Fine details in satellite HOLZ reflection discs of CBED from a GaAs/AlAs multilayer (Englisch)
Nationallizenz
- Neue Suche nach: Gong, H.
- Neue Suche nach: Schapink, F.W.
- Neue Suche nach: Gong, H.
- Neue Suche nach: Schapink, F.W.
In:
Ultramicroscopy
;
35
, 3-4
;
171-184
;
1991
-
ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Fine details in satellite HOLZ reflection discs of CBED from a GaAs/AlAs multilayer
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Beteiligte:Gong, H. ( Autor:in ) / Schapink, F.W. ( Autor:in )
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Erschienen in:Ultramicroscopy ; 35, 3-4 ; 171-184
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Verlag:
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Erscheinungsdatum:20.02.1991
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Format / Umfang:14 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 35, Ausgabe 3-4
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Vernon Ellis Cosslett(1908–1990)| 1991
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Fine details in satellite HOLZ reflection discs of CBED from a GaAs/AlAs multilayerGong, H. / Schapink, F.W. et al. | 1991
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Automated structure factor refinement from convergent-beam patternsZuo, J.M. / Spence, J.C.H. et al. | 1991
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The use of the Fresnel method for the characterisation of a short-period strained Ge/Si multilayer: II. Measurement of a layer-thickness irregularityShih, W.C. / Stobbs, W.M. et al. | 1991
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A treatment of dynamical diffraction for multiply layered structuresRossouw, C.J. / AL-Khafaji, M. / Cherns, D. / Steeds, J.W. / Touaitia, R. et al. | 1990
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Effects of energy filtering in LACBED patternsJordan, I.K. / Rossouw, C.J. / Vincent, R. et al. | 1990
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Utility test of imaging plate as a high-resolution image-recording material for radiation-sensitive specimensIsoda, S. / Saitoh, K. / Moriguchi, S. / Kobayashi, T. et al. | 1990
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Author index to volume 35| 1991
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Subject index to volume 35| 1991
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Instructions to authors| 1991