A Rigorous Analysis of Least Squares Sine Fitting Using Quantized Data: The Random Phase Case (Englisch)
- Neue Suche nach: Carbone, Paolo
- Neue Suche nach: Schoukens, Johan
- Neue Suche nach: Carbone, Paolo
- Neue Suche nach: Schoukens, Johan
In:
IEEE Transactions on Instrumentation and Measurement
;
63
, 3
;
512-530
;
2014
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:A Rigorous Analysis of Least Squares Sine Fitting Using Quantized Data: The Random Phase Case
-
Beteiligte:Carbone, Paolo ( Autor:in ) / Schoukens, Johan ( Autor:in )
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Erschienen in:IEEE Transactions on Instrumentation and Measurement ; 63, 3 ; 512-530
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Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsdatum:01.03.2014
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Format / Umfang:1495897 byte
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 63, Ausgabe 3
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