Raman scattering and X-ray diffraction study in Cu2GeSe3 (Englisch)
- Neue Suche nach: Marcano, G.
- Neue Suche nach: Rincón, C.
- Neue Suche nach: Marín, G.
- Neue Suche nach: Delgado, G.E.
- Neue Suche nach: Mora, A.J.
- Neue Suche nach: Herrera-Pérez, J.L.
- Neue Suche nach: Mendoza-Alvarez, J.G.
- Neue Suche nach: Rodríguez, P.
- Neue Suche nach: Marcano, G.
- Neue Suche nach: Rincón, C.
- Neue Suche nach: Marín, G.
- Neue Suche nach: Delgado, G.E.
- Neue Suche nach: Mora, A.J.
- Neue Suche nach: Herrera-Pérez, J.L.
- Neue Suche nach: Mendoza-Alvarez, J.G.
- Neue Suche nach: Rodríguez, P.
In:
Solid State Communications
;
146
, 1-2
;
65-68
;
2008
-
ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Raman scattering and X-ray diffraction study in Cu2GeSe3
-
Beteiligte:Marcano, G. ( Autor:in ) / Rincón, C. ( Autor:in ) / Marín, G. ( Autor:in ) / Delgado, G.E. ( Autor:in ) / Mora, A.J. ( Autor:in ) / Herrera-Pérez, J.L. ( Autor:in ) / Mendoza-Alvarez, J.G. ( Autor:in ) / Rodríguez, P. ( Autor:in )
-
Erschienen in:Solid State Communications ; 146, 1-2 ; 65-68
-
Verlag:
- Neue Suche nach: Elsevier Ltd
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Erscheinungsdatum:17.01.2008
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Format / Umfang:4 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 146, Ausgabe 1-2
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Board of Editors| 2008
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Subject Fields of Editors| 2008