Low-voltage triggering SCRs for ESD protection in a 0.35μm SiGe BiCMOS process (Englisch)
- Neue Suche nach: JiZhi, Liu
- Neue Suche nach: Yaohui, Zeng
- Neue Suche nach: Zhiwei, Liu
- Neue Suche nach: Jianming, Zhao
- Neue Suche nach: Hui, Cheng
- Neue Suche nach: Nie, Liu
- Neue Suche nach: JiZhi, Liu
- Neue Suche nach: Yaohui, Zeng
- Neue Suche nach: Zhiwei, Liu
- Neue Suche nach: Jianming, Zhao
- Neue Suche nach: Hui, Cheng
- Neue Suche nach: Nie, Liu
In:
Microelectronics and Reliability
;
73
;
122-128
;
2017
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Low-voltage triggering SCRs for ESD protection in a 0.35μm SiGe BiCMOS process
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Beteiligte:JiZhi, Liu ( Autor:in ) / Yaohui, Zeng ( Autor:in ) / Zhiwei, Liu ( Autor:in ) / Jianming, Zhao ( Autor:in ) / Hui, Cheng ( Autor:in ) / Nie, Liu ( Autor:in )
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Erschienen in:Microelectronics and Reliability ; 73 ; 122-128
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Verlag:
- Neue Suche nach: Elsevier Ltd
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Erscheinungsdatum:23.04.2017
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Format / Umfang:7 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 73
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