A Bayesian Deep Learning RUL Framework Integrating Epistemic and Aleatoric Uncertainties (Englisch)
- Neue Suche nach: Li, Gaoyang
- Weitere Informationen zu Li, Gaoyang:
- https://orcid.org/0000-0003-4804-5577
- Neue Suche nach: Yang, Li
- Weitere Informationen zu Yang, Li:
- https://orcid.org/0000-0002-4738-0210
- Neue Suche nach: Lee, Chi-Guhn
- Weitere Informationen zu Lee, Chi-Guhn:
- https://orcid.org/0000-0002-0916-0241
- Neue Suche nach: Wang, Xiaohua
- Weitere Informationen zu Wang, Xiaohua:
- https://orcid.org/0000-0002-6551-151X
- Neue Suche nach: Rong, Mingzhe
- Weitere Informationen zu Rong, Mingzhe:
- https://orcid.org/0000-0003-3977-6298
- Neue Suche nach: Li, Gaoyang
- Weitere Informationen zu Li, Gaoyang:
- https://orcid.org/0000-0003-4804-5577
- Neue Suche nach: Yang, Li
- Weitere Informationen zu Yang, Li:
- https://orcid.org/0000-0002-4738-0210
- Neue Suche nach: Lee, Chi-Guhn
- Weitere Informationen zu Lee, Chi-Guhn:
- https://orcid.org/0000-0002-0916-0241
- Neue Suche nach: Wang, Xiaohua
- Weitere Informationen zu Wang, Xiaohua:
- https://orcid.org/0000-0002-6551-151X
- Neue Suche nach: Rong, Mingzhe
- Weitere Informationen zu Rong, Mingzhe:
- https://orcid.org/0000-0003-3977-6298
In:
IEEE Transactions on Industrial Electronics
;
68
, 9
;
8829-8841
;
2021
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:A Bayesian Deep Learning RUL Framework Integrating Epistemic and Aleatoric Uncertainties
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Beteiligte:Li, Gaoyang ( Autor:in ) / Yang, Li ( Autor:in ) / Lee, Chi-Guhn ( Autor:in ) / Wang, Xiaohua ( Autor:in ) / Rong, Mingzhe ( Autor:in )
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Erschienen in:IEEE Transactions on Industrial Electronics ; 68, 9 ; 8829-8841
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Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsdatum:01.09.2021
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Format / Umfang:4381591 byte
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 68, Ausgabe 9
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A High Accuracy and High Speed Imaging and Measurement System for Rail Corrugation InspectionGazafrudi, Sayed Mohammad Mousavi / Younesian, Davood / Torabi, Mehran et al. | 2021
- 8904
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Self-Powered Inertial Sensor Based on Carbon Nanotube YarnMoon, Ji Hwan / Kim, Bum-Joon / Jang, Yongwoo / Mun, Tae Jin / Kim, Hyunsoo / Kim, Seon Jeong et al. | 2021
- 8911
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Assay of Inductive-Capacitive Probe for the Measurement of the Conductivity of LiquidsKantamani, Tejaswini / George, Boby / Kumar V, Jagadeesh et al. | 2021
- 8919
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Geometrically Driven Underground Camera Modeling and Calibration With Coplanarity Constraints for a Boom-Type RoadheaderYang, Wenjuan / Zhang, Xuhui / Ma, Hongwei / Zhang, Guang-Ming et al. | 2021
- 8930
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Research on a Composite Voltage and Current Measurement Device for HVDC NetworksLi, Zhenhua / Jiang, Weihui / Abu-Siada, Ahmed / Li, Zhenxing / Xu, Yanchun / Liu, Songkai et al. | 2021
- 8942
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Passive and Explicit Attitude and Gyro-Bias Observers Using Inertial MeasurementsTong, Xin / Chen, Miao / Yang, Fuhua et al. | 2021
- 8953
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Siamese Neural Network-Based Supervised Slow Feature Extraction for Soft Sensor ApplicationChiplunkar, Ranjith / Huang, Biao et al. | 2021
- 8963
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A Self-Adaptive Control for Phase-Controlled Electromagnetic Contactor Using Weighted Moving Average FilterFang, Shuhua / Chen, Yong / Lin, Heyun et al. | 2021
- 8973
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Enhanced Unsupervised Change Detector for Industrial Surveillance SystemsShahbaz, Ajmal / Jo, Kang-Hyun et al. | 2021
- 8982
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Achieving 360$^\circ$ Coverage Dynamic and Switchable Beamforming Through Resource-Efficient Switchable Antennas for Future mmWave IoT DevicesJo, Ohyun / Kwon, Wonpyo / Hong, Wonbin et al. | 2021
- 8992
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Improved Fundamental Frequency Estimator for Three-Phase ApplicationVerma, Anant Kumar / Jarial, Raj Kumar / Roncero-Sanchez, Pedro / Ungarala, Mohan Rao et al. | 2021
- 8999
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Dual-Side Phase-Shift Control of Wireless Power Transfer Implemented on Primary Side Based on Driving WindingsZhang, Yiming / Chen, Shuxin / Li, Xin / Tang, Yi et al. | 2021
- 9003
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LTP Modeling of Single-Phase $T/4$ Delay-Based PLLsGolestan, Saeed / Guerrero, Josep M. / Vasquez, Juan C. et al. | 2021
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Table of Contents| 2021
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IEEE Industrial Electronics Society| 2021
- C4
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Information for Authors| 2021