Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests (Englisch)
- Neue Suche nach: Shukla, Abhay
- Neue Suche nach: Martin, Robert
- Neue Suche nach: Probst, Roman
- Neue Suche nach: Song, Jian
- Neue Suche nach: Shukla, Abhay
- Neue Suche nach: Martin, Robert
- Neue Suche nach: Probst, Roman
- Neue Suche nach: Song, Jian
In:
Microelectronics and Reliability
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150
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2023
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Comparison of different statistical methods for prediction of lifetime of electrical connectors with short term tests
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Beteiligte:Shukla, Abhay ( Autor:in ) / Martin, Robert ( Autor:in ) / Probst, Roman ( Autor:in ) / Song, Jian ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: Elsevier Ltd
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Erscheinungsdatum:23.08.2023
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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