Probabilistic Design Approach for Cyclic Fatigue Life Prediction of Microelectronic Interconnects (Englisch)
- Neue Suche nach: Ladani, Leila J
- Neue Suche nach: Razmi, Jafar
- Neue Suche nach: Ladani, Leila J
- Neue Suche nach: Razmi, Jafar
In:
IEEE Transactions on Advanced Packaging
;
33
, 2
;
559-568
;
2010
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Probabilistic Design Approach for Cyclic Fatigue Life Prediction of Microelectronic Interconnects
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Beteiligte:Ladani, Leila J ( Autor:in ) / Razmi, Jafar ( Autor:in )
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Erschienen in:IEEE Transactions on Advanced Packaging ; 33, 2 ; 559-568
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Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsdatum:01.05.2010
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Format / Umfang:1366648 byte
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 33, Ausgabe 2
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Probabilistic Design Approach for Cyclic Fatigue Life Prediction of Microelectronic InterconnectsLadani, Leila J / Razmi, Jafar et al. | 2010
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Table of contents| 2010
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IEEE Transactions on Advanced Packaging publication information| 2010
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IEEE Components, Packaging, and Manufacturing Technology Society Information for authors| 2010
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IEEE Components, Packaging, and Manufacturing Technology Society Information| 2010