Analyzing defect inflow distribution and applying Bayesian inference method for software defect prediction in large software projects (Englisch)
- Neue Suche nach: Rana, Rakesh
- Weitere Informationen zu Rana, Rakesh:
- https://orcid.org/0000-0002-0819-2516
- Neue Suche nach: Staron, Miroslaw
- Weitere Informationen zu Staron, Miroslaw:
- https://orcid.org/0000-0002-9052-0864
- Neue Suche nach: Berger, Christian
- Neue Suche nach: Hansson, Jörgen
- Neue Suche nach: Nilsson, Martin
- Neue Suche nach: Meding, Wilhelm
- Neue Suche nach: Rana, Rakesh
- Neue Suche nach: Staron, Miroslaw
- Neue Suche nach: Berger, Christian
- Neue Suche nach: Hansson, Jörgen
- Neue Suche nach: Nilsson, Martin
- Neue Suche nach: Meding, Wilhelm
In:
Journal of Systems and Software
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117
;
229-244
;
2016
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Analyzing defect inflow distribution and applying Bayesian inference method for software defect prediction in large software projects
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Beteiligte:Rana, Rakesh ( Autor:in ) / Staron, Miroslaw ( Autor:in ) / Berger, Christian ( Autor:in ) / Hansson, Jörgen ( Autor:in ) / Nilsson, Martin ( Autor:in ) / Meding, Wilhelm ( Autor:in )
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Erschienen in:Journal of Systems and Software ; 117 ; 229-244
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Verlag:
- Neue Suche nach: Elsevier Inc.
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Erscheinungsdatum:12.02.2016
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Format / Umfang:16 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 117
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