Angle-resolved photoelectron spectroscopy on gate insulators (Englisch)
- Neue Suche nach: Hattori, T.
- Neue Suche nach: Nohira, H.
- Neue Suche nach: Shinagawa, S.
- Neue Suche nach: Hori, M.
- Neue Suche nach: Kase, M.
- Neue Suche nach: Maruizumi, T.
- Neue Suche nach: Hattori, T.
- Neue Suche nach: Nohira, H.
- Neue Suche nach: Shinagawa, S.
- Neue Suche nach: Hori, M.
- Neue Suche nach: Kase, M.
- Neue Suche nach: Maruizumi, T.
In:
Microelectronics and Reliability
;
47
, 1
;
20-26
;
2006
-
ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Angle-resolved photoelectron spectroscopy on gate insulators
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Beteiligte:Hattori, T. ( Autor:in ) / Nohira, H. ( Autor:in ) / Shinagawa, S. ( Autor:in ) / Hori, M. ( Autor:in ) / Kase, M. ( Autor:in ) / Maruizumi, T. ( Autor:in )
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Erschienen in:Microelectronics and Reliability ; 47, 1 ; 20-26
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Verlag:
- Neue Suche nach: Elsevier Ltd
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Erscheinungsdatum:15.03.2006
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Format / Umfang:7 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 47, Ausgabe 1
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