Characterising Arrhenius moisture diffusivity constants using non-isothermal sorption (Englisch)
- Neue Suche nach: Wong, E.H.
- Weitere Informationen zu Wong, E.H.:
- https://orcid.org/0000-0001-6927-0947
- Neue Suche nach: Cook, J.
- Neue Suche nach: Dreno, M.
- Neue Suche nach: Chen, Dao-Long
- Neue Suche nach: Lai, Yi-Shao
- Neue Suche nach: Wong, E.H.
- Neue Suche nach: Cook, J.
- Neue Suche nach: Dreno, M.
- Neue Suche nach: Chen, Dao-Long
- Neue Suche nach: Lai, Yi-Shao
In:
Microelectronics and Reliability
;
55
, 11
;
2331-2335
;
2015
-
ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Characterising Arrhenius moisture diffusivity constants using non-isothermal sorption
-
Beteiligte:Wong, E.H. ( Autor:in ) / Cook, J. ( Autor:in ) / Dreno, M. ( Autor:in ) / Chen, Dao-Long ( Autor:in ) / Lai, Yi-Shao ( Autor:in )
-
Erschienen in:Microelectronics and Reliability ; 55, 11 ; 2331-2335
-
Verlag:
- Neue Suche nach: Elsevier Ltd
-
Erscheinungsdatum:14.06.2015
-
Format / Umfang:5 pages
-
ISSN:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Elektronische Ressource
-
Sprache:Englisch
-
Schlagwörter:
-
Datenquelle:
Inhaltsverzeichnis – Band 55, Ausgabe 11
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 2173
-
EditorialLiou, Juin J. / Lin, Chun-Chieh / Lin, Chu-Hsuan et al. | 2015
- 2174
-
The effect of various concentrations of PVDF-HFP polymer gel electrolyte for dye-sensitized solar cellChou, Hsueh-Tao / Hsu, Ho-Chun / Lien, Chiu-Hui / Chen, Shi-Ting et al. | 2015
- 2178
-
Improved reliability of large-sized a-Si thin-film-transistor by back channel treatment in H2Lee, Hao-Chieh / Chang-Liao, Kuei-Shu / Li, Yan-Lin et al. | 2015
- 2183
-
Gate leakage current suppression and reliability improvement for ultra-low EOT Ge MOS devices by suitable HfAlO/HfON thickness and sintering temperatureChi, Wei-Fong / Chang-Liao, Kuei-Shu / Yi, Shih-Han / Li, Chen-Chien / Li, Yan-Lin et al. | 2015
- 2188
-
Improving retention properties by thermal imidization for polyimide-based nonvolatile resistive random access memoriesHsiao, Yu-Ping / Yang, Wen-Luh / Lin, Li-Min / Chin, Fun-Tat / Lin, Yu-Hsien / Yang, Ke-Luen / Wu, Chi-Chang et al. | 2015
- 2198
-
Leakage current mechanism and effect of Y2O3 doped with Zr high-K gate dielectricsLin, K.C. / Juan, P.C. / Liu, C.H. / Wang, M.C. / Chou, C.H. et al. | 2015
- 2203
-
Heat stress exposing performance of deep-nano HK/MG nMOSFETs using DPN or PDA treatmentWang, Shea-Jue / Wang, Mu-Chun / Chen, Shuang-Yuan / Lan, Wen-How / Yang, Bor-Wen / Huang, L.S. / Liu, Chuan-Hsi et al. | 2015
- 2208
-
Fabrication of TiO2 compact layer precursor at various reaction times for dye sensitized solar cellsChou, Hsueh-Tao / Lin, Ke-Ming / Hsu, Ho-Chun et al. | 2015
- 2213
-
Induced thermo-mechanical reliability of copper-filled TSV interposer by transient selective annealing technologyLee, Chang-Chun / Huang, Chien-Chao et al. | 2015
- 2220
-
Crossbar array of selector-less TaOx/TiO2 bilayer RRAMChou, Chun-Tse / Hudec, Boris / Hsu, Chung-Wei / Lai, Wei-Li / Chang, Chih-Cheng / Hou, Tuo-Hung et al. | 2015
- 2224
-
Study of radiation hardness of HfO2-based resistive switching memory at nanoscale by conductive atomic force microscopyLin, Shih-Hung / Wu, You-Lin / Hwang, Yu-Huei / Lin, Jing-Jenn et al. | 2015
- 2229
-
Investigation on SCR-based ESD protection device for biomedical integrated circuits in a 0.18-μm CMOS processLin, Chun-Yu / Chiu, Yan-Lian et al. | 2015
- 2236
-
Design and characterization of ESD solutions with EMC robustness for automotive applicationsXi, Yunfeng / Salcedo, Javier A. / Zhou, Yuanzhong / Liou, Juin J. / Hajjar, Jean-Jacques et al. | 2015
- 2247
-
Increasing the cycle life of lithium ion cells by partial state of charge cyclingde Vries, Hans / Nguyen, Thanh Trung / Op het Veld, Bert et al. | 2015
- 2254
-
Ultra sensitive measurement of dielectric current under pulsed stress conditionsHelfmeier, Clemens / Beyreuther, Anne / Fox, Alexander / Boit, Christian et al. | 2015
- 2258
-
Identification of an RF degradation mechanism in GaN based HEMTs triggered by midgap trapsSasikumar, A. / Arehart, A.R. / Via, G.D. / Winningham, B. / Poling, B. / Heller, E. / Ringel, S.A. et al. | 2015
- 2263
-
Process optimization of RTA on the characteristics of ITO-coated GaN-based LEDsHao, H.L. / Wu, L.K. / Chung, W.J. / Zhang, Y. / Shen, W.Z. et al. | 2015
- 2269
-
Research on lumen depreciation related to LED packages by in-situ measurement methodQuan, Chen / Xiaobing, Luo / Qi, Chen / Kai, Wang / Sheng, Liu / Jingyan, Li et al. | 2015
- 2276
-
20GHz on-chip measurement of ESD waveform for system level analysisCaignet, F. / Nolhier, N. / Bafleur, M. / Wang, A. / Mauran, N. et al. | 2014
- 2284
-
Design optimization of RF-MEMS switch considering thermally induced residual stress and process uncertaintiesSaleem, Muhammad Mubasher / Somà, Aurelio et al. | 2015
- 2299
-
Zinc oxide-praseodymia semiconducting varistors having a powerful surge suppression capabilityNahm, Choon-W. et al. | 2015
- 2306
-
Microstructural evaluation and failure analysis of Ag wire bonded to Al padsChoi, Mi-Ri / Kim, Hyung-Giun / Lee, Taeg-Woo / Jeon, Young-Jun / Ahn, Yong-Keun / Koo, Kyo-Wang / Jang, You-Cheol / Park, So-Yeon / Yee, Jae-Hak / Cho, Nam-Kwon et al. | 2015
- 2316
-
Cu–Al intermetallic compound investigation using ex-situ post annealing and in-situ annealingTan, Y.Y. / Yang, Q.L. / Sim, K.S. / Sun, Li Tao / Wu, Xing et al. | 2015
- 2324
-
Reliability investigations on LIFT-printed isotropic conductive adhesive joints for system-in-foil applicationsSridhar, Ashok / Perinchery, Sandeep M. / Smits, Edsger C.P. / Mandamparambil, Rajesh / van den Brand, Jeroen et al. | 2015
- 2331
-
Characterising Arrhenius moisture diffusivity constants using non-isothermal sorptionWong, E.H. / Cook, J. / Dreno, M. / Chen, Dao-Long / Lai, Yi-Shao et al. | 2015
- 2336
-
Time-domain viscoelastic constitutive model based on concurrent fitting of frequency-domain characteristicsChiu, Tz-Cheng / Lee, Bo-Sheng / Huang, Dong-Yi / Yang, Yu-Ting / Tseng, Yi-Hsiu et al. | 2015
- 2345
-
In situ fixture for multi-modal characterization during electromigration and thermal testing of wire-like microscale specimensMertens, James C.E. / Kirubanandham, Antony / Chawla, Nikhilesh et al. | 2015
- 2354
-
Impact of laminate cracks under solder pads on the fatigue lives of ball grid array solder jointsTegehall, Per-Erik / Wetter, Göran et al. | 2015
- 2371
-
A time dependent damage indicator model for Sn3.5Ag solder layer in power electronic moduleRajaguru, Pushparajah / Lu, Hua / Bailey, Chris et al. | 2015
- 2382
-
Adhesion energy of printed circuit board materials using four-point-bending validated with finite element simulationsSchöngrundner, R. / Cordill, M.J. / Maier, G.A. / Gänser, H.-P. et al. | 2015
- 2391
-
Effect of elevated temperature on PCB responses and solder interconnect reliability under vibration loadingZhang, H.W. / Liu, Y. / Wang, J. / Sun, F.L. et al. | 2015
- 2396
-
Coupling effects of mechanical vibrations and thermal cycling on reliability of CCGA solder jointsDing, Ying / Tian, Ruyu / Wang, Xiuli / Hang, Chunjin / Yu, Fang / Zhou, Ling / Meng, Xiangang / Tian, Yanhong et al. | 2015
- 2403
-
Microstructure and morphology of interfacial intermetallic compound CoSn3 in Sn–Pb/Co–P solder jointsYang, Guoshuai / Yang, Donghua / Li, Liangliang et al. | 2015
- 2412
-
Adaptive reliability satisfaction in wireless sensor networks through controlling the number of active routing pathsAlirezaeyan, Javad / Yousefi, Saleh / Doniavi, Ali et al. | 2015
- 2423
-
Cross-layer custom instruction selection to address PVTA variations and soft errorFarahani, Bahar / Safari, Saeed et al. | 2015
- 2439
-
Design space exploration of non-uniform cache access for soft-error vulnerability mitigationMaghsoudloo, Mohammad / Zarandi, Hamid R. et al. | 2015
- 2453
-
On endurance and performance of erasure codes in SSD-based storage systemsAlinezhad Chamazcoti, Saeideh / Delavari, Ziba / Miremadi, Seyed Ghassem / Asadi, Hossein et al. | 2015
- 2468
-
Probabilistic analysis of dynamic and temporal fault trees using accurate stochastic logic gatesCheshmikhani, Elham / Zarandi, Hamid R. et al. | 2015
- 2481
-
Book ReviewGan, Chong Leong / Hashim, Uda et al. | 2015
- IFC
-
Editorial Board| 2015