Optical inspection of the silicon micro-strip sensors for the CBM experiment employing artificial intelligence (Englisch)
- Neue Suche nach: Lavrik, E.
- Neue Suche nach: Shiroya, M.
- Neue Suche nach: Schmidt, H.R.
- Neue Suche nach: Toia, A.
- Neue Suche nach: Heuser, J.M.
- Neue Suche nach: Lavrik, E.
- Neue Suche nach: Shiroya, M.
- Neue Suche nach: Schmidt, H.R.
- Neue Suche nach: Toia, A.
- Neue Suche nach: Heuser, J.M.
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Optical inspection of the silicon micro-strip sensors for the CBM experiment employing artificial intelligence
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Beteiligte:Lavrik, E. ( Autor:in ) / Shiroya, M. ( Autor:in ) / Schmidt, H.R. ( Autor:in ) / Toia, A. ( Autor:in ) / Heuser, J.M. ( Autor:in )
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Verlag:
- Neue Suche nach: Elsevier B.V.
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Erscheinungsdatum:12.10.2021
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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Optical inspection of the silicon micro-strip sensors for the CBM experiment employing artificial intelligenceLavrik, E. / Shiroya, M. / Schmidt, H.R. / Toia, A. / Heuser, J.M. et al. | 2021
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