Cross-sectional Scanning Probe Microscopy of GaN-based p–n heterostructures (Englisch)
- Neue Suche nach: da Silva, M.I.N.
- Neue Suche nach: González, J.C.
- Neue Suche nach: Russell, P.E.
- Neue Suche nach: da Silva, M.I.N.
- Neue Suche nach: González, J.C.
- Neue Suche nach: Russell, P.E.
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Cross-sectional Scanning Probe Microscopy of GaN-based p–n heterostructures
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Beteiligte:
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Verlag:
- Neue Suche nach: Elsevier Science Ltd
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Erscheinungsdatum:01.01.2003
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Format / Umfang:3 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 34, Ausgabe 5-8
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- IFC
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Editorial Board| 2003