Low-Frequency and Low-Cost Test Methodology for Integrated RF Substrates (Englisch)
- Neue Suche nach: Goyal, Abhilash
- Neue Suche nach: Swaminathan, Madhavan
- Neue Suche nach: Chatterjee, Abhijit
- Neue Suche nach: Goyal, Abhilash
- Neue Suche nach: Swaminathan, Madhavan
- Neue Suche nach: Chatterjee, Abhijit
In:
IEEE Transactions on Advanced Packaging
;
33
, 3
;
669-680
;
2010
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Low-Frequency and Low-Cost Test Methodology for Integrated RF Substrates
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Beteiligte:Goyal, Abhilash ( Autor:in ) / Swaminathan, Madhavan ( Autor:in ) / Chatterjee, Abhijit ( Autor:in )
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Erschienen in:IEEE Transactions on Advanced Packaging ; 33, 3 ; 669-680
-
Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsdatum:01.08.2010
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Format / Umfang:2237450 byte
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 33, Ausgabe 3
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