Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffraction (Englisch)
Nationallizenz
- Neue Suche nach: Takayanagi, Kunio
- Neue Suche nach: Tanishiro, Yasumasa
- Neue Suche nach: Takahashi, Shigeki
- Neue Suche nach: Takahashi, Masaetsu
- Neue Suche nach: Takayanagi, Kunio
- Neue Suche nach: Tanishiro, Yasumasa
- Neue Suche nach: Takahashi, Shigeki
- Neue Suche nach: Takahashi, Masaetsu
In:
Surface Science
;
164
, 2-3
;
367-392
;
1985
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffraction
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Beteiligte:Takayanagi, Kunio ( Autor:in ) / Tanishiro, Yasumasa ( Autor:in ) / Takahashi, Shigeki ( Autor:in ) / Takahashi, Masaetsu ( Autor:in )
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Erschienen in:Surface Science ; 164, 2-3 ; 367-392
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Verlag:
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Erscheinungsdatum:01.08.1985
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Format / Umfang:26 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 164, Ausgabe 2-3
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Author index| 1985
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Subject index| 1985
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