Electron-beam sensitivity in inorganic specimens (Englisch)
Nationallizenz
- Neue Suche nach: Hobbs, Linn W.
- Neue Suche nach: Hobbs, Linn W.
In:
Ultramicroscopy
;
23
, 3-4
;
339-344
;
1987
-
ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Electron-beam sensitivity in inorganic specimens
-
Beteiligte:Hobbs, Linn W. ( Autor:in )
-
Erschienen in:Ultramicroscopy ; 23, 3-4 ; 339-344
-
Verlag:
-
Erscheinungsdatum:15.06.1987
-
Format / Umfang:6 pages
-
ISSN:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Elektronische Ressource
-
Sprache:Englisch
-
Datenquelle:
Inhaltsverzeichnis – Band 23, Ausgabe 3-4
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 259
-
Foreword| 1987
- 263
-
Study of freshly deposited metallic particles on MgO crystal surfaces by scanning reflection electron microscopyOu, H.-J. / Cowley, J.M. et al. | 1987
- 271
-
The use of RF-plasma reactions for in-situ transmission electron microscopy studiesPoppa, H. / Moorhead, R.D. et al. | 1987
- 275
-
Surface processes observed by high-resolution electron microscopy: Beam-induced transformation and reduction in a modified β-PbO2 crystalKang, Z.C. / Eyring, L. et al. | 1987
- 283
-
Laser photochemical reactionsEhrlich, D.J. / Rothschild, M. / Black, J.G. et al. | 1987
- 291
-
Some electron-induced changes at surfacesLichtman, David et al. | 1987
- 299
-
The electron-beam-induced reduction of transition metal oxide surfaces to metallic lower oxidesSmith, David J. / McCartney, M.R. / Bursill, L.A. et al. | 1987
- 305
-
Electron energy-loss spectroscopy and chemical changeEgerton, R.F. / Crozier, P.A. / Rice, P. et al. | 1987
- 313
-
Spatially resolved electron energy-loss spectroscopy of MoS2 plateletsDisko, M.M. / Treacy, M.M.J. / Rice, S.B. / Chianelli, R.R. / Gland, J.A. / Halbert, T.R. / Ruppert, A.F. et al. | 1987
- 321
-
The effect of dose rate on imaging aromatic organic crystalsFryer, J.R. et al. | 1987
- 329
-
Chemical changes in electron-beam-irradiated polymersVesely, D. / Finch, D.S. et al. | 1987
- 339
-
Electron-beam sensitivity in inorganic specimensHobbs, Linn W. et al. | 1987
- 345
-
Damage effects of high energy electrons on metalsKing, Wayne E. / Benedek, R. / Merkle, K.L. / Meshii, M. et al. | 1987
- 355
-
High-resolution transmission electron microscopic observations of grain boundaries and surfaces on CuTe crystals grown by a solid-solid reactionShiojiri, Makoto / Isshiki, Toshiyuki / Okashita, Kazuhiko / Hirota, Yoshihiro / Maeda, Takashi / Sekimoto, Sunao et al. | 1987
- 365
-
Microstructural evolution during the decomposition of Mg(OH)2Dahmen, U. / Kim, M.G. / Searcy, A.W. et al. | 1987
- 371
-
Phase transformations as studied by electron microscopyVan Landuyt, J. / Van Tendeloo, G. / Amelinckx, S. et al. | 1987
- 383
-
In situ high-resolution electron microscopy reactions in semiconductorsSinclair, R. / Parker, M.A. / Kim, K.B. et al. | 1987
- 397
-
Structural transitions in ionic conductors and optical materialsDavies, Peter K. / Garzon, Fernando H. et al. | 1987
- 405
-
Crystallization, resistivity and microstructure of co-deposited metal-silicon thin film alloysSmith, D.A. / Tu, K.N. / Weiss, B.Z. et al. | 1987
- 411
-
Electron beam sensitivity of zeolite LTreacy, M.M.J. / Newsam, J.M. et al. | 1987
- 421
-
Damage of zeolite Y in the TEM and its effects on TEM imagesCsencsits, R. / Gronsky, R. et al. | 1987
- 433
-
Transmission electron diffraction and microscopy of condensed sulphur hexaflourideRaynerd, G. / Venables, J.A. et al. | 1987
- 443
-
Structural transformation and chemical reduction of Pr24O44 induced by the electron beam during microscopical examinationSchweda, E. / Eyring, L. / Smith, Davud J. et al. | 1987
- 453
-
Electron-induced decomposition of rubidium chromium fluorideSharma, Renu / Barry, John / Eyring, LeRoy et al. | 1987
- 463
-
High-resolution scanning electron microscopy of surface reactionsLiu, J. / Cowley, J.M. et al. | 1987
- 473
-
Author index to volume 23| 1987
- 476
-
Subject index to volume 23| 1987