Critical layer thickness in heterostructures determined by X-ray diffraction (Englisch)
Nationallizenz
- Neue Suche nach: Lazzari, J.L.
- Neue Suche nach: Fouillant, C.
- Neue Suche nach: Grunberg, P.
- Neue Suche nach: Leclercq, J.L.
- Neue Suche nach: Joullié, A.
- Neue Suche nach: Schiller, C.
- Neue Suche nach: Lazzari, J.L.
- Neue Suche nach: Fouillant, C.
- Neue Suche nach: Grunberg, P.
- Neue Suche nach: Leclercq, J.L.
- Neue Suche nach: Joullié, A.
- Neue Suche nach: Schiller, C.
In:
Journal of Crystal Growth
;
130
, 1-2
;
96-100
;
1992
-
ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Critical layer thickness in heterostructures determined by X-ray diffraction
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Beteiligte:Lazzari, J.L. ( Autor:in ) / Fouillant, C. ( Autor:in ) / Grunberg, P. ( Autor:in ) / Leclercq, J.L. ( Autor:in ) / Joullié, A. ( Autor:in ) / Schiller, C. ( Autor:in )
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Erschienen in:Journal of Crystal Growth ; 130, 1-2 ; 96-100
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Verlag:
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Erscheinungsdatum:15.12.1992
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Format / Umfang:5 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 130, Ausgabe 1-2
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Editorial Board| 1993