A low-cost optical inspection system for rapid surface roughness measurements of CrCN hard films (Englisch)
- Neue Suche nach: Kuo, Chil-Chyuan
- Neue Suche nach: Chen, Yi-Ruei
- Neue Suche nach: Tong, Cheng-Yi
- Neue Suche nach: Lee, Jyh-Wei
- Neue Suche nach: Kuo, Chil-Chyuan
- Neue Suche nach: Chen, Yi-Ruei
- Neue Suche nach: Tong, Cheng-Yi
- Neue Suche nach: Lee, Jyh-Wei
In:
Optik
;
124
, 14
;
1902-1906
;
2012
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:A low-cost optical inspection system for rapid surface roughness measurements of CrCN hard films
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Beteiligte:Kuo, Chil-Chyuan ( Autor:in ) / Chen, Yi-Ruei ( Autor:in ) / Tong, Cheng-Yi ( Autor:in ) / Lee, Jyh-Wei ( Autor:in )
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Erschienen in:Optik ; 124, 14 ; 1902-1906
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Verlag:
- Neue Suche nach: Elsevier GmbH
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Erscheinungsdatum:27.05.2012
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Format / Umfang:5 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 124, Ausgabe 14
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