Dechanneling by misfit dislocations in III–V semiconductor heterostructures (Englisch)
Nationallizenz
- Neue Suche nach: Mazzer, M.
- Neue Suche nach: Drigo, A.V.
- Neue Suche nach: Romanato, F.
- Neue Suche nach: Mazzer, M.
- Neue Suche nach: Drigo, A.V.
- Neue Suche nach: Romanato, F.
In:
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
;
64
, 1-4
;
103-107
;
1992
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Dechanneling by misfit dislocations in III–V semiconductor heterostructures
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Beteiligte:
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Erschienen in:
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Verlag:
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Erscheinungsdatum:01.01.1992
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Format / Umfang:5 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 64, Ausgabe 1-4
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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Nuclear microanalysis study of the growth of thin dielectric films on silicon by classical and rapid thermal treatmentsRigo, S. et al. | 1992
- 12
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Reflections and reminiscences from the early history of RBS, NRA and channelingDavies, J.A. / Amsel, G. / Mayer, J.W. et al. | 1992
- 29
-
Exploring surface structures by coaxial impact collision ion scattering spectroscopy (CAICISS)Aono, M. / Katayama, M. / Nomura, E. et al. | 1992
- 38
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A comparison between high- and low-energy ion mixing at different temperaturesYang-Tse, Cheng / Simko, Steven J. / Militello, Maria C. / Dow, Audrey A. / Auner, Gregory W. / Alkaisi, M.H. / Padmanabhan, K.R. et al. | 1992
- 49
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Low energy ion-surface interactionsCooper, B.H. / DiRubio, C.A. / Kimmel, G.A. / McEachern, R.L. et al. | 1992
- 58
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Order-disorder transition and melting of Au(110) surfacesHoss, A. / Nold, M. / von Blanckenhagen, P. / Meyer, O. et al. | 1992
- 64
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Surface sites and mobilities of In atoms on a stepped Cu( 100) surface studied at low coverageBreeman, M. / Dorenbos, G. / Boerma, D.O. et al. | 1992
- 69
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Strain in an epitaxial Pt/Fe alloy layer on Fe( 100)Leibbrandt, G.W.R. / van Wijk, R. / Habraken, F.H.P.M. et al. | 1992
- 73
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Lead on Cu(100) and Cu(510): desorption and surface diffusion near the bulk melting temperature of PbGirard, Y. / Cohen, C. / Moulin, J. / Schmaus, D. et al. | 1992
- 78
-
RBS analysis of diffusion and evaporation of implanted lead in aluminiumYu, L. / Steenstrup, S. / Johansen, A. / Johnson, E. / Sarholt-Kristensen, L. / Bourdelle, K.K. et al. | 1992
- 83
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Determination of hydrogen surface coverage of Pt0.5Ni0.5 single crystals by NRAFallavier, M. / Hjörvarsson, B. / Benmansour, M. / Thomas, J.P. et al. | 1992
- 88
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Atomic positions on oxygen-covered Cu(110) surfacesDorenbos, G. / Breeman, M. / Boerma, D.O. et al. | 1992
- 93
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Surface composition of PtxNi1−x single crystal alloysWeigand, P. / Novacek, P. / van Husen, G. / Neidhart, T. / Mezey, L.Z. / Hofer, W. / Varga, P. et al. | 1992
- 99
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Ion scattering investigations of buried CoSi2 layers produced by ion beam synthesisJebasinski, R. / Mantl, S. / Dicker, Ch. / Jäger, W. et al. | 1992
- 103
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Dechanneling by misfit dislocations in III–V semiconductor heterostructuresMazzer, M. / Drigo, A.V. / Romanato, F. et al. | 1992
- 108
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Ion mixing in Si/Ge layered structuresZhu, B. / Chow, J.T. / Xia, W. / Lau, S.S. / Butz, R. / Mantl, S. / Corni, F. / Ottaviani, G. et al. | 1992
- 113
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Thin film growth dynamics analyzed by ion scatteringZinke-Allmang, M. et al. | 1992
- 120
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Precipitation of antimony delta-doping layers in Si studied with channeling Rutherford backscattering spectrometryvan Ijzendoorn, L.J. / Fredriksz, C.W. / van Opdorp, C. / Gravesteijn, D.J. / Vandenhoudt, D.E.W. / van de Walle, G.F.A. / Bulle-Lieuwma, C.W.T. et al. | 1992
- 125
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Use of the SUNY microbeam to investigate effects of mechanical treatment on metal/metal interdiffusion kineticsDing, P.J. / Lanford, W.A. / Rodbell, K.P. et al. | 1992
- 130
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Thermal and ion beam induced thin film reactions in Cu-Al bilayersYoshitaka, Tamou / Jian, Li / Russell, Stephen W. / Mayer, James W. et al. | 1992
- 134
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Analysis of IMF-grown CdxHg1 − xTe using helium ion RBSAvery, A.J. / Diskett, D.J. / Gough, J.S. / Young, M.L. et al. | 1992
- 138
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Ion beam mixing of chromium on silicon nitride ceramicsBolse, Wolfgang / Peteves, Stathis D. / Vredenberg, Arjen M. / Saris, Frans W. et al. | 1992
- 143
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Backscattering and channeling study of lead inclusions in Pb-implanted aluminiumBourdelle, K.K. / Andersen, H.H. / Johansen, A. / Johnson, E. / Sarholt-Kristensen, L. / Steenstrup, S. / Yu, L. / Nielsen, B.Bech et al. | 1992
- 149
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The effect of ion beam mixing on SIMS depth resolutionLikonen, J. / Hautala, M. / Koponen, I. et al. | 1992
- 153
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Concentration profile of light elements near an interfaceTerwagne, G. / Deconninck, G. et al. | 1992
- 156
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Precipitation and segregation of Sb at Si-SiO2 interfaces during thermal oxidationWilliams, J.S. / Petravic, M. / Li, Y.H. / Davies, J.A. / Palmer, G.R. et al. | 1992
- 161
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Ion beams in high-temperature superconductivity researchRehn, L.E. et al. | 1992
- 169
-
RBS analysis of thin amorphous YBaCuO films: comparison with direct determination of oxygen contents by NRAWong, J.C.Cheang / Jian, Li / Ortega, C. / Siejka, J. / Vizkelethy, G. / Lemaître, Y. et al. | 1992
- 174
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Channeling spectrometry in HTSC thin film analysisRemind, J. / Geerk, J. / Linker, G. / Meyer, O. / Wang, R.L. / Wolf, Th. et al. | 1992
- 179
-
Use of RBS and Raman spectroscopy to study oxygen mobility in YBaCuO thin films by 18O tracing experimentsWong, J.C.Cheang / Ortega, C. / Siejka, J. / Trimaille, I. / Sacuto, A. / Balkanski, M. / Vizkelethy, G. et al. | 1992
- 184
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Ion beam analysis using alpha particles and protons for compositional determination of niobium superconducting compound filmsRoux, B. / Chevarier, A. / Chevarier, N. / El Bouanani, M. / Gerlic, E. / Stern, M. / Bosland, P. / Guemas, F. et al. | 1992
- 189
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7Li(p, α) 4He, PIXE and RBS/channeling studies of the lattice site location of impurities in LiNbO3 and LiNbO3 co-doped with magnesiumRebouta, L. / da Suva, M.F. / Soares, J.C. / Sanz-García, J.A. / Dieguez, E. / Agulló-López, F. et al. | 1992
- 193
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Analysis of co-sputtered in situ annealed superconducting Y1Ba2Cu3O7 − x thin filmsSaarilahti, J. / Salmi, J. / Likonen, J. / Rauhala, E. et al. | 1992
- 198
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Study of high-temperature superconductors by IBA methodsChamera, D. / Suchańska, M. / Kozel, V.V. et al. | 1992
- 203
-
Radiation damaging behaviour of GaP by MeV ion implantationAscheron, C. / Biersack, J.P. / Goppelt, P. / Bugrov, V.N. / Karamyan, S.A. / Flagmeyer, R. / Zschau, H.-E. / Otto, G. et al. | 1992
- 210
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Annealing studies on ion implanted diamondSpits, R.A. / Derry, T.E. / Prins, J.F. et al. | 1992
- 215
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Microscopic characterization of materials by ion beam and hyperfine interaction analysisSoares, J.C. et al. | 1992
- 221
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Lattice site changes of ion implanted 8Li in InP studied by alpha emission channelingWahl, U. / Hofsäss, H. / Jahn, S.G. / Winter, S. / Recknagel, E. et al. | 1992
- 227
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Hyperfine field and fraction in high field site for implanted 221FrLindroos, M. / Richards, P. / Rikovska, J. / Stone, N.J. / Nishimura, K. / Oliveira, I.S. et al. | 1992
- 232
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Lattice site investigations for Mg in LiNbO3 by combined RBS-PIXE-NRA channeling experimentsKling, A. / Kollewe, D. / Grabmaier, B.C. et al. | 1992
- 237
-
Beam assisted molecular rearrangement observed by TDPAD for fluorine complexes in diamondSideras-Haddad, E. / Connell, S.H. / Sellschop, J.P.F. / Bharuth-Ram, K. / Stemmet, M.C. / Naidoo, S. / Appel, H. et al. | 1992
- 242
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Structure dependence of radiation damage depths after ion implantationFriedland, E. / Fletcher, M. et al. | 1992
- 246
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Ion-channeling investigations of nitrogen in zirconiumHowe, L.M. / Swanson, M.L. et al. | 1992
- 251
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Ion beam damage in epitaxially grown MCT on GaAsRusso, S.P. / Johnston, P.N. / Elliman, R.G. / Dooley, S.P. / Jamieson, D.N. / Pain, G.N. et al. | 1992
- 256
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Unusually large substitutional fraction for Fr implanted in Fe observed by emission channellingLindroos, M. / Haas, H. / De Wachter, J. / Pattyn, H. / Langouche, G. et al. | 1992
- 261
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Channeling in quasicrystalsdu Marchie van Voorthuysen, E.H. / Smulders, P.J.M. / Workman, R.D. / de Boer, J.L. / van Smaalen, S. et al. | 1992
- 267
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Ionization chambers for materials analysis with heavy ion beamsAssmann, W. et al. | 1992
- 272
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Subnanosecond timing with ion-implanted detectorsRijken, H.A. / Klein, S.S. / Jacobs, W. / Teeuwen, L.J.H.G.W. / de Voigt, M.J.A. / Burger, P. et al. | 1992
- 277
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High-speed data processing for three-dimensional analysis by micro-RBSTakai, M. / Katayama, Y. / Kinomura, A. / Lohner, T. / Namba, S. / Ryssel, H. et al. | 1992
- 282
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Development of a special anti-Compton spectrometerMicek, S.L. / Verhoef, B.A.W. / de Voigt, M.J.A. / Bacelar, J.C. / Burger, P. / Verplancke, J. / Vermeulen, P. / Schotanus, P. et al. | 1992
- 287
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Heavy-ion irradiation effects on passivated implanted planar silicon detectorsDe Coster, W. / Brijs, B. / Vandervorst, W. / Burger, P. et al. | 1992
- 292
-
On the use of a gas filled magnetic spectrograph in elastic recoil detectionSandker, G.J. / Eeken, P. / Bik, W.M.Arnold / van der Borg, K. / Habraken, F.H.P.M. et al. | 1992
- 296
-
TOF ERD experiments using a 10 MeV 35Cl beamArai, E. / Funaki, H. / Katayama, M. / Oguri, Y. / Shimizu, K. et al. | 1992
- 301
-
Production and use of heavy ion beams of HMI accelerators for solid state applicationHomeyer, H. et al. | 1992
- 309
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Accelerator terminal voltage stabilityFerry, J.A. / Kolonko, J.J. / Phillips, S.H. / Lunstrum, S.J. et al. | 1992
- 313
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Single event upset imaging with a nuclear muprobeDoyle, B.L. / Horn, K.M. / Walsh, D.S. / Sexton, F.W. et al. | 1992
- 321
-
Accelerator mass spectrometry — fascinating applications and their technical challengesSuter, M. et al. | 1992
- 330
-
Molecular ion stability and populations in tandem accelerator mass spectrometryMatteson, S. / Weathers, D.L. / Kim, Y.D. / Arrale, A.M. / McDaniel, F.D. / Duggan, J.L. / Anthony, J.M. / Douglas, M.A. et al. | 1992
- 336
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A minicyclotron for a scanning proton muprobevan der Heide, J.A. / de Regt, R.J.L.J. / Gudden, W.A.M. / Magendans, P. / Hagedoorn, H.L. / Mutsaers, P.H.A. / Mangnus, A.V.G. / Aendenroomer, A.J.R. / de Folter, L.C. / de Voigt, M.J.A. et al. | 1992
- 342
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Ion beams as high-resolution probes of structure and functionLegge, G.J.F. / Saint, A. / Bench, G. / Laird, J. / Cholewa, M. et al. | 1992
- 349
-
A new microbeam formation systemAgawa, Y. / Ogata, S. / Seki, S. et al. | 1992
- 353
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Hamiltonian description of ion motion in crossed electric and magnetic fields with cylindrical symmetryBotman, J.I.M. / Hagedoorn, H.L. et al. | 1992
- 358
-
Microanalysis of masklessly MeV-ion-implanted area by MeV heavy-ion microprobeYuji, Horino / Yoshiaki, Mokuno / Akiyoshi, Chayahara / Masato, Kiuchi / Kanenaga, Fujii / Mamoru, Satou / Mikio, Takai et al. | 1992
- 362
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mubeam system for study of single event upset of semiconductor devicesKamiya, T. / Utsunomiya, N. / Minehara, E. / Tanaka, R. / Ohdomari, I. et al. | 1992
- 367
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Optical properties of a two-gap buncherKleeven, W.J.G.M. / Gelbart, W. / Sura, J. et al. | 1992
- 371
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The CBNM scanning nuclear muprobe for materials analysisLövestam, N.E.G. / Swietlicki, E. / Wätjen, U. / Breitenbach, L. / Rietveld, P. et al. | 1992
- 375
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Influence of a wick lining on the evaporation rate of lithium from a charge exchange canalThampi, N.S. / Berger, S. / Dworschak, F. et al. | 1992
- 378
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Improvement of beam properties by optimizing ion optics and minimizing beam interactionsVijgen, L.J. / Kruit, P. et al. | 1992
- 383
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Measurement and analysis of thin- and thick-target yield curves of narrow resonances with a high energy resolution ion beamSchulte, W.H. / Ebbing, H. / Becker, H.W. / Wüstenbecker, S. / Berheide, M. / Buschmann, M. / Rolfs, C. / Mitchell, G.E. / Schweitzer, J.S. et al. | 1992
- 388
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Investigation of the D-Pd system interphase boundary behaviour inside the palladium by ERD using monochromatic neutronsSkorodumov, B.G. / Yatsevich, I.O. et al. | 1992
- 395
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Improved depth resolution in CERDA by recoil time of flight measurementRijken, H.A. / Klein, S.S. / de Voigt, M.J.A. et al. | 1992
- 399
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Investigation of oxygen and fluorine distributions using nuclear reaction analysis at the Rossendorf nuclear muprobeGrambole, D. / Herrmann, F. / Klabes, R. et al. | 1992
- 403
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A comparative study of deuterium ingress from solution into Zr, Zircaloy-2 and Zr-2.5wt.% Nb by nuclear reaction analysis at the liquid-solid interfaceForster, J.S. / Tapping, R.L. / Alexander, T.K. / Phillips, D. / Laursen, T. / Leslie, J.R. et al. | 1992
- 408
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Use of simulations of 15N profiling in studying hydrogen segregation at interfacesMarwick, A.D. / Liu, Joyce C. / Zabel, T.H. / Doyle, J.P. et al. | 1992
- 413
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3He induced charged particle reactions for oxygen analysisCohen, David D. / Bailey, G.M. / Dytlewski, N. et al. | 1992
- 417
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Resonance depth profiling of low-Z elements with target biasing applied to the 3.045 MeV 16O(α, α)16O resonanceDe Coster, W. / Brijs, B. / Goemans, J. / Vandervorst, W. et al. | 1992
- 422
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High resolution depth profiling of light elementsDollinger, G. / Faestermann, T. / Maier-Komor, P. et al. | 1992
- 428
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On the development of a WDX-PIXE measurement system and its applicationShigeki, Hayashi / Junichi, Taniguchi / Akira, Teramoto / Isao, Kato / Ikuo, Konishi / Shinji, Nagamachi / Masatoshi, Asari / Hiroyoshi, Soezima et al. | 1992
- 434
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Depth profiling of deuterium in a beryllium/carbon layerHughes, I.G. / Behrisch, R. / Martinelli, A.P. et al. | 1992
- 439
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Measurement of accumulated contaminants in glassy carbon by RBS, ERD and NRAIla, D. / Jenkins, G.M. / Holland, L.R. / Thompson, J. / Evelyn, L. / Hodges, A. / Zimmerman, R.L. / Dalins, I. et al. | 1992
- 443
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Study of high-fluence titanium implantation into AISI M2 steel by 48Ti isotopic tracingEl Khakani, M.A. / Moncoffre, N. / Marest, G. / Tousset, J. et al. | 1992
- 448
-
The ion beam analysis of laser-irradiated borosilicate glassLane, D.W. et al. | 1992
- 452
-
Quantification of the separate matrix constituents of spheroidal graphite cast iron implanted with 15N by nuclear reaction analysis using an ion muprobeMatthews, A.P. / Jeynes, C. / Reeson, K.J. / Thornton, J. / Spyrou, N.M. et al. | 1992
- 457
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Cross sections for 170.5° backscattering of 4He by the isotopes of boron for 4He energies between 1.0 and 3.3 MeVMcIntyre, L.C. Jr. / Leavitt, J.A. / Ashbaugh, M.D. / Lin, Z. / Stoner, J.O. Jr. et al. | 1992
- 461
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Study of carbon and oxygen incorporation in reactively sputtered Cr-Si-Al films using ERDANeelmeijer, C. / Grötzschel, R. / Klabes, R. / Kreissig, U. / Sobe, G. et al. | 1992
- 465
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The application of charged particle spectrometry to 3He activation analysis of light elementsPillay, A.E. / Peisach, M. et al. | 1992
- 469
-
Absolute cross section for hydrogen forward scatteringBaglin, J.E.E. / Kellock, A.J. / Crockett, M.A. / Shih, A.H. et al. | 1992
- 475
-
Hafnium diffusion in Zircaloy-2 and Zr-2.5 wt.% Nb: A Rutherford backscattering studyLaursen, T. / Hood, G.M. / Belec, R. / Palmer, G.R. / Schultz, R.J. / Whitton, J.L. et al. | 1992
- 481
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Ion beam analysis of gold jewelryDemortier, Guy et al. | 1992
- 488
-
Usewear characterisation of prehistoric flints with IBAChristensen, M. / Walter, Ph. / Menu, M. et al. | 1992
- 494
-
Dating of archaeological flints by fluorine depth profiling: new insights into the mechanism of fluorine uptakeWalter, Ph. / Menu, M. / Dran, J.-C. et al. | 1992
- 499
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Recent applications of PIXE spectrometry in archaeology I. Characterization of bronzes with special consideration of the influence of corrosion processes on data reliabilitySwann, C.P. / Fleming, S.J. / Jaksic, M. et al. | 1992
- 505
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Applications of scanning transmission ion microscopyBreese, M.B.H. / Landsberg, J.P. / King, P.J.C. / Grime, G.W. / Watt, F. et al. | 1992
- 512
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Application of FTIR, PIXE, and EBS for trace element analysis in biological samplesKwiatek, W.M. / Lekki, J. / Paluszkiewicz, C. / Preikschas, N. et al. | 1992
- 517
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External PIXE and mu-PIXE measurements of elemental concentrations in volcanic rocksSanto, A.P. / Peccerillo, A. / Del Carmine, P. / Lucarelli, F. / MacArthur, J.D. / Mando, P.A. et al. | 1992
- 523
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Ion beam investigation of issues relevant to the migration of heavy elements in the geosphereDran, J.-C. / Chaumont, J. / Della Mea, G. / Moulin, V. / Petit, J.-C. / Rigato, V. et al. | 1992
- 528
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Recent applications of PIXE spectrometry in archaeology II. Characterization of Chinese pottery exported to the Islamic worldFleming, S.J. / Swann, C.P. et al. | 1992
- 538
-
Determination by PIXE of the elemental distribution in a lakeRespaldiza, Miguel A. / García-Tenorio, Rafael / El-Daoushy, Farid et al. | 1992
- 542
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Application of ion beam analysis (RBS and ERD) to the surface chemistry study of leached mineralsArnold, G.W. / Westrich, H.R. / Casey, W.H. et al. | 1992
- 547
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Prehistoric cave painting PIXE analysis for the identification of paint “pots”Menu, Michel / Walter, Philippe et al. | 1992
- 553
-
Ion beam analysis of the bone tissue of Alzheimer's disease patientsRobertson, J.D. / Samudralwar, D.L. / Markesbery, W.R. et al. | 1992
- 559
-
Surface and adsorbate structural analysis from time-of-flight scattering and recoiling spectrometry (TOF-SARS)Rabalais, J.W. / Bu, H. / Roux, C. et al. | 1992
- 566
-
Surface reconstructions of the Sn/Si(111) system investigated by ion-scattering spectrometry and scanning tunneling microscopyWorthington, M.S. / Stevens, J.L. / Chang, C.S. / Tsong, I.S.T. et al. | 1992
- 572
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The calculation of ion fractions in LEISVerbist, G. / Brongersma, H.H. / Devreese, J.T. et al. | 1992
- 576
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Medium energy ion scattering using a toroidal analyzer combined with a microbeam lineKinomura, A. / Takai, M. / Matsumoto, K. / Namba, S. / Agawa, Y. et al. | 1992
- 580
-
Electronic processes in slow ion-metal surface collisionsEeken, P. / Kotte, A. / Niehaus, A. / Urazgil'din, I. et al. | 1992
- 584
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Static low-energy ion scatteringBergmans, R.H. / Huppertz, W.J. / van Welzenis, R.G. / Brongersma, H.H. et al. | 1992
- 588
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Position analysis of light adsorbates by recoil detection: H on Ru(001)Schulz, J. / Taglauer, E. / Feulner, P. / Menzel, D. et al. | 1992
- 593
-
Diffusion of cesium in sodium borosilicate glasses for nuclear waste immobilisation, studied by low-energy ion scatteringvan Kessel, O. / Brongersma, H.H. / Hölscher, J.G.A. / van Welzenis, R.G. / Sengers, E.G.F. / Janssen, F.J.J.G. et al. | 1992
- 596
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Ion scattering analysis of alumina supported model catalystsJosek, K. / Linsmeier, Ch. / Knözinger, H. / Taglaucr, E. et al. | 1992
- 603
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Influence of the ion beam induced desorption on the quantitative depth profiling of hydrogen in a variety of materialsRoss, G.G. / Richard, I. et al. | 1992
- 609
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An investigation of the Cs bombardment induced altered layer in Si by MEIS, RBS, SIMS and IMPETUS simulationValizadeh, R. / van den Berg, J.A. / Badheka, R. / Al Bayati, A. / Armour, D.G. / Sykes, D. et al. | 1992
- 614
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Increased sensitivity of SIMS in indium phosphide by detecting PxM− molecular ions under cesium bombardmentGauneau, M. / Chaplain, R. / Rupert, A. / Salvi, M. / Descouts, B. et al. | 1992
- 621
-
Basic requirements for quantitative SIMS analysis using cesium bombardment and detection of MCs+ secondary ionsWittmaack, K. et al. | 1992
- 626
-
Oxygen bleed-in during SIMS depth profiling: curse or blessing?Zalm, P.C. / Vriezema, C.J. et al. | 1992
- 632
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A quantitative study of copper segregation in silicon under oxygen ion beam bombardment using SIMSKilner, J.A. / McPhail, D.S. / Littlewood, S.D. et al. | 1992
- 636
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Depth resolution in SIMS study of a Fe-Ti multilayer structureDupuy, J.C. / Dubois, C. / Prudon, G. / Brenier, R. / Thevenard, P. et al. | 1992
- 641
-
O2+ and Xe+ depth profiling of 150 keV Cs+ implantation in Si and SiO2 by SIMSBhan, M.K. / Kilner, J.A. et al. | 1992
- 646
-
Hydrogen analysis by secondary ion mass spectrometry using HCs+ ionsGnaser, H. / Oechsner, H. et al. | 1992
- 650
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ONO structures investigated by SIMS, RBS, and NRAIberl, Franz / Ramm, Peter / Lang, Walter et al. | 1992
- 654
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Shallow depth profiles of arsenic and boron in CoSi2 measured by secondary ion mass spectrometryMohadjeri, B. / Svensson, B.G. et al. | 1992
- 659
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Core ionization and ion ejection during SIMS analysisPetravic, M. / Williams, J.S. et al. | 1992
- 663
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Computer controlled ion beam energy scanning and data acquisition system and investigations of the Lewis effectWüstenbecker, S. / Schulte, W.H. / Ebbing, H. / Becker, H.W. / Berheide, M. / Buschmann, M. / Rolfs, C. / Mitchell, G.E. / Schweitzer, J.S. et al. | 1992
- 668
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Range parameters study of Pb and Au implanted into SiC filmsFichtner, P.F.P. / Behar, M. / Fink, D. / Goppelt, P. / Grande, P.L. et al. | 1992
- 672
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Large energy loss straggling of protons and He ions in Mylar foilsCohen, David D. / Rose, Edith K. et al. | 1992
- 678
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Status of the calculation of the energy loss of swift ions in moleculesSabin, John R. / Oddershede, Jens et al. | 1992
- 684
-
Ion-beam induced plastic deformation in amorphous materials investigated by marker implantation and RBSBenyagoub, A. / Klaumünzer, S. / Thomé, L. / Dran, J.C. / Garrido, F. / Dunlop, A. et al. | 1992
- 687
-
A grouping strategy for autoconvolution summation in the stochastic theory for energy straggling and narrow resonance excitation curve calculationsVickridge, Ian / Amsel, Georges et al. | 1992
- 693
-
Energy loss straggling of MeV ions in thin solid filmsBriere, M.A. / Biersack, J.P. et al. | 1992
- 701
-
Simulation analysis of ion channeling spectra: thermal vibrational amplitude in SiDygo, A. / Smulders, P.J.M. / Boerma, D.O. et al. | 1992
- 706
-
Computer simulation of ion implantation into crystalline targetsPosselt, M. / Biersack, J.P. et al. | 1992
- 711
-
The width of an RBS spectrum: influence of plural and multiple scatteringBauer, P. / Steinbauer, E. / Biersack, J.P. et al. | 1992
- 716
-
A new Monte Carlo model for the calculation of MEIS energy spectraAlkemade, P.F.A. / Turkenburg, W.C. / Vrijmoeth, J. et al. | 1992
- 721
-
Analysis of defects in weakly damaged GaAs by Monte Carlo channeling simulationDygo, A. / Kaczanowski, J. / Turos, A. / Wesch, W. / Gärtner, K. / Götz, G. et al. | 1992
- 724
-
Calculation of ion mixing and energy deposition using a modified version of TRIMKing, B.V. / Webb, R.P. et al. | 1992
- 730
-
Rational function approximation of the collision integralsSeverijns, C.A. / Verbist, G. / Brongersma, H.H. / Devreese, J.T. et al. | 1992
- 734
-
Interactive personal-computer data analysis of ion backscattering spectraSaarilahti, J. / Rauhala, E. et al. | 1992
- 739
-
Ion beam analysis of interface reactionsKuiper, A.E.T. / Habraken, F.H.P.M. et al. | 1992
- 744
-
NRA and XPS characterizations of layers formed by rapid thermal nitridation of thin SiO2 filmsGanem, J-J. / Rigo, S. / Trimaille, I. / Lu, G-N. / Dufour, G. / Roulet, H. et al. | 1992
- 750
-
SIMS, RBS, ion channelling, and TEM studies of the low energy SIMOX structuresLi, Y. / Kilner, J.A. / Hemment, P.L.F. / Robinson, A.K. / Zhang, J.P. / Reeson, K.J. / Marsh, C.D. / Booker, G.R. et al. | 1992
- 756
-
NRA and RBS analyses of silicon, aluminium and iron nitride thin filmsStedile, F.C. / Hübler, R. / Baumvol, I.J.R. / Schreiner, W.H. / Freire, F.L. Jr. et al. | 1992
- 760
-
Investigations of carbon implanted siliconFröse, D. / Kollewe, D. / von Münch, W. et al. | 1992
- 765
-
Nuclear reaction analyses of boron nitride films deposited by ion beam based techniquesBouchier, D. / Bosseboeuf, A. et al. | 1992
- 770
-
Lateral growth of cobalt suicide observed by an MeV helium ion microprobeKinomura, A. / Takai, M. / Namba, S. / Ryssel, H. / Tsien, P.H. / Burte, E. / Satou, M. / Chayahara, A. et al. | 1992
- 774
-
Proton resonant scattering for oxygen stoichiometry of reactively evaporated ZrO2−x filmsCaridi, A. / Cereda, E. / Fazinic, S. / Jaksic, M. / Marcazzan, G.M.Braga / Scagliotti, M. / Valkovic, V. et al. | 1992
- 778
-
Deuteron beam analysis of rapid thermal nitridation of silicon and thin SiO2 filmsGanem, J-J. / Rigo, S. / Trimaille, I. / Lu, G-N. / Molle, P. et al. | 1992
- 784
-
NRA characterization of pretreatment operations of siliconGanem, J-J. / Rigo, S. / Trimaille, I. / Lu, G-N. et al. | 1992
- 789
-
Depth profiling of hydrogen using the high efficiency ERD-TOF techniqueGujrathi, S.C. / Bultena, S. et al. | 1992
- 796
-
Surface sensitivity of RBS with nitrogen ionsWalter, Lang / Jens, Weidhaas et al. | 1992
- 800
-
A study of carbon thin films by ion beamsNoriaki, Matsunami et al. | 1992
- 803
-
RBS analyses of magnetic thin film multilayers and phasesPereira, L.G. / Teixeira, S.R. / Schreiner, W.H. / Baumvol, I.J.R. et al. | 1992
- 807
-
Laser induced interface reactions in Sb/Ge multilayer thin films: a study by RBS and CS-TEMSerna, R. / Afonso, C.N. / Catalina, F. / Petford-Long, A.K. / Teixeira, N. / da Silva, M.F. / Soares, J.C. et al. | 1992
- 811
-
High pulse rate and pileup handling in precision RBSAmsel, G. / Girard, E. / Vizkelethy, G. / Battistig, G. / Girard, Y. / Szilágyi, E. et al. | 1992
- 817
-
A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution Rutherford backscattering with MeV ionsEnders, Th. / Rilli, M. / Carstanjen, H.D. et al. | 1992
- 825
-
Various advanced capabilities of the RBS setup at IMECBrijs, B. / De Coster, W. / Vandervorst, W. et al. | 1992
- 832
-
On the use of a d E-E telescope in elastic recoil detectionBik, W.M.Arnold / de Laat, C.T.A.M. / Habraken, F.H.P.M. et al. | 1992
- 836
-
The design and use of a computer package for the control of a precision goniometer during channellingDiskett, D.J. / Avery, A.J. / Marshall, R.E.T. et al. | 1992
- 840
-
Angle-resolved imaging of single-crystal materials with MeV helium ionsStrathman, M.D. / Baumann, S. et al. | 1992
- 846
-
PAC studies of ion beam induced mixing and phase formation in NiAl multilayersWeber, Thomas / Lieb, Klaus-Peter et al. | 1992
- 853
-
Author index| 1992
- ii
-
Editorial Board| 1992
- vii
-
PrefaceBrongersma, H.H. / de Voigt, M.J.A. et al. | 1992