Direct measurements of the properties of Thick-GEM reflective photocathodes (Englisch)
- Neue Suche nach: Baruzzo, M.
- Neue Suche nach: Chatterjee, C.
- Neue Suche nach: Ciliberti, P.
- Neue Suche nach: Dalla Torre, S.
- Neue Suche nach: Dasgupta, S.S.
- Neue Suche nach: Gobbo, B.
- Neue Suche nach: Gregori, M.
- Neue Suche nach: Hamar, G.
- Neue Suche nach: Levorato, S.
- Neue Suche nach: Menon, G.
- Neue Suche nach: Santos, C.A.
- Neue Suche nach: Tessarotto, F.
- Neue Suche nach: Triloki, P.
- Neue Suche nach: Varga, D.
- Neue Suche nach: Zhao, Y.X.
- Neue Suche nach: Baruzzo, M.
- Neue Suche nach: Chatterjee, C.
- Neue Suche nach: Ciliberti, P.
- Neue Suche nach: Dalla Torre, S.
- Neue Suche nach: Dasgupta, S.S.
- Neue Suche nach: Gobbo, B.
- Neue Suche nach: Gregori, M.
- Neue Suche nach: Hamar, G.
- Neue Suche nach: Levorato, S.
- Neue Suche nach: Menon, G.
- Neue Suche nach: Santos, C.A.
- Neue Suche nach: Tessarotto, F.
- Neue Suche nach: Triloki, P.
- Neue Suche nach: Varga, D.
- Neue Suche nach: Zhao, Y.X.
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Direct measurements of the properties of Thick-GEM reflective photocathodes
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Beteiligte:Baruzzo, M. ( Autor:in ) / Chatterjee, C. ( Autor:in ) / Ciliberti, P. ( Autor:in ) / Dalla Torre, S. ( Autor:in ) / Dasgupta, S.S. ( Autor:in ) / Gobbo, B. ( Autor:in ) / Gregori, M. ( Autor:in ) / Hamar, G. ( Autor:in ) / Levorato, S. ( Autor:in ) / Menon, G. ( Autor:in )
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Verlag:
- Neue Suche nach: Elsevier B.V.
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Erscheinungsdatum:01.05.2020
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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Direct measurements of the properties of Thick-GEM reflective photocathodesBaruzzo, M. / Chatterjee, C. / Ciliberti, P. / Dalla Torre, S. / Dasgupta, S.S. / Gobbo, B. / Gregori, M. / Hamar, G. / Levorato, S. / Menon, G. et al. | 2020
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