Organizing Commitee (Englisch)
In:
2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)
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2022
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ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Organizing Commitee
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Erschienen in:
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Verlag:
- Neue Suche nach: IEEE
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Erscheinungsdatum:09.03.2022
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Format / Umfang:72908 byte
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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Organizing Commitee| 2022
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Ebook Cover| 2022
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Author Index| 2022
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Sponsors| 2022
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Dear participant of EMC COMPO 2021| 2022
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Table of Contents| 2022
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9h30 9th March 2022 - Plenary Session: “To shield or to absorb?”Leferink, Frank / Pissoort, Davy et al. | 2022
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10th March 2022 - Plenary Session: “A global IC development oriented approach towards Electromagnetic Compatibility: from concept design to final product release”Boesman, Bart / Pissoort, Davy et al. | 2022
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Characterization of the Shielding Effectiveness of Board-Level Shields using a Dedicated Stripline Test Method up to 44GHzRadhakrishnan, Pavithrakrishnan / Claeys, Tim / Catrysse, Johan / Pissoort, Davy et al. | 2022
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Influence of Layout Parasitics on EMI Improved Folded Cascode Amplifier Input Stages Using Compensation MethodsZupan, Dominik / Czepl, Nikolaus / Deutschmann, Bernd et al. | 2022
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Resonance Property of a Novel Vertical Substrate Integrated WaveguideFeng, Yu-Ru / Xiao, Qi-Han / Chen, Liang-Jin / Wei, Xing-Chang / Luo, Cong-De / Zhang, Zhi-Ying et al. | 2022
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Electromagnetic Impact of Interconnect Resistance on STDP Characteristics in Neuromorphic Crossbar ArrayTao, Tuomin / Ma, Hanzhi / Chen, Quankun / Tan, Shurun / Liu, En-Xiao / Li, Er-Ping et al. | 2022
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Reduction of Electromagnetic Emission from ICs Using Soft Flexible Ferrite SheetsDeutschmann, Bernd / Khan, Junaid Shakeel / Winkler, Gunter / Victoria, Jorge et al. | 2022
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Measurements of Electromagnetic Emission inside Industrial Unmanned Aerial VehiclesWatanabe, Koh / Aoi, Mai / Komatsu, Misaki / Tanaka, Satoshi / Nagata, Makoto et al. | 2022
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Effect of SiC MOSFET Terminal Capacitances Evolution after Short-Circuit Aging Tests on Conducted EMI in a Boost ConverterDouzi, Chawki / Kadi, Moncef / Hadj Slama, Jaleleddine Ben et al. | 2022
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EM emission modeling for secure IC designPoggi, Davide / Maurine, Philippe / Ordas, Thomas / Sarafianos, Alexandre / Raoult, Jeremy et al. | 2022
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Near Field Measurements of Sub-millimeter-wave Noise Emission from Digital Integrated CircuitsWatanabe, Koh / Wadatsumi, Takuya / Monta, Kazuki / Aoi, Mai / Komatsu, Misaki / Sakai, Ryota / Tanaka, Satoshi / Miki, Takuji / Nagata, Makoto et al. | 2022
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Meta-stability of Behavioural Models of Integrated Circuits with DC and RF Sub-ModelsMagerl, Marko / Stockreiter, Christian / Baric, Adrijan et al. | 2022
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Determination of Equivalent Coupling Surface of Ferrite Beads and related Filter Design Stakes for Multi-SourcingStojanovic, Marine / Lafon, Frederic / Fernandez-Lopez, Priscila / Loudiere, Kevin / Vasquez-Hormazabal, Catalina et al. | 2022
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Equivalent Circuit of Common-Mode Choke Coil Considering with Conversion from Differential-Mode Signal to Common-Mode DisturbanceKuwabara, Nobuo / Matsushima, Tohlu / Fukumoto, Yuki et al. | 2022
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Implementation of an EMC modeling and simulation methodology applied on an embedded LINphy moduleBenlakhouy, Younes et al. | 2022
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EMC related Handle-Wafer Backside Effects in a 180nm SOI-TechnologyNuernbergk, Dirk M. / Knoll, Mario / Heinrich, Klaus / Baran, Burak et al. | 2022
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Investigation on the Susceptibility to EMI of Second-Order ∆Σ ModulatorsFishta, Markeljan / Fiori, Franco et al. | 2022
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A Technique to Assess Conducted Immunity of an Electronic Equipment after an Obsolete Integrated Circuit ChangeChetouani, Saliha / Boyer, Alexandre / Dhia, Sonia Ben / Serpaud, Sebastien / Durier, Andre et al. | 2022
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Communication Noise Investigation on Automotive SensorDoridant, Adrien / Abouda, Kamel / Ouaddah, Jalal / Maleyran, Marianne / Calmettes, Philippe / Enjalbert, Jerome / Tang, Jinbang et al. | 2022
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EMC Sensitivity Analysis of Crystal Oscillator through Direct Power Injection (DPI)Sinha, Anand / Tripathi, Avinash / Wadhwa, Sanjay Kumar / Bhooshan, Rishi / Lippmann, Robert / Benlakhouy, Younes / Bansal, Sachin et al. | 2022
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IEMI Fault Injection Method Using Continuous Sinusoidal Wave with Controlled Frequency, Amplitude, and PhaseNishiyama, Hikaru / Fujimoto, Daisuke / Kim, Youngwoo / Sone, Hideaki / Hayashi, Yu-Ichi et al. | 2022
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New method for testing the susceptibility to intermodulation of RF systemsGrezes, Alain / Raoult, Jeremy / Martorell, Alexandre et al. | 2022
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Comparing Simulated Impact of Single Frequency and Multitone EMI for an Integrated CircuitDevaraj, Lokesh / Khan, Qazi Mashaal / Ruddle, Alastair R. / Duffy, Alistair P. et al. | 2022
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A new TRL/TRM PCB-based Calibration Method for On-Board Devices Under Test (DUTs)Ramezani, Akram / Khan, Qazi Mashaal / Pues, Hugo et al. | 2022
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Digital and Analogue Hardware Design of an On-Board EMI DetectorHabib, Hasan / Claeys, Tim / Perdriau, Richard / Pissoort, Davy et al. | 2022
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A Comparison Among DPI Immunities of Multi-Stage CSVCOs and Ring OscillatorsKhan, Qazi Mashaal / Ramezani, Akram / Koohestani, Mohsen / Ramdani, Mohamed / Perdriau, Richard et al. | 2022
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Analysis of Filtering Window Impacts on Estimation Accuracy of Information Leakage from Exposed Power Delivery Network of Cryptographic DevicesKim, Youngwoo / Wada, Shinpei / Fujimoto, Daisuke / Hayashi, Yuichi et al. | 2022
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A Fault Tree Approach Focusing on Electromagnetic InterferenceHormaier, Klaus / Zangl, Hubert / Kircher, Daniel / Deutschmann, Bernd et al. | 2022
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EMC Methodology to Optimize Application of Electronic Component MultisourcingLoudiere, Kevin / Lafon, Frederic / Fernandez-Lopez, Priscila / Stojanovic, Marine / Leon, Jean-Francois et al. | 2022
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Analysis of the Impact of Artificial Networks in System-level EMC TestsGardella, Pablo J. / Mariani, Eduardo et al. | 2022