Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometry (Englisch)
- Neue Suche nach: Morita, Yoshihiro
- Neue Suche nach: Owari, Masanori
- Neue Suche nach: Morita, Yoshihiro
- Neue Suche nach: Owari, Masanori
In:
Applied Surface Science
;
255
, 4
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1052-1054
;
2008
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometry
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Beteiligte:Morita, Yoshihiro ( Autor:in ) / Owari, Masanori ( Autor:in )
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Erschienen in:Applied Surface Science ; 255, 4 ; 1052-1054
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Verlag:
- Neue Suche nach: Elsevier B.V.
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Erscheinungsdatum:01.01.2008
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Format / Umfang:3 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 255, Ausgabe 4
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- 803
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PrefaceKudo, Masahiro / Oiwa, Retsu / Yurimoto, Hisayashi et al. | 2008
- 805
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Semiconductor profiling with sub-nm resolution: Challenges and solutionsVandervorst, W. et al. | 2008
- 813
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Predicting secondary ion formation in molecular dynamics simulations of sputteringWeidtmann, B. / Duvenbeck, A. / Wucher, A. et al. | 2008
- 816
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Fundamental studies of molecular depth profiling and 3D imaging using Langmuir–Blodgett films as a modelZheng, Leiliang / Wucher, Andreas / Winograd, Nicholas et al. | 2008
- 819
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C60 sputtering of organics: A study using TOF-SIMS, XPS and nanoindentationFisher, Gregory L. / Dickinson, Michelle / Bryan, Scott R. / Moulder, John et al. | 2008
- 824
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Molecular ion yield enhancement induced by gold deposition in static secondary ion mass spectrometryWehbe, Nimer / Delcorte, Arnaud / Heile, Andreas / Arlinghaus, Heinrich F. / Bertrand, Patrick et al. | 2008
- 828
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Trench formation and lateral damage induced by gallium milling of siliconRusso, Michael F. Jr. / Maazouz, Mostafa / Giannuzzi, Lucille A. / Chandler, Clive / Utlaut, M. / Garrison, Barbara J. et al. | 2008
- 831
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Molecular depth profiling and imaging using cluster ion beams with femtosecond laser postionizationWillingham, D. / Kucher, A. / Winograd, N. et al. | 2008
- 834
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State selective detection of sputtered Al neutrals by resonant laser ionization SNMSHayashi, S. / Kubota, N. et al. | 2008
- 837
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Simulations of C60 bombardment of Si, SiC, diamond and graphiteKrantzman, Kristin D. / Webb, Roger P. / Garrison, Barbara J. et al. | 2008
- 841
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Molecular dynamics simulations of sputtering of organic overlayers by slow, large clustersRzeznik, L. / Czerwinski, B. / Garrison, B.J. / Winograd, N. / Postawa, Z. et al. | 2008
- 844
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Angle of incidence effects in a molecular solidRyan, Kathleen E. / Smiley, Edward J. / Winograd, Nicholas / Garrison, Barbara J. et al. | 2008
- 847
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Dynamic SIMS ion microscopy imaging of individual bacterial cells for studies of isotopically labeled moleculesChandra, Subhash / Pumphrey, Graham / Abraham, Joshua M. / Madsen, Eugene L. et al. | 2008
- 852
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G-SIMS and SMILES: Simulated fragmentation pathways for identification of complex molecules, amino acids and peptidesGreen, F.M. / Gilmore, I.S. / Seah, M.P. et al. | 2008
- 856
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Fragment distribution of thermal decomposition for PS and PET with QMD calculations by considering the excited and charged model moleculesEndo, Kazunaka / Masumoto, Chie / Matsumoto, Daisuke / Ida, Tomonori / Mizuno, Motohiro / Kato, Nobuhiko et al. | 2008
- 860
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SIMS depth profile analysis of sodium in silicon dioxideYamamoto, Y. / Shimodaira, N. et al. | 2008
- 863
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Assessment of the Nd/U ratio for the quantification of neodymium in UO2Desgranges, L. / Pasquet, B. / Roure, I. / Portier, S. / Brémier, S. / C.T.Walker / Hasnaoui, R. / Gavillet, D. / Martin, M. / Raimbault, L. et al. | 2008
- 866
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The Storing Matter technique: Preliminary results on PS and PVCPhilipp, P. / Douhard, B. / Lacour, F. / Wirtz, T. / Houssiau, L. / Pireaux, J.-J. / Migeon, H.-N. et al. | 2008
- 870
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Angular distribution of sputtered matter under Cs+ bombardment with oblique incidenceVerdeil, C. / Wirtz, T. / Migeon, H.-N. / Scherrer, H. et al. | 2008
- 874
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Monoatomic and cluster beam effect on ToF-SIMS spectra of self-assembled monolayers on goldTuccitto, N. / Torrisi, V. / Delfanti, I. / Licciardello, A. et al. | 2008
- 877
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Critical distance for secondary ion formation: Experimental SIMS measurementsKudriavtsev, Y. / Gallardo, S. / Villegas, A. / Ramirez, G. / Asomoza, R. et al. | 2008
- 880
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Secondary ion emission from Si bombarded with large Ar cluster ions under UHV conditionsNinomiya, Satoshi / Ichiki, Kazuya / Nakata, Yoshihiko / Honda, Yoshiro / Seki, Toshio / Aoki, Takaaki / Matsuo, Jiro et al. | 2008
- 883
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Desorption of cluster ions from adsorbed methane under cryogenic condition by low-energy ion irradiationNarita, Ayumi / Honda, Mitsunori / Hirao, Norie / Baba, Yuji / Yaita, Tsuyoshi et al. | 2008
- 886
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Controlling energy deposition during the C60+ bombardment of silicon: The effect of incident angle geometryKozole, Joseph / Winograd, Nicholas et al. | 2008
- 890
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Substrate effects on the analysis of biomolecular layers using Au+, Au3+ and C60+ bombardmentsKordys, Jeanette / Fletcher, John S. / Lockyer, Nicholas P. / Vickerman, John C. et al. | 2008
- 893
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Friction model to describe cluster bombardmentRyan, Kathleen E. / Russo, Michael F. Jr. / Smiley, Edward J. / Postawa, Zbigniew / Garrison, Barbara J. et al. | 2008
- 897
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Combined simulations and analytical model for predicting trends in cluster bombardmentRusso, Michael F. Jr. / Ryan, Kathleen E. / Czerwinski, Bartlomiej / Smiley, Edward J. / Postawa, Zbigniew / Garrison, Barbara J. et al. | 2008
- 901
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Resonance enhanced multi-photon ionization of neutral atoms sputtered with Ga-FIBKoizumi, M. / Sakamoto, T. et al. | 2008
- 905
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Quantum molecular dynamics simulation for fragmentation of arginine molecule induced by ion impactKato, Nobuhiko / Kudo, Masahiro et al. | 2008
- 908
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Effect of residual oxygen on ionization processes of Si+ and Si2+ sputtered from Si(111)-7×7 surfaceSakuma, Y. / Kato, M. / Shinde, N. / Yagi, S. / Soda, K. et al. | 2008
- 908
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Effect of residual oxygen on ionization processes of Si+ and Si2+ sputtered from Si(111)-7x7 surfaceSakuma, Y. / Kato, M. / Shinde, N. / Yagi, S. / Soda, K. et al. | 2008
- 912
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Investigation of molecular weight effects of polystyrene in ToF-SIMS using C60+ and Au+ primary ion beamsPiwowar, Alan M. / Lockyer, Nicholas / Vickerman, John C. et al. | 2008
- 916
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Cluster SIMS using metal cluster complex ionsFujiwara, Yukio / Kondou, Kouji / Teranishi, Yoshikazu / Watanabe, Kouji / Nonaka, Hidehiko / Saito, Naoaki / Itoh, Hiroshi / Fujimoto, Toshiyuki / Kurokawa, Akira / Ichimura, Shingo et al. | 2008
- 922
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TOF-SIMS investigation of Streptomyces coelicolor, a mycelial bacteriumVaidyanathan, Seetharaman / Fletcher, John S. / Lockyer, Nicholas P. / Vickerman, John C. et al. | 2008
- 926
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Depth profiling of cells and tissues by using C60+ and SF5+ as sputter ionsMalmberg, Per / Kriegeskotte, Christian / Arlinghaus, Heinrich F. / Hagenhoff, Birgit / Holmgren, Jan / Nilsson, Mikael / Nygren, Håkan et al. | 2008
- 929
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Imaging macrophages in trehalose with SIMSParry, S.A. / Kurczy, M.E. / Fan, X. / Halleck, M.S. / Schlegel, R.A. / Winograd, N. et al. | 2008
- 934
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Artifacts in the sputtering of inorganics by C60n+Lee, J.L.S. / Seah, M.P. / Gilmore, I.S. et al. | 2008
- 938
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Analysis of TOF-SIMS spectra from fullerene compoundsKato, N. / Yamashita, Y. / Iida, S. / Sanada, N. / Kudo, M. et al. | 2008
- 941
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Metal-assisted SIMS and cluster ion bombardment for ion yield enhancementHeile, A. / Lipinsky, D. / Wehbe, N. / Delcorte, A. / Bertrand, P. / Felten, A. / Houssiau, L. / Pireaux, J.-J. / De Mondt, R. / Van Vaeck, L. et al. | 2008
- 944
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MD simulation study of the sputtering process by high-energy gas cluster impactAoki, Takaaki / Seki, Toshio / Ninomiya, Satoshi / Matsuo, Jiro et al. | 2008
- 948
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Extremely low-energy projectiles for SIMS using size-selected gas cluster ionsMoritani, Kousuke / Hashinokuchi, Michihiro / Nakagawa, Jun / Kashiwagi, Takahiro / Toyoda, Noriaki / Mochiji, Kozo et al. | 2008
- 951
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The effect of angle of incidence to low damage sputtering of organic polymers using a C60 ion beamMiyayama, Takuya / Sanada, Noriaki / Iida, Shin-ichi / Hammond, John S. / Suzuki, Mineharu et al. | 2008
- 954
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On the road to high-resolution 3D molecular imagingDelcorte, Arnaud et al. | 2008
- 959
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Molecular depth profiling of trehalose using a C60 cluster ion beamWucher, Andreas / Cheng, Juan / Winograd, Nicholas et al. | 2008
- 962
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C60 ion sputtering of layered organic materialsShard, Alexander G. / Green, Felicia M. / Gilmore, Ian S. et al. | 2008
- 966
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Depth profiling of organic materials using improved ion beam conditionsCramer, H.-G. / Grehl, T. / Kollmer, F. / Moellers, R. / Niehuis, E. / Rading, D. et al. | 2008
- 970
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Molecular depth profiling of polymers with very low energy ionsHoussiau, L. / Douhard, B. / Mine, N. et al. | 2008
- 973
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MCsn+ cluster formation on organic surfaces: A novel way to depth-profile organics?Mine, N. / Douhard, B. / Houssiau, L. et al. | 2008
- 977
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ToF-SIMS study of growth behavior in all-nanoparticle multilayer films using a novel indicator layerChen, Bo-Jung / Yin, Yu-Sheng / Ling, Yong-Chien et al. | 2008
- 981
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ToF-SIMS study of chemical composition and formation of all-nanoparticle multilayer filmsChen, Bo-Jung / Yin, Yu-Sheng / Ling, Yong-Chien et al. | 2008
- 984
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Three-dimensional molecular imaging using mass spectrometry and atomic force microscopyWucher, Andreas / Cheng, Juan / Zheng, Leiliang / Willingham, David / Winograd, Nicholas et al. | 2008
- 987
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Analysis of surface and bulk polymerization of a thin film using a chemical derivatization technique and TOF-SIMSMaekawa, Toshihiko / Senga, Takeshi et al. | 2008
- 992
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Towards quantitative chemical imaging with ToF-SIMSWagner, Matthew S. et al. | 2008
- 997
-
TOF-SIMS analysis of polystyrene/polybutadiene blend using chemical derivatization and multivariate analysisKono, Teiichiro / Iwase, Eijiro / Kanamori, Yukiko et al. | 2008
- 1001
-
Lamellar orientation on the surface of a polymer determined by ToF-SIMS and AFMLau, Yiu-Ting R. / Weng, Lu-Tao / Ng, Kai-Mo / Chan, Chi-Ming et al. | 2008
- 1006
-
Nano- and microstructured polymer LB layers: A combined AFM/SIMS studyTorrisi, V. / Tuccitto, N. / Delfanti, I. / Audinot, J.N. / Zhavnerko, G. / Migeon, H.-N. / Licciardello, A. et al. | 2008
- 1011
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Photocatalytic decomposition of methylene blue and 4-chlorophenol on nanocrystalline TiO2 films under UV illumination: A ToF-SIMS studyOrendorz, Adam / Ziegler, Christiane / Gnaser, Hubert et al. | 2008
- 1015
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Comparison of secondary ion intensity enhancement from polymers on silicon and silver substrates by using Au-TOF-SIMSKudo, M. / Aimoto, K. / Sunagawa, Y. / Kato, N. / Aoyagi, S. / Iida, S. / Sanada, N. et al. | 2008
- 1018
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Influences of water on photoresist surface in immersion lithography technologySado, M. / Teratani, T. / Fujii, H. / Iikawa, R. / Iida, H. et al. | 2008
- 1022
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Mapping of the cationic starch adsorbed on pulp fibers by ToF-SIMSMatsushita, Yasuyuki / Suzuki, Ayumi / Sekiguchi, Takuya / Saito, Kaori / Imai, Takanori / Fukushima, Kazuhiko et al. | 2008
- 1025
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ToF-SIMS study on the cleaning methods of Au surface and their effects on the reproducibility of self-assembled monolayersMin, Hyegeun / Park, Ji-Won / Shon, Hyun Kyong / Moon, Dae Won / Lee, Tae Geol et al. | 2008
- 1029
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Primary ion fluence dependence in time-of-flight SIMS of self-assembled monolayer of alkyl thiol molecules on Au(111)—Discussion of static limitGhonaim, N.W. / Nieradko, M. / Xi, L. / Nie, H.-Y. / Francis, J.T. / Grizzi, O. / Yeung, K.K.C. / Lau, Leo W.M. et al. | 2008
- 1033
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Investigation of natural dyes and ancient textiles from korea using TOF-SIMSLee, Yeonhee / Lee, Jihye / Kim, Youngsoo / Choi, Seokchan / Ham, Seung Wook / Kim, Kang-Jin et al. | 2008
- 1037
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Quantitative analysis of mixed self-assembled monolayers using ToF-SIMSMin, Hyegeun / Jung, Ganghyuk / Moon, Dae Won / Choi, Insung S. / Lee, Tae Geol et al. | 2008
- 1040
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Simulation of SIMS for monomer and dimer of lignin under the assumption of thermal decomposition using QMD methodKato, Kenichi / Endo, Kazunaka / Matsumoto, Daisuke / Ida, Tomonori / Saito, Kaori / Fukushima, Kazuhiko / Kato, Nobuhiko et al. | 2008
- 1044
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Quantitative analysis of organic additive content in a polymer by ToF-SIMS with PCAIto, Hidemi / Kono, Teiichiro et al. | 2008
- 1048
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Fragment distribution of thermal decomposition for lignin monomer by QMD calculations using the excited and charged model moleculesEndo, Kazunaka / Matsumoto, Daisuke / Kato, Kenichi / Takagi, Yusuke / Ida, Tomonori / Mizuno, Motohiro / Saito, Kaori / Fukushima, Kazuhiko / Kato, Nobuhiko et al. | 2008
- 1052
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Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometryMorita, Yoshihiro / Owari, Masanori et al. | 2008
- 1055
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The effect of C60 cluster ion beam bombardment in sputter depth profiling of organic–inorganic hybrid multiple thin filmsShon, Hyun Kyong / Lee, Tae Geol / Kim, Dahl Hyun / Kang, Hee Jae / Lee, Byoung Hoon / Sung, Myung Mo / Moon, Dae Won et al. | 2008
- 1058
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Possibilities and limitations of high-resolution mass spectrometry in life sciencesArlinghaus, Heinrich F. et al. | 2008
- 1064
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Gold nanoparticle-enhanced secondary ion mass spectrometry and its bio-applicationsKim, Young-Pil / Oh, Eunkeu / Shon, Hyun Kyong / Moon, Dae Won / Lee, Tae Geol / Kim, Hak-Sung et al. | 2008
- 1068
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The effect of incident angle on the C60+ bombardment of molecular solidsKozole, Joseph / Willingham, David / Winograd, Nicholas et al. | 2008
- 1071
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TOF-SIMS structural characterization of self-assembly monolayer of cytochrome b5 onto gold substrateAoyagi, Satoka / Rouleau, Alain / Boireau, Wilfrid et al. | 2008
- 1075
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ToF-SIMS investigation of FIB-patterning of lactoferrin by using self-assembled monolayers of iron complexesTuccitto, N. / Giamblanco, N. / Marletta, G. / Licciardello, A. et al. | 2008
- 1079
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Imaging subcellular features of a sectioned rat brain using time-of-flight secondary ion mass spectrometry and scanning probe microscopyNie, H.-Y. / Francis, J.T. / Taylor, A.R. / Walzak, M.J. / Chang, W.H. / MacFabe, D.F. / Lau, W.M. et al. | 2008
- 1084
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ToF-SIMS PC-DFA analysis of prostate cancer cell linesBaker, M.J. / Gazi, E. / Brown, M.D. / Clarke, N.W. / Vickerman, J.C. / Lockyer, N.P. et al. | 2008
- 1088
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Chemical differences between sapwood and heartwood of Chamaecyparis obtusa detected by ToF-SIMSSaito, K. / Mitsutani, T. / Imai, T. / Matsushita, Y. / Yamamoto, A. / Fukushima, K. et al. | 2008
- 1092
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TOF-SIMS analysis of the interface between bone and titanium implants—Effect of porosity and magnesium coatingNygren, Håkan / Eriksson, Cecilia / Hederstierna, Karin / Malmberg, Per et al. | 2008
- 1096
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Evaluation of oriented lysozyme immobilized with monoclonal antibodyAoyagi, Satoka / Okada, Keigo / Shigyo, Ayako / Man, Naoki / Karen, Akiya et al. | 2008
- 1100
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TOF-SIMS analysis of magnetic materials in chum salmon headYano, Akira / Aoyagi, Satoka et al. | 2008
- 1104
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Evaluation of immobilized-lysozyme by means of TOF-SIMSOkada, Keigo / Aoyagi, Satoka / Dohi, Makoto / Kato, Nobuhiko / Kudo, Masahiro / Tozu, Miyako / Miyayama, Takuya / Sanada, Noriaki et al. | 2008
- 1107
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Marker experiments to determine diffusing species and diffusion path in medical Nitinol alloysLutz, J. / Lindner, J.K.N. / Mändl, S. et al. | 2008
- 1110
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Protein quantification on dendrimer-activated surfaces by using time-of-flight secondary ion mass spectrometry and principal component regressionKim, Young-Pil / Hong, Mi-Young / Shon, Hyun Kyong / Chegal, Won / Cho, Hyun Mo / Moon, Dae Won / Kim, Hak-Sung / Lee, Tae Geol et al. | 2008
- 1113
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A new approach for preventing charging up of soft material samples by coating with conducting polymers in SIMS analysisMise, Takaya / Ishikawa, Makishi / Nishimoto, Kensaku / Meguro, Takashi et al. | 2008
- 1116
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Investigation of the cosmetic ingredient distribution in the stratum corneum using NanoSIMS imagingTanji, N. / Okamoto, M. / Katayama, Y. / Hosokawa, M. / Takahata, N. / Sano, Y. et al. | 2008
- 1119
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Differentiation between human normal colon mucosa and colon cancer tissue using ToF-SIMS imaging technique and principal component analysisPark, Ji-Won / Shon, Hyun Kyong / Yoo, Byong Chul / Kim, In Hoo / Moon, Dae Won / Lee, Tae Geol et al. | 2008
- 1123
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Behcet brain tissue identified with increased levels of Si and AlAranyosiova, Monika / Kopani, Martin / Rychly, Boris / Jakubovsky, Jan / Velic, Dusan et al. | 2008
- 1126
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ToF-SIMS cluster ion imaging of hippocampal CA1 pyramidal rat neuronsFrancis, J.T. / Nie, H.-Y. / Taylor, A.R. / Walzak, M.J. / Chang, W.H. / MacFabe, D.F. / Lau, W.M. et al. | 2008
- 1131
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Molecular imaging of enhanced Na+ expression in the liver of total sleep deprived rats by TOF-SIMSChang, Hung-Ming / Chen, Bo-Jung / Wu, Un-In / Huang, Yi-Lun / Mai, Fu-Der et al. | 2008
- 1135
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Up-regulation of Na+ expression in the area postrema of total sleep deprived rats by TOF-SIMS analysisMai, Fu-Der / Chen, Bo-Jung / Ling, Yong-Chien / Wu, Un-In / Huang, Yi-Lun / Chang, Hung-Ming et al. | 2008
- 1139
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Interaction between diesel exhaust particles and cellular oxidative stressSuzuki, K. / Komatsu, T. / Kubo-Irie, M. / Tabata, M. / Takeda, K. / Nihei, Y. et al. | 2008
- 1143
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Application of ToF-SIMS to the study on heartwood formation in Cryptomeria japonica treesKuroda, Katsushi / Imai, Takanori / Saito, Kaori / Kato, Toshiyuki / Fukushima, Kazuhiko et al. | 2008
- 1148
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High sputtering yields of organic compounds by large gas cluster ionsIchiki, K. / Ninomiya, S. / Nakata, Y. / Honda, Y. / Seki, T. / Aoki, T. / Matsuo, J. et al. | 2008
- 1151
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Cesium pre-implantation of embedded biological sectionsGalle, Pierre / Levi-Setti, Riccardo / Labejof, Lise / Kaïtasov, Odile et al. | 2008
- 1154
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Accumulations of Ca/P in the core of hairs from Taklamakan desert mummiesHallégot, P. / Walter, P. / Cotte, M. / Audinot, J.-N. / Guillot, J. / Migeon, H.-N. / Tallarek, E. / Hagenhoff, B. et al. | 2008
- 1158
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Relative quantification of cellular sections with molecular depth profiling ToF-SIMS imagingKurczy, M.E. / Kozole, Joseph / Parry, S.A. / Piehowski, P.D. / Winograd, Nicholas / Ewing, A.G. et al. | 2008
- 1162
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Protein fragment imaging using ink jet printing digestion techniqueKomatsu, Manabu / Murayama, Yohei / Hashimoto, Hiroyuki et al. | 2008
- 1165
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ToF-SIMS and SEM-EDS analysis of the surface of chosen bioindicatorsSzynkowska, M.I. / Pawlaczyk, A. / Rogowski, J. et al. | 2008
- 1170
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Quantitative ToF-SIMS studies of protein drug release from biodegradable polymer drug delivery membranesBurns, Sarah A. / Gardella, Joseph A. Jr. et al. | 2008
- 1174
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Introduction of ice protective film for 3D microscale analysis of biological sampleIwanami, T. / Kinoshita, K. / Nojima, M. / Owari, M. et al. | 2008
- 1177
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TOF-SIMS analysis of adipose tissue from patients with chronic kidney diseaseSjövall, Peter / Johansson, Björn / Belazi, Dalila / Stenvinkel, Peter / Lindholm, Bengt / Lausmaa, Jukka / Schalling, Martin et al. | 2008
- 1181
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SIMS imaging of gadolinium isotopes in tissue from Nephrogenic Systemic Fibrosis patients: Release of free Gd from magnetic resonance imaging (MRI) contrast agentsAbraham, Jerrold L. / Chandra, Subhash / Thakral, Charu / Abraham, Joshua M. et al. | 2008
- 1185
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Visualisation of thyroid hormone synthesis by ion imagingAudinot, J.N. / Senou, M. / Migeon, H.-N. / Many, M.-C. et al. | 2008
- 1190
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Investigating lipid–lipid and lipid–protein interactions in model membranes by ToF-SIMSZheng, L. / McQuaw, C.M. / Baker, M.J. / Lockyer, N.P. / Vickerman, J.C. / Ewing, A.G. / Winograd, N. et al. | 2008
- 1193
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Discussions on fundamentals and bio-imaging chair: Professor Peter Williams and Professor John C. VickermanMurase, Atsushi et al. | 2008
- 1194
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Formation of atomic secondary ions in sputteringWucher, A. et al. | 2008
- 1201
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Oxygen O18 method and the search for the ionization mechanism in sputtering of oxygenated surfacesLorincik, Jan / Sroubek, Zdenek et al. | 2008
- 1206
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The fate of the (reactive) primary ion: Sputtering and desorptionVandervorst, W. / Janssens, T. / Huyghebaert, C. / Berghmans, B. et al. | 2008
- 1215
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General discussion| 2008
- 1217
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Energy dependence of projectiles on ion formation in electrospray droplet impact SIMSAsakawa, Daiki / Mori, Kunihiko / Hiraoka, Kenzo et al. | 2008
- 1223
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What do we want from computer simulation of SIMS using clusters?Webb, R.P. et al. | 2008
- 1229
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Sputtering of organic molecules by clusters, with focus on fullerenesDelcorte, A. / Wehbe, N. / Bertrand, P. / Garrison, B.J. et al. | 2008
- 1235
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What size of cluster is most appropriate for SIMS?Matsuo, Jiro / Ninomiya, Satoshi / Nakata, Yoshihiko / Honda, Yoshiro / Ichiki, Kazuya / Seki, Toshio / Aoki, Takaaki et al. | 2008
- 1241
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Biochemical imaging of tissues by SIMS for biomedical applicationsLee, Tae Geol / Park, Ji-Won / Shon, Hyun Kyong / Moon, Dae Won / Choi, Won Woo / Li, Kapsok / Chung, Jin Ho et al. | 2008
- 1249
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The chemical composition of animal cells reconstructed from 2D and 3D ToF-SIMS analysisBreitenstein, D. / Rommel, C.E. / Stolwijk, J. / Wegener, J. / Hagenhoff, B. et al. | 2008
- 1257
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Construction of a novel stigmatic MALDI imaging mass spectrometerHazama, Hisanao / Aoki, Jun / Nagao, Hirofumi / Suzuki, Ren / Tashima, Toshio / Fujii, Ken-ichi / Masuda, Katsuyoshi / Awazu, Kunio / Toyoda, Michisato / Naito, Yasuhide et al. | 2008
- 1264
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Uncovering new challenges in bio-analysis with ToF-SIMSFletcher, John S. / Henderson, Alex / Biddulph, Gregory X. / Vaidyanathan, Seetharaman / Lockyer, Nicholas P. / Vickerman, John C. et al. | 2008
- 1273
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Challenges of biological sample preparation for SIMS imaging of elements and molecules at subcellular resolutionChandra, Subhash et al. | 2008
- 1285
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The cytochemistry of anaplastic thyroid tumour cells and differentiated thyrocytes analyzed by TOF-SIMS and depth profilingNygren, Håkan / Malmberg, Per / Nilsson, Mikael / Kriegeskotte, Christian / Arlinghaus, Heinrich F. et al. | 2008
- 1289
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Quality of surface: The influence of sample preparation on MS-based biomolecular tissue imaging with MALDI-MS and (ME-)SIMSHeeren, Ron M.A. / Kükrer-Kaletaş, Başak / Taban, Ioana M. / MacAleese, Luke / McDonnell, Liam A. et al. | 2008
- 1298
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Which is more important in bioimaging SIMS experiments—The sample preparation or the nature of the projectile?Kurczy, M.E. / Piehowski, P.D. / Parry, S.A. / Jiang, M. / Chen, G. / Ewing, A.G. / Winograd, Nicholas et al. | 2008
- 1307
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Ultralow-energy SIMS for shallow semiconductor depth profilingChanbasha, A.R. / Wee, A.T.S. et al. | 2008
- 1311
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Accuracy of calibrated depth by delta-doped reference materials in shallow depth profilingTomita, M. / Tanaka, H. / Koike, M. / Kinno, T. / Hori, Y. / Yoshida, N. / Sasaki, T. / Takeno, S. et al. | 2008
- 1316
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Cesium near-surface concentration in low energy, negative mode dynamic SIMSBerghmans, B. / Van Daele, B. / Geenen, L. / Conard, T. / Franquet, A. / Vandervorst, W. et al. | 2008
- 1320
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Segregation under low-energy oxygen bombardment in the near-surface regionTada, Y. / Suzuki, K. / Kataoka, Y. et al. | 2008
- 1323
-
SIMS analysis of 83Kr implanted UO2Portier, S. / Brémier, S. / Hasnaoui, R. / Bildstein, O. / Walker, C.T. et al. | 2008
- 1327
-
SIMS depth profiles of alloying elements in surface layers formed in Cu-based alloys during annealingSuzuki, Shigeru / Shibata, Hiroyuki / Ito, Masuo / Kimura, Tarou et al. | 2008
- 1331
-
Depth distribution of Cs implanted into Si at steady-state during dual beam ToF-SIMS profilingVitchev, R.G. / Brison, J. / Houssiau, L. et al. | 2008
- 1334
-
Fluorine-doped SiO2 and fluorocarbon low-k dielectrics investigated by SIMSCwil, M. / Kalisz, M. / Konarski, P. et al. | 2008
- 1338
-
Factorial analysis of cluster-SIMS depth profiling using metal-cluster-complex ion beamsFujiwara, Yukio / Kondou, Kouji / Watanabe, Kouji / Nonaka, Hidehiko / Saito, Naoaki / Fujimoto, Toshiyuki / Kurokawa, Akira / Ichimura, Shingo / Tomita, Mitsuhiro et al. | 2008
- 1341
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SIMS characterization of segregation in InAs/GaAs heterostructuresGallardo, S. / Kudriatsev, Y. / Villegas, A. / Ramírez, G. / Asomoza, R. / Cruz-Hernández, E. / Rojas-Ramirez, J.S. / López-López, M. et al. | 2008
- 1345
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Silicon isotope superlattices: Ideal SIMS standards for shallow junction characterizationShimizu, Yasuo / Takano, Akio / Itoh, Kohei M. et al. | 2008
- 1348
-
Evaluation of sputtering rate change in the silicon transient region under medium energy O2+ sputteringTakano, Akio / Takenaka, Hisataka et al. | 2008
- 1351
-
Charge neutralization using secondary electron shower for shave-off depth profiling by focused ion beam secondary ion mass spectrometryIshizaki, Y. / Yamamoto, T. / Fujii, M. / Owari, M. / Nojima, M. / Nihei, Y. et al. | 2008
- 1354
-
Highly accurate shave-off depth profiling by simulation methodFujii, M. / Nakamura, K. / Ishizaki, Y. / Nojima, M. / Owari, M. / Nihei, Y. et al. | 2008
- 1357
-
The optimization of incident angles of low-energy oxygen ion beams for increasing sputtering rate on silicon samplesSasaki, T. / Yoshida, N. / Takahashi, M. / Tomita, M. et al. | 2008
- 1360
-
Towards quantitative depth profiling with high spatial and high depth resolutionVanhove, N. / Lievens, P. / Vandervorst, W. et al. | 2008
- 1364
-
Quantification in dynamic SIMS: Current status and future needsStevie, F.A. / Griffis, D.P. et al. | 2008
- 1368
-
Ripple morphologies on ion irradiated Si1−xGexSarkar, S. / Van Daele, B. / Vandervorst, W. et al. | 2008
- 1373
-
Micro-area analysis in SIMS depth profiling by mesa-structure preparationSeki, S. / Tamura, H. / Wada, Y. / Tsutsui, K. / Ootomo, S. et al. | 2008
- 1377
-
Quantitative SIMS measurement of high concentration of boron in silicon (up to 20at.%) using an isotopic comparative methodDubois, Christiane / Prudon, Gilles / Gautier, Brice / Dupuy, Jean-Claude et al. | 2008
- 1381
-
SIMS depth profiling and TEM imaging of the SIMS altered layerChristofi, A. / Walker, J.F. / McPhail, D.S. et al. | 2008
- 1384
-
Oxygen flooding and sample cooling during depth profiling of HfSiON thin filmsMiwa, Shiro et al. | 2008
- 1387
-
Influence of primary ion beam irradiation conditions on the depth profile of hydrogen in tantalum filmAsakawa, T. / Nagano, D. / Denda, S. / Miyairi, K. et al. | 2008
- 1391
-
Investigation of surface morphology of SiC during SIMS analysisFukumoto, Noriaki / Mizukami, Yumiko / Yoshikawa, Sumikazu / Morita, Hiromi et al. | 2008
- 1395
-
Investigations of semiconductor devices using SIMS; diffusion, contamination, process controlLee, Jae Cheol / Won, Jeongyeon / Chung, Youngsu / Lee, Hyungik / Lee, Eunha / Kang, Donghun / Kim, Changjung / Choi, Jinhak / Kim, Jeomsik et al. | 2008
- 1400
-
Shave-off vector profiling for TEM samplesNojima, M. / Fujii, M. / Ishizaki, Y. / Owari, M. / Nihei, Y. et al. | 2008
- 1404
-
Application of TOF-SIMS for high precision ion implant dosimetry: Possibilities and limitationsGrehl, Thomas / Möllers, Rudolf / Niehuis, Ewald / Rading, Derk et al. | 2008
- 1408
-
Characterization of post-etched photoresist and residues by various analytical techniquesFranquet, A. / Claes, M. / Conard, T. / Kesters, E. / Vereecke, G. / Vandervorst, W. et al. | 2008
- 1412
-
Quantification of SiGe layer composition using MCs+ and MCs2+ secondary ions in ToF-SIMS and magnetic SIMSMarseilhan, D. / Barnes, J.P. / Fillot, F. / Hartmann, J.M. / Holliger, P. et al. | 2008
- 1415
-
Quantitative static Time-of-Flight Secondary Ion Mass Spectrometry analysis of anionic minority species in microelectronic substratesRavanel, X. / Trouiller, C. / Juhel, M. / Wyon, C. / Kwakman, L.F.Tz. / Léonard, D. et al. | 2008
- 1419
-
Preparation and properties of ZnO layers grown by various methodsVincze, A. / Kováč, J. / Novotný, I. / Bruncko, J. / Haško, D. / Šatka, A. / Shtereva, K. et al. | 2008
- 1423
-
SIMS depth profiling analysis of halogens in CdTe/CdS/TSO solar cells using Cs2M+ cluster ionsKoudriavtseva, O. / Morales-Acevedo, A. / Kudriavtsev, Yu. / Gallardo, S. / Asomoza, R. / Mendoza-Perez, R. / Sastre-Hernandez, J. / Contreras-Puente, G. et al. | 2008
- 1427
-
Long-term reproducibility of relative sensitivity factors obtained with CAMECA WfGui, D. / Xing, Z.X. / Huang, Y.H. / Mo, Z.Q. / Hua, Y.N. / Zhao, S.P. / Cha, L.Z. et al. | 2008
- 1430
-
Film thickness determining method of the silicon isotope superlattices by SIMSTakano, Akio / Shimizu, Yasuo / Itoh, Kohei M. et al. | 2008
- 1433
-
Roughness development in the depth profiling with 500eV O2+ beam with the combination of oxygen flooding and sample rotationGui, D. / Xing, Z.X. / Huang, Y.H. / Mo, Z.Q. / Hua, Y.N. / Zhao, S.P. / Cha, L.Z. et al. | 2008
- 1437
-
Depth profiling of ultra-thin oxynitride gate dielectrics by using MCs2+ techniqueGui, D. / Mo, Z.Q. / Xing, Z.X. / Huang, Y.H. / Hua, Y.N. / Zhao, S.P. / Cha, L.Z. et al. | 2008
- 1440
-
Static time-of-flight secondary ion mass spectrometry analysis of microelectronics related substrates using a polyatomic ion sourceRavanel, X. / Trouiller, C. / Juhel, M. / Wyon, C. / Kwakman, L.F.Tz. / Léonard, D. et al. | 2008
- 1443
-
Characterization of ionic migration on CoF substrate by ToF-SIMSMogi, S. / Wada, M. / Matsumura, Y. / Tabira, Y. et al. | 2008
- 1446
-
Isotopic imaging of refractory inclusions in meteorites with the NanoSIMS 50LIto, Motoo / Messenger, Scott et al. | 2008
- 1451
-
Invisible gold and arsenic in pyrite from the high-grade Hishikari gold deposit, JapanMorishita, Y. / Shimada, N. / Shimada, K. et al. | 2008
- 1455
-
Investigation of radiation enhanced diffusion of magnesium in substrates flown on the NASA genesis missionKing, B.V. / Pellin, M.J. / Burnett, D.S. et al. | 2008
- 1458
-
Discovery of 17,18O-rich material from meteorite by direct-imaging method using stigmatic-SIMS and 2D ion detectorSakamoto, Naoya / Itoh, Shoichi / Yurimoto, Hisayoshi et al. | 2008
- 1461
-
MegaSIMS: a SIMS/AMS hybrid for measurement of the Sun’s oxygen isotopic compositionMao, Peter H. / Burnett, Donald S. / Coath, Christopher D. / Jarzebinski, George / Kunihiro, Takuya / McKeegan, Kevin D. et al. | 2008
- 1465
-
NanoSIMS analysis of Archean fossils and biomarkersKilburn, M.R. / Wacey, D. et al. | 2008