Investigation of Ultrathin Ni Germanosilicide for Advanced pMOS Contact Metallization (Englisch)
- Neue Suche nach: Mao, Shujuan
- Weitere Informationen zu Mao, Shujuan:
- https://orcid.org/0000-0002-3350-1659
- Neue Suche nach: Zhao, Chao
- Neue Suche nach: Liu, Jinbiao
- Neue Suche nach: Wang, Guilei
- Neue Suche nach: Li, Ben
- Neue Suche nach: Liu, Weibing
- Neue Suche nach: Li, Menghua
- Weitere Informationen zu Li, Menghua:
- https://orcid.org/0000-0001-8782-1757
- Neue Suche nach: Liu, Yaodong
- Neue Suche nach: Zhang, Dan
- Weitere Informationen zu Zhang, Dan:
- https://orcid.org/0000-0002-9034-4768
- Neue Suche nach: Xu, Jing
- Weitere Informationen zu Xu, Jing:
- https://orcid.org/0000-0003-0062-5724
- Neue Suche nach: Gao, Jianfeng
- Neue Suche nach: Li, Yongliang
- Weitere Informationen zu Li, Yongliang:
- https://orcid.org/0000-0002-5590-861X
- Neue Suche nach: Wang, Wenwu
- Neue Suche nach: Chen, Dapeng
- Neue Suche nach: Li, Junfeng
- Neue Suche nach: Ye, Tianchun
- Weitere Informationen zu Ye, Tianchun:
- https://orcid.org/0000-0002-2384-9037
- Neue Suche nach: Luo, Jun
- Weitere Informationen zu Luo, Jun:
- https://orcid.org/0000-0002-5122-6806
- Neue Suche nach: Mao, Shujuan
- Weitere Informationen zu Mao, Shujuan:
- https://orcid.org/0000-0002-3350-1659
- Neue Suche nach: Zhao, Chao
- Neue Suche nach: Liu, Jinbiao
- Neue Suche nach: Wang, Guilei
- Neue Suche nach: Li, Ben
- Neue Suche nach: Liu, Weibing
- Neue Suche nach: Li, Menghua
- Weitere Informationen zu Li, Menghua:
- https://orcid.org/0000-0001-8782-1757
- Neue Suche nach: Liu, Yaodong
- Neue Suche nach: Zhang, Dan
- Weitere Informationen zu Zhang, Dan:
- https://orcid.org/0000-0002-9034-4768
- Neue Suche nach: Xu, Jing
- Weitere Informationen zu Xu, Jing:
- https://orcid.org/0000-0003-0062-5724
- Neue Suche nach: Gao, Jianfeng
- Neue Suche nach: Li, Yongliang
- Weitere Informationen zu Li, Yongliang:
- https://orcid.org/0000-0002-5590-861X
- Neue Suche nach: Wang, Wenwu
- Neue Suche nach: Chen, Dapeng
- Neue Suche nach: Li, Junfeng
- Neue Suche nach: Ye, Tianchun
- Weitere Informationen zu Ye, Tianchun:
- https://orcid.org/0000-0002-2384-9037
- Neue Suche nach: Luo, Jun
- Weitere Informationen zu Luo, Jun:
- https://orcid.org/0000-0002-5122-6806
In:
IEEE Transactions on Electron Devices
;
67
, 11
;
5039-5044
;
2020
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Investigation of Ultrathin Ni Germanosilicide for Advanced pMOS Contact Metallization
-
Beteiligte:Mao, Shujuan ( Autor:in ) / Zhao, Chao ( Autor:in ) / Liu, Jinbiao ( Autor:in ) / Wang, Guilei ( Autor:in ) / Li, Ben ( Autor:in ) / Liu, Weibing ( Autor:in ) / Li, Menghua ( Autor:in ) / Liu, Yaodong ( Autor:in ) / Zhang, Dan ( Autor:in ) / Xu, Jing ( Autor:in )
-
Erschienen in:IEEE Transactions on Electron Devices ; 67, 11 ; 5039-5044
-
Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsdatum:01.11.2020
-
Format / Umfang:1429501 byte
-
ISSN:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Elektronische Ressource
-
Sprache:Englisch
-
Datenquelle:
Inhaltsverzeichnis – Band 67, Ausgabe 11
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 4558
-
Editorial Special Section on ESSDERCAndrieu, Francois / Ghione, Giovanni et al. | 2020
- 4559
-
Generalized Constant Current Method for Determining MOSFET Threshold VoltageBucher, Matthias / Makris, Nikolaos / Chevas, Loukas et al. | 2020
- 4563
-
Performance and Low-Frequency Noise of 22-nm FDSOI Down to 4.2 K for Cryogenic ApplicationsCardoso Paz, Bruna / Casse, Mikael / Theodorou, Christoforos / Ghibaudo, Gerard / Kammler, Thorsten / Pirro, Luca / Vinet, Maud / de Franceschi, Silvano / Meunier, Tristan / Gaillard, Fred et al. | 2020
- 4568
-
A Method for Series-Resistance-Immune Extraction of Low-Frequency Noise Parameters in Nanoscale MOSFETsTataridou, Angeliki / Ghibaudo, Gerard / Theodorou, Christoforos et al. | 2020
- 4573
-
Analytical Model for Interface Traps-Dependent Back Bias Capability and Variability in Ultrathin Body and Box FDSOI MOSFETsChen, Wangyong / Cai, Linlin / Liu, Xiaoyan / Du, Gang et al. | 2020
- 4578
-
Polarization Independent Band Gaps in CMOS Back-End-of-Line for Monolithic High-Q MEMS Resonator ConfinementHudeczek, Richard / Baumgartner, Peter et al. | 2020
- 4582
-
Out-of-Equilibrium Body Potential Measurement on Silicon-on-Insulator With Deposited Metal ContactsAlepidis, Miltiadis / Bouchard, Aude / Delacour, Cecile / Bawedin, Maryline / Ionica, Irina et al. | 2020
- 4587
-
Evaluation of High-Temperature High-Frequency GaN-Based LC-Oscillator ComponentsOttaviani, A. / Palacios, P. / Zweipfennig, T. / Alomari, M. / Beckmann, C. / Bierbusse, D. / Wieben, J. / Ehrler, J. / Kalisch, H. / Negra, R. et al. | 2020
- 4592
-
Analysis of Gate-Metal Resistance in CMOS-Compatible RF GaN HEMTsElKashlan, R. Y. / Rodriguez, R. / Yadav, S. / Khaled, A. / Peralagu, U. / Alian, A. / Waldron, N. / Zhao, M. / Wambacq, P. / Parvais, B. et al. | 2020
- 4597
-
Characterization and TCAD Modeling of Mixed-Mode Stress Induced by Impact Ionization in Scaled SiGe HBTsZagni, Nicolo / Puglisi, Francesco Maria / Verzellesi, Giovanni / Pavan, Paolo et al. | 2020
- 4602
-
Hot-Electron Effects in AlGaN/GaN HEMTs Under Semi-ON DC StressMinetto, Andrea / Deutschmann, Bernd / Modolo, Nicola / Nardo, Arianna / Meneghini, Matteo / Zanoni, Enrico / Sayadi, Luca / Prechtl, Gerhard / Sicre, Sebastien / Haberlen, Oliver et al. | 2020
- 4606
-
Vertically Replaceable Memory Block Architecture for Stacked DRAM Systems by Wafer-on-Wafer (WOW) TechnologySugatani, Shinji / Chujo, Norio / Sakui, Koji / Ryoson, Hiroyuki / Nakamura, Tomoji / Ohba, Takayuki et al. | 2020
- 4611
-
Reliability of Logic-in-Memory Circuits in Resistive Memory ArraysZanotti, Tommaso / Zambelli, Cristian / Puglisi, Francesco Maria / Milo, Valerio / Perez, Eduardo / Mahadevaiah, Mamathamba K. / Ossorio, Oscar G. / Wenger, Christian / Pavan, Paolo / Olivo, Piero et al. | 2020
- 4616
-
IGZO-Based Compute Cell for Analog In-Memory Computing—DTCO Analysis to Enable Ultralow-Power AI at EdgeSaito, D. / Doevenspeck, J. / Cosemans, S. / Oh, H. / Perumkunnil, M. / Papistas, I. A. / Belmonte, A. / Rassoul, N. / Delhougne, R. / Kar, G. et al. | 2020
- 4621
-
Array-Level Programming of 3-Bit per Cell Resistive Memory and Its Application for Deep Neural Network InferenceLuo, Yandong / Han, Xu / Ye, Zhilu / Barnaby, Hugh / Seo, Jae-Sun / Yu, Shimeng et al. | 2020
- 4626
-
Ultrahigh-Density 3-D Vertical RRAM With Stacked Junctionless Nanowires for In-Memory-Computing ApplicationsEzzadeen, M. / Bosch, D. / Giraud, B. / Barraud, S. / Noel, J. -P. / Lattard, D. / Lacord, J. / Portal, J. M. / Andrieu, F. et al. | 2020
- 4631
-
Thermal Stress-Aware CMOS–SRAM Partitioning in Sequential 3-D TechnologySalahuddin, Shairfe Muhammad / Litta, Eugenio Dentoni / Gupta, Anshul / Ritzenthaler, Romain / Schaekers, Marc / Everaert, Jean-Luc / Yu, Hao / Vandooren, Anne / Ryckaert, Julien / Na, Myung-Hee et al. | 2020
- 4636
-
Cryogenic Operation of Thin-Film FDSOI nMOS Transistors: The Effect of Back Bias on Drain Current and TransconductanceCasse, M. / Paz, B. Cardoso / Ghibaudo, G. / Poiroux, T. / Barraud, S. / Vinet, M. / de Franceschi, S. / Meunier, T. / Gaillard, F. et al. | 2020
- 4641
-
Enhanced Ultraviolet Avalanche Photodiode With 640-nm-Thin Silicon Body Based on SOI TechnologyAlirezaei, Iman Sabri / Andre, Nicolas / Flandre, Denis et al. | 2020
- 4645
-
TCAD Study of VLD Termination in Large-Area Power Devices Featuring a DLC PassivationBalestra, L. / Reggiani, S. / Gnudi, A. / Gnani, E. / Dobrzynska, J. / Vobecky, J. et al. | 2020
- 4649
-
Analysis of MIS-HEMT Device Edge Behavior for GaN Technology Using New Differential MethodKammeugne, R. Kom / Leroux, C. / Cluzel, J. / Vauche, L. / Le Royer, C. / Gwoziecki, R. / Biscarrat, J. / Gaillard, F. / Charles, M. / Bano, E. et al. | 2020
- 4654
-
Influence of Substrate Resistivity on Porous Silicon Small-Signal RF PropertiesGodet, Geoffroy / Augendre, Emmanuel / Lugo-Alvarez, Jose / Jacquinot, Helene / Gaillard, Frederic X. / Lorne, Thomas / Rolland, Emmanuel / Taris, Thierry / Servant, Florence et al. | 2020
- 4658
-
Free Carrier Mobility, Series Resistance, and Threshold Voltage Extraction in Junction FETsMakris, Nikolaos / Bucher, Matthias / Chevas, Loukas / Jazaeri, Farzan / Sallese, Jean-Michel et al. | 2020
- 4662
-
Local Variability Evaluation on Effective Channel Length Extracted With Shift-and-Ratio MethodBrito, Juan Pablo Martinez / Bampi, Sergio et al. | 2020
- 4667
-
Charge-Based Model for the Drain-Current Variability in Organic Thin-Film Transistors Due to Carrier-Number and Correlated- Mobility FluctuationNikolaou, Aristeidis / Darbandy, Ghader / Leise, Jakob / Pruefer, Jakob / Borchert, James W. / Geiger, Michael / Klauk, Hagen / Iniguez, Benjamin / Kloes, Alexander et al. | 2020
- 4672
-
Macromodel for AC and Transient Simulations of Organic Thin-Film Transistor Circuits Including Nonquasistatic EffectsLeise, Jakob / Pruefer, Jakob / Nikolaou, Aristeidis / Darbandy, Ghader / Klauk, Hagen / Iniguez, Benjamin / Kloes, Alexander et al. | 2020
- 4677
-
Compact Modeling and Behavioral Simulation of an Optomechanical Sensor in Verilog ADawale, Houssein Elmi / Sibeud, Loic / Regord, Sebastien / Jourdan, Guillaume / Hentz, Sebastien / Badets, Franck et al. | 2020
- 4682
-
TCAD Simulation Framework of Gas Desorption in CNT FET NO2 SensorsCarapezzi, Stefania / Reggiani, Susanna / Gnani, Elena / Gnudi, Antonio et al. | 2020
- 4687
-
Conductance in a Nanoribbon of Topologically Insulating MoS2 in the 1T’ PhaseSverdlov, Viktor / El-Sayed, Al-Moatasem Bellah / Kosina, Hans / Selberherr, Siegfried et al. | 2020
- 4691
-
Vₜ Extraction Methodologies Influence Process Induced Vₜ Variability: Does This Fact Still Hold for Advanced Technology Nodes?Bhoir, Mandar S. / Chiarella, Thomas / Mitard, Jerome / Horiguchi, Naoto / Mohapatra, Nihar Ranjan et al. | 2020
- 4696
-
Multidomain Negative Capacitance Effect in P(VDF-TrFE) Ferroelectric Capacitor and Passive Voltage AmplificationSingh, Khoirom Johnson / Bulusu, Anand / Dasgupta, Sudeb et al. | 2020
- 4701
-
Monte Carlo Comparison of n-Type and p-Type Nanosheets With FinFETs: Effect of the Number of SheetsBufler, F. M. / Jang, D. / Hellings, G. / Eneman, G. / Matagne, P. / Spessot, A. / Na, M. H. et al. | 2020
- 4705
-
Impact of Width Scaling and Parasitic Series Resistance on the Performance of Silicene Nanoribbon MOSFETsPoljak, Mirko et al. | 2020
- 4709
-
Improved Design of a Thermophotovoltaic DeviceLiao, Tianjun / Zhang, Houcheng / Wang, Zhi-Yong et al. | 2020
- 4713
-
Impact of Dummy Gate Removal and a Silicon Cap on the Low-Frequency Noise Performance of Germanium nFinFETsXie, Duan / Simoen, Eddy / Chen, Haifeng / Arimura, Hiroaki / Horiguchi, Naoto et al. | 2020
- 4720
-
Impact of Channel Hot-Hole Stressing on Gate-Oxide Trap’s EmissionJu, Xin / Ang, Diing Shenp / Gu, Chenjie et al. | 2020
- 4728
-
Device, Circuit, and Reliability Assessment of Drain-Extended FinFETs for Sub-14 nm System on Chip ApplicationsKumar, B. Sampath / Ajay / Paul, Milova / Somayaji, Jhnanesh / Gossner, Harald / Shrivastava, Mayank et al. | 2020
- 4736
-
Controlling the Effective Channel Thickness of Junctionless Transistors by Substrate BiasJeon, Dae-Young / Mouis, Mireille / Barraud, Sylvain / Ghibaudo, Gerard et al. | 2020
- 4741
-
A Stochastic Framework for the Time Kinetics of Interface and Bulk Oxide Traps for BTI, SILC, and TDDB in MOSFETsKumar, Satyam / Anandkrishnan, R. / Parihar, Narendra / Mahapatra, Souvik et al. | 2020
- 4749
-
TCAD Framework for HCD Kinetics in Low VD Devices Spanning Full VG/VD SpaceSharma, Uma / Duan, Meng / Diwakar, Himanshu / Thakor, Karansingh / Wong, Hiu Yung / Motzny, Steve / Dolgos, Denis / Mahapatra, Souvik et al. | 2020
- 4757
-
Analytical Modeling of Short-Channel Effects in MFIS Negative-Capacitance FET Including Quantum Confinement EffectsPandey, Nilesh / Chauhan, Yogesh Singh et al. | 2020
- 4765
-
The Impact of a Single Displacement Defect on Tunneling Field-Effect TransistorsKim, Jungsik / Han, Jin-Woo / Meyyappan, M. et al. | 2020
- 4770
-
Analysis of High-Frequency Measurement of Transistors Along With Electromagnetic and SPICE CosimulationFregonese, Sebastien / Cabbia, Marco / Yadav, Chandan / Deng, Marina / Panda, Soumya Ranjan / De Matos, Magali / Celi, Didier / Chakravorty, Anjan / Zimmer, Thomas et al. | 2020
- 4777
-
Reliability-Aware Statistical BSIM Compact Model Parameter Generation MethodologyDing, Jie / Asenov, Asen et al. | 2020
- 4784
-
Normally Off Hydrogen-Terminated Diamond Field-Effect Transistor With Ti/TiOx Gate MaterialsZhang, Minghui / Wang, Wei / Chen, Genqiang / Abbasi, Haris Naeem / Wang, Yanfeng / Lin, Fang / Wen, Feng / Wang, Kaiyue / Zhang, Jingwen / Bu, Renan et al. | 2020
- 4789
-
Low-Noise Si-JFETs Enhanced by Split-Channel ConceptSturm-Rogon, Leonhard / Neumeier, Karl / Kutter, Christoph et al. | 2020
- 4794
-
Modeling of Current Mismatch and 1/f Noise for Halo-Implanted Drain-Extended MOSFETsGupta, Chetan / Dey, Sagnik / Goel, Ravi / Hu, Chenming / Chauhan, Yogesh Singh et al. | 2020
- 4802
-
Low-Frequency Noise Assessment of Vertically Stacked Si n-Channel Nanosheet FETs With Different Metal GatesOliveira, Alberto / Veloso, Anabela / Claeys, Cor / Horiguchi, Naoto / Simoen, Eddy et al. | 2020
- 4808
-
Improved the C–V Curve Shift, Trap State Responsiveness, and Dynamic RON of SBDs by the Composite 2-D–3-D Channel Heterostructure Under the OFF-State StressYang, Ling / Zhang, Meng / Hou, Bin / Mi, Minhan / Wu, Mei / Zhu, Qing / Lu, Yang / Zhu, Jiejie / Zhou, Xiaowei / Lv, Ling et al. | 2020
- 4813
-
Deep-Recessed β-Ga₂O₃ Delta-Doped Field-Effect Transistors With In Situ Epitaxial PassivationJoishi, Chandan / Xia, Zhanbo / Jamison, John S. / Sohel, Shahadat H. / Myers, Roberto C. / Lodha, Saurabh / Rajan, Siddharth et al. | 2020
- 4820
-
Ga0.84In0.16As0.14Sb0.86/InAs0.91Sb0.09 Dual-Junction Device for Thermophotovoltaic Energy ConversionFan, Tingmei / Tian, Chengyi / Cui, Min / Wei, Tingting / Liu, Zhiqiang / Wang, Yu et al. | 2020
- 4827
-
Investigation of Defect Characteristics and Carrier Transport Mechanisms in GaN Layers With Different Carbon Doping ConcentrationWang, Hongyue / Hsu, Po-Chun / Zhao, Ming / Simoen, Eddy / Sibaja-Hernandez, Arturo / Wang, Jinyan et al. | 2020
- 4834
-
Design Guidelines and Performance Tradeoffs in Recessed AlGaN/GaN Schottky Barrier DiodesSoni, Ankit / K. M., Amogh / Shrivastava, Mayank et al. | 2020
- 4842
-
Design of a β-Ga2O3 Schottky Barrier Diode With p-Type III-Nitride Guard Ring for Enhanced BreakdownRoy, Saurav / Bhattacharyya, Arkka / Krishnamoorthy, Sriram et al. | 2020
- 4849
-
A Comprehensive Investigation on Short-Circuit Oscillation of p-GaN HEMTsXue, Peng / Maresca, Luca / Riccio, Michele / Breglio, Giovanni / Irace, Andrea et al. | 2020
- 4858
-
p-Diamond, Si, GaN, and InGaAs TeraFETsZhang, Yuhui / Shur, Michael S. et al. | 2020
- 4866
-
2-D Strain FET (2D-SFET) Based SRAMs—Part I: Device-Circuit InteractionsThakuria, Niharika / Schulman, Daniel / Das, Saptarshi / Gupta, Sumeet Kumar et al. | 2020
- 4875
-
2D Strain FET (2D-SFET)-Based SRAMs—Part II: Back Voltage-Enabled DesignsThakuria, Niharika / Schulman, Daniel / Das, Saptarshi / Gupta, Sumeet K. et al. | 2020
- 4884
-
Study on Multilevel Resistive Switching Behavior With Tunable ON/OFF Ratio Capability in Forming-Free ZnO QDs-Based RRAMWang, Wenxiao / Li, Yang / Yue, Wenjing / Gao, Song / Zhang, Chunwei / Chen, Zhenxiang / Chen, Yuehui et al. | 2020
- 4891
-
Impact of Mechanical Stress on 3-D NAND Flash Current ConductionKruv, Anastasiia / Arreghini, Antonio / Verreck, Devin / Gonzalez, Mario / Van den bosch, Geert / De Wolf, Ingrid / Rosmeulen, Maarten et al. | 2020
- 4897
-
Impact of Program/Erase Cycling Interval on the Transconductance Distribution of NAND Flash Memory DevicesChiu, Yung-Yueh / Chang, Kai-Chieh / Lin, Hsin-Jyun / Tsai, Hung-Te-En / Lin, Po-Jui / Li, Hsin-Chiao / Takeshita, Toshiaki / Yano, Masaru / Shirota, Riichiro et al. | 2020
- 4904
-
Bidirectional Analog Conductance Modulation for RRAM-Based Neural NetworksJiang, Zizhen / Wang, Ziwen / Zheng, Xin / Fong, Scott W. / Qin, Shengjun / Chen, Hong-Yu / Ahn, Ethan C. / Cao, Ji / Nishi, Yoshio / Wong, S. Simon et al. | 2020
- 4911
-
Investigation of Imprint in FE-HfO₂ and Its RecoveryHigashi, Y. / Kaczer, B. / Verhulst, A. S. / O'Sullivan, B. J. / Ronchi, N. / McMitchell, S. R. C. / Banerjee, K. / Piazza, L. Di / Suzuki, M. / Linten, D. et al. | 2020
- 4918
-
An Inkjet-Printed Full-Wave Rectifier for Low-Voltage Operation Using Electrolyte-Gated Indium-Oxide Thin-Film TransistorsFeng, Xiaowei / Scholz, Alexander / Tahoori, Mehdi B. / Aghassi-Hagmann, Jasmin et al. | 2020
- 4924
-
Improved Field-Effect Mobility of In–Ga–Zn–O TFTs by Oxidized Metal LayerPark, Ji-Min / Kim, Hyoung-Do / Jang, Seong Cheol / Kim, Min Jung / Chung, Kwun-Bum / Kim, Yong Joo / Kim, Hyun-Suk et al. | 2020
- 4929
-
An 18.6-μm-Pitch Gate Driver Using a-IGZO TFTs for Ultrahigh-Definition AR/VR DisplaysChen, Yuanfeng / Kim, Hyunho / Lee, Jiseob / Lee, Suhui / Do, Youngbin / Choi, Munsu / Jang, Jin et al. | 2020
- 4934
-
Long-Term Aging of Al2O3 Passivated and Unpassivated Flexible a-IGZO TFTsCosta, Julio Cesar / Kermani, Arash Pour Yazdan Panah / Cantarella, Giuseppe / Petti, Luisa / Vogt, Christian / Daus, Alwin / Knobelspies, Stefan / Troster, Gerhard / Munzenrieder, Niko S. et al. | 2020
- 4940
-
Comparison of Dark Current Random Telegraph Signals in Silicon and InSb-Based Photodetector Pixel ArraysDurnez, Clementine / Goiffon, Vincent / Virmontois, Cedric / Magnan, Pierre / Rubaldo, Laurent et al. | 2020
- 4947
-
Improvement of the Deep UV Sensor Performance of a β-Ga2O3 Photodiode by Coupling of Two Planar DiodesVieira, Douglas H. / Badiei, Nafiseh / Evans, Jonathan E. / Alves, Neri / Kettle, Jeff / Li, Lijie et al. | 2020
- 4953
-
Study of GaN-Based Light-Emitting Diode (LED) With a Hybrid Surface StructureChen, Wei-Cheng / Niu, Jing-Shiuan / Liu, I-Ping / Lee, Yu-Lin / Cheng, Shiou-Ying / Guo, Der-Feng / Liu, Wen-Chau et al. | 2020
- 4958
-
Efficiency Droop Suppression and Light Output Power Enhancement of Deep Ultraviolet Light-Emitting Diode by Incorporating Inverted-V-Shaped Quantum BarriersKang, Yang / Yu, Huabin / Ren, Zhongjie / Xing, Chong / Liu, Zhongling / Jia, Hongfeng / Guo, Wei / Sun, Haiding et al. | 2020
- 4963
-
Performance Investigation of Bulk Photoconductive Semiconductor Switch Based on Reversely Biased p+-i-n+ StructureHu, Long / Xu, Ming / Li, Xin / Wang, Yaogong / Wang, Yi / Dong, Hangtian / Schneider, Harald et al. | 2020
- 4970
-
High-Performance Inverted Structure Broadband Photodetector Based on ZnO Nanorods/PCDTBT:PCBM:PbS QDsUpadhyay, Deep Chandra / Upadhyay, Rishibrind Kumar / Singh, Abhinav Pratap / Jit, Satyabrata et al. | 2020
- 4977
-
The Effect of the Carrier Drift Velocity Saturation in High-Power Semiconductor Lasers at Ultrahigh Drive CurrentsSoboleva, Olga S. / Zolotarev, Vasily V. / Golovin, Vyacheslav S. / Slipchenko, Sergey O. / Pikhtin, Nikita A. et al. | 2020
- 4983
-
Investigation on Photoanode Modified With TiO2–ZnO–Ag Nanofibers in Dye-Sensitized Solar Cell Under Different Intensities of IlluminationsNien, Yu-Hsun / Hu, Geng-Ming / Rangasamy, Manjunath / Yong, Zhen-Rong / Chou, Jung-Chuan / Lai, Chih-Hsien / Kuo, Po-Yu / Chang, Jun-Xiang / Lin, Yu-Che et al. | 2020
- 4990
-
Simulation Study on the Optimization and Scaling Behavior of LDMOS Transistors for Low-Voltage Power ApplicationsSaadat, Ali / Van de Put, Maarten L. / Edwards, Hal / Vandenberghe, William G. et al. | 2020
- 4998
-
New Strained LDMOS With Ultralow ON-Resistance by Si1−yCy Source Stressor for About 20 V Low-Voltage ApplicationsLi, Mingzhe / Duan, Baoxing / Song, Haitao / Wang, Yandong / Yang, Yintang et al. | 2020
- 5005
-
Design and Fabrication Approaches of 400–600 V 4H-SiC Lateral MOSFETs for Emerging Power ICs ApplicationYun, Nick / Sung, Woongje et al. | 2020
- 5012
-
Measurement and Analysis for Time Jitter of Reversely Switched DynistorPi, Yicheng / Liang, Lin / Yan, Xiaoxue / Huang, Xinyuan et al. | 2020
- 5020
-
A Novel Dual-Directional SCR Structure With High Holding Voltage for 12-V Applications in 0.13-μm BCD ProcessDo, Kyoung-Il / Song, Bo-Bae / Koo, Yong-Seo et al. | 2020
- 5028
-
AC-SSRM 2-D Cross-Sectional Doping Profiling for DRAM Access Devices Contact ImplantsQin, Shu et al. | 2020
- 5033
-
Electrical Properties of Al2O3/ZnO Metal–Insulator–Semiconductor CapacitorsZhang, Qihao / Lu, Jiwu / Zhai, Dongyuan / Xiao, Jing / He, Min / Liu, Jiangwei et al. | 2020
- 5039
-
Investigation of Ultrathin Ni Germanosilicide for Advanced pMOS Contact MetallizationMao, Shujuan / Zhao, Chao / Liu, Jinbiao / Wang, Guilei / Li, Ben / Liu, Weibing / Li, Menghua / Liu, Yaodong / Zhang, Dan / Xu, Jing et al. | 2020
- 5045
-
Passivation of n- and p-Type Silicon Surfaces With Spray-Coated Sol-Gel Silicon Oxide Thin FilmBhajipale, Jayshree / Kottantharayil, Anil et al. | 2020
- 5053
-
Low Contact Resistivity to Ge Using In-Situ B and Sn Incorporation by Chemical Vapor DepositionTsai, Chung-En / Lu, Fang-Liang / Liu, Yi-Chun / Ye, Hung-Yu / Liu, C. W. et al. | 2020
- 5059
-
Enhancing Threshold Switching Characteristics and Stability of Vanadium Oxide-Based Selector With Vanadium ElectrodeYeh, Tsung-Han / Chen, Po-Hsun / Lin, Chih-Yang / Tseng, Yi-Ting / Chen, Wen-Chung / Lin, Chun-Chu / Chang, Ting-Chang / Lee, Ching-Ting / Lee, Hsin-Ying et al. | 2020
- 5063
-
Fabrication of Ferroelectric Liquid Crystal ThermistorMuchenedi, Hari Kishor / N., Pongali Sathya Prabu / Madhu Mohan, M. L. N. et al. | 2020
- 5069
-
An Efficient Thermal Model for Multifinger SiGe HBTs Under Real Operating ConditionK, Nidhin / Pande, Shubham / Yadav, Shon / Balanethiram, Suresh / Nair, Deleep R. / Fregonese, Sebastien / Zimmer, Thomas / Chakravorty, Anjan et al. | 2020
- 5076
-
Experimental Study of the Direct-Charge Beta Radiation Method for Energy HarvestingHaim, Yedidia / deBotton, Gal et al. | 2020
- 5082
-
Compact Modeling of Short-Channel Effects in Staggered Organic Thin-Film TransistorsPruefer, Jakob / Leise, Jakob / Darbandy, Ghader / Nikolaou, Aristeidis / Klauk, Hagen / Borchert, James W. / Iniguez, Benjamin / Gneiting, Thomas / Kloes, Alexander et al. | 2020
- 5091
-
Modeling of Both Arrhenius and Non-Arrhenius Temperature-Dependent Drain Current for Organic Thin-Film TransistorsHe, Hongyu / Xiong, Chao / Yin, Junli / Wang, Xinlin / Lin, Xinnan / Zhang, Shengdong et al. | 2020
- 5097
-
Electromicrofluidic Device on Multilayered Laser-Induced Polyamide Substrate for Diverse Electrochemical ApplicationsKothuru, Avinash / Amreen, Khairunnisa / Goel, Sanket et al. | 2020
- 5104
-
The Analysis of Potentiometric Flexible Arrayed Urea Biosensor Modified by Graphene Oxide and γ-Fe2O3 NanoparticlesNien, Yu-Hsun / Su, Tzu-Yu / Ho, Chih-Sung / Chou, Jung-Chuan / Lai, Chih-Hsien / Kuo, Po-Yu / Kang, Zhi-Xuan / Dong, Zhe-Xin / Lai, Tsu-Yang / Wang, Chu-Hsuan et al. | 2020
- 5111
-
Amplified Methanol Sensitivity in Reduced Graphene Oxide FET Using Appropriate Gate ElectrostaticHazra, Arnab et al. | 2020
- 5119
-
A New Emission Mechanism for Island-Metal-Film-Based Electron SourcesZhan, Fangyuan / Li, Zhiwei / Wang, Yuwei / Yang, Wei / Wei, Xianlong et al. | 2020
- 5125
-
Suspended Nanoscale Field Emitter Devices for High-Temperature OperationDe Rose, Lucia B. / Scherer, Axel / Jones, William M. et al. | 2020
- 5132
-
Wafer-Scale Fabricated On-Chip Thermionic Electron Sources With an Integrated Extraction GateWang, Yuwei / Liu, Wenchao / Xiang, Li / Zhao, Zhenzheng / Li, Zhiwei / Yang, Wei / Zhou, Duanliang / Liu, Peng / Wei, Xianlong et al. | 2020
- 5138
-
Facile Fabrication and High Field Emission Performance of 2-D Ti₃C₂Tₓ MXene Nanosheets for Vacuum Electronic DevicesWu, Han / Shen, Siqi / Xu, Xiyan / Qiao, Chunyang / Chen, Xiaohong / Li, Jun / Li, Wenwu / Ou-Yang, Wei et al. | 2020
- 5144
-
Simulations of the Multipactor Effect in Ferrite Circulator Junction With Wedge-Shaped Cross Section GeometryRen, Haiping / Xie, Yongjun et al. | 2020
- 5151
-
Magnetron Injection Gun for High-Power GyroklystronZhang, Liang / Nix, Laurence J. R. / Cross, Adrian W. et al. | 2020
- 5158
-
Bidirectional Volatile Signatures of Metal–Oxide Memristors—Part I: CharacterizationGiotis, Christos / Serb, Alex / Stathopoulos, Spyros / Michalas, Loukas / Khiat, Ali / Prodromakis, Themis et al. | 2020
- 5166
-
Bidirectional Volatile Signatures of Metal-Oxide Memristors—Part II: ModelingGiotis, C. / Serb, A. / Stathopoulos, S. / Prodromakis, T. et al. | 2020
- 5174
-
SPICE-Based Multiphysics Model to Analyze the Dynamics of Ferroelectric Negative-Capacitance–Electrostatic MEMS Hybrid ActuatorsRaman, Raghuram Tattamangalam / Ajoy, Arvind et al. | 2020
- 5182
-
Compact Modeling and Electrothermal Measurements of Indirectly Heated Phase-Change RF SwitchesWainstein, Nicolas / Ankonina, Guy / Kvatinsky, Shahar / Yalon, Eilam et al. | 2020
- 5188
-
A Comprehensive Physics-Based Current–Voltage SPICE Compact Model for 2-D-Material-Based Top-Contact Bottom-Gated Schottky-Barrier FETsAhsan, Sheikh Aamir / Singh, Shivendra Kumar / Yadav, Chandan / Marin, Enrique G. / Kloes, Alexander / Schwarz, Mike et al. | 2020
- 5196
-
High-Quality CVD-MoS2 Synthesized on Surface-Modified Al2O3 for High-Performance MoS2 Field-Effect TransistorsSong, Xingjuan / Xu, Jingping / Liu, Lu et al. | 2020
- 5201
-
Hall Effect Measurements in Rotating Magnetic Field on Sub-30-nm Silicon Nanowires Fabricated by a Top–Down ApproachVerma, Akshara / Borisov, Kiril / Connaughton, Stephen / Stamenov, Plamen et al. | 2020
- 5209
-
Armchair Graphene Nanoribbon Gate-Controllable RTD With Boron Nitride BarriersMonfared, M. H. Ghasemian / Hosseini, Seyed Ebrahim et al. | 2020
- 5216
-
Flexible Oxide-Based Schottky Neuromorphic TFTs With Configurable Spiking Dynamic FunctionsHe, Yongli / Zhu, Ying / Chen, Chunsheng / Liu, Rui / Jiang, Shanshan / Zhu, Li / Shi, Yi / Wan, Qing et al. | 2020
- 5221
-
Design and Investigation of Split-Gate MoTe2-Based FET as Single Transistor AND Gate Using Nonequilibrium Green’s FunctionKumar, Prateek / Gupta, Maneesha / Singh, Kunwar / Kumar, Naveen et al. | 2020
- 5229
-
Speed Up Quantum Transport Device Simulation on Ferroelectric Tunnel Junction With Machine Learning MethodsWu, Tong / Guo, Jing et al. | 2020
- 5236
-
Exploration of Negative Capacitance in Gate-All-Around Si Nanosheet TransistorsSakib, Fahimul Islam / Hasan, Md. Azizul / Hossain, Mainul et al. | 2020
- 5243
-
Impacts of Stress Voltage and Channel Length on Hot-Carrier Characteristics of Tunnel Field-Effect Thin-Film TransistorMa, William Cheng-Yu / Luo, Shen-Ming et al. | 2020
- 5247
-
Low Temperature Processing of Electronic Materials for Cuttung Edge Devices| 2020
- 5249
-
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on New simulation methodologies for next-generation TCAD tools| 2020
- 5251
-
TechRxiv: Share Your Preprint Research with the World!| 2020
- 5252
-
Introducing IEEE Collabratec| 2020
- C1
-
Table of contents| 2020
- C2
-
IEEE Transactions on Electron Devices publication information| 2020
- C3
-
IEEE Transactions on Electron Devices information for authors| 2020