Bayesian Analysis of a Simple Step-Stress Model Under Weibull Lifetimes (Englisch)
- Neue Suche nach: Ganguly, A.
- Neue Suche nach: Kundu, D.
- Neue Suche nach: Mitra, S.
- Neue Suche nach: Ganguly, A.
- Neue Suche nach: Kundu, D.
- Neue Suche nach: Mitra, S.
In:
IEEE Transactions on Reliability
;
64
, 1
;
473-485
;
2015
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Bayesian Analysis of a Simple Step-Stress Model Under Weibull Lifetimes
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Beteiligte:
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Erschienen in:IEEE Transactions on Reliability ; 64, 1 ; 473-485
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Verlag:
- Neue Suche nach: IEEE
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Erscheinungsdatum:01.03.2015
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Format / Umfang:3404775 byte
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis – Band 64, Ausgabe 1
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