matthias
- Neue Suche nach: Zwick, Christian
- Neue Suche nach: Forker, Roman
- Neue Suche nach: Vyshnepolsky, Michael
- Neue Suche nach: Klein, Claudius
- Neue Suche nach: Horn-von Hoegen, Michael
- Neue Suche nach: Fritz, Torsten
In:
Ultramicroscopy
;
133
;
35-40
;
2013
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:To tilt or not to tilt: Correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction
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Beteiligte:Sojka, Falko ( Autor:in ) / Meissner, Matthias ( Autor:in ) / Zwick, Christian ( Autor:in ) / Forker, Roman ( Autor:in ) / Vyshnepolsky, Michael ( Autor:in ) / Klein, Claudius ( Autor:in ) / Horn-von Hoegen, Michael ( Autor:in ) / Fritz, Torsten ( Autor:in )
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Erschienen in:Ultramicroscopy ; 133 ; 35-40
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Verlag:
- Neue Suche nach: Elsevier B.V.
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Erscheinungsdatum:21.04.2013
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Format / Umfang:6 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 133
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- IFC
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IFC (Editorial Board)| 2013