Characterization of thin-film adhesion with the scanning acoustic microscope (Englisch)
Addison, R.C. Jr.; Somekh, M.; Rowe, J.M.; Briggs, G.A.D. An International Symposium on Pattern Recognition and Acoustical Imaging, Newport Beach, California (United States), 4–6 Feb. 1987. pp. 275–284. Proceedings of the SPIE — The International Society for Optical Engineering, Vol. 768 (1987)
In:
NDT International
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23
, 1
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44-45
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1990
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Characterization of thin-film adhesion with the scanning acoustic microscope
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Untertitel:Addison, R.C. Jr.; Somekh, M.; Rowe, J.M.; Briggs, G.A.D. An International Symposium on Pattern Recognition and Acoustical Imaging, Newport Beach, California (United States), 4–6 Feb. 1987. pp. 275–284. Proceedings of the SPIE — The International Society for Optical Engineering, Vol. 768 (1987)
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Erschienen in:NDT International ; 23, 1 ; 44-45
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Verlag:
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Erscheinungsdatum:01.01.1990
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Format / Umfang:2 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 23, Ausgabe 1
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