Nanostructure characterization in single and multi layer yttria stabilized zirconia films using XPS, SEM, EDS and AFM (Englisch)
- Neue Suche nach: Espitia-Cabrera, I.
- Neue Suche nach: Orozco-Hernández, H.D.
- Neue Suche nach: Bartolo-Pérez, P.
- Neue Suche nach: Contreras-García, M.E.
- Neue Suche nach: Espitia-Cabrera, I.
- Neue Suche nach: Orozco-Hernández, H.D.
- Neue Suche nach: Bartolo-Pérez, P.
- Neue Suche nach: Contreras-García, M.E.
In:
Surface and Coatings Technology
;
203
, 3-4
;
211-216
;
2008
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Nanostructure characterization in single and multi layer yttria stabilized zirconia films using XPS, SEM, EDS and AFM
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Beteiligte:Espitia-Cabrera, I. ( Autor:in ) / Orozco-Hernández, H.D. ( Autor:in ) / Bartolo-Pérez, P. ( Autor:in ) / Contreras-García, M.E. ( Autor:in )
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Erschienen in:Surface and Coatings Technology ; 203, 3-4 ; 211-216
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Verlag:
- Neue Suche nach: Elsevier B.V.
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Erscheinungsdatum:14.08.2008
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Format / Umfang:6 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 203, Ausgabe 3-4
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Editorial Board| 2008