Virtual Process-Based Spacer & Junction Optimization for an Inverter Circuit (Englisch)
- Neue Suche nach: Guissi, S.
- Neue Suche nach: Schram, T.
- Neue Suche nach: Schuddinck, P.
- Neue Suche nach: Demuynck, S.
- Neue Suche nach: Meijer, P.
- Neue Suche nach: Guissi, S.
- Neue Suche nach: Schram, T.
- Neue Suche nach: Schuddinck, P.
- Neue Suche nach: Demuynck, S.
- Neue Suche nach: Meijer, P.
-
ISBN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Virtual Process-Based Spacer & Junction Optimization for an Inverter Circuit
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Beteiligte:Guissi, S. ( Autor:in ) / Schram, T. ( Autor:in ) / Schuddinck, P. ( Autor:in ) / Demuynck, S. ( Autor:in ) / Meijer, P. ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: IEEE
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Erscheinungsdatum:01.04.2020
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Format / Umfang:1166021 byte
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ISBN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
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High Frequency Monolithic Inductor with Air-GapsPrawoto, Clarissa / Ma, Zichao / Xiao, Ying / Raju, Salahuddin / Zhou, Changjian / Chan, Mansun et al. | 2020
- 1
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4th Electron Devices Technology and Manufacturing Conference| 2020
- 1
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RSDFT-NEGF Quantum Transport Simulation of Ultra-Small Field-Effect TransistorsMori, Nobuya / Mil'nikov, Gennady / Iwata, Jun-Ichi / Oshiyama, Atsushi et al. | 2020
- 1
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Modeling and Design of SiC-based High-Frequency Photoconductive SwitchesRakheja, S. / Huang, L. / Hau-Riege, S. / Harrison, S. E. / Voss, L. F. / Conway, A. M. et al. | 2020
- 1
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Impact of Source/Drain Underlap on the Ballistic Performance of Silicon and Germanium-Tin Nanowire p-MOSFETsYadav, Dibakar / Nair, Deleep R. et al. | 2020
- 1
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Ferroelectric Gate Heterojunction TFET on Selective Buried Oxide (SELBOX) Substrate for Distortionless and Low Power ApplicationsSingh, Ashish Kumar / Tripathy, Manas Ranjan / Baral, Kamalaksha / Singh, Prince Kumar / Jit, S. et al. | 2020
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A microscopic “toy” model of ferroelectric negative capacitanceHoffmann, Michael / Ravindran, Prasanna Venkatesan / Khan, Asif Islam et al. | 2020
- 1
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Performances of Self-Aligned Top-Gate a-IGZO TFTs with Ultrathin PECVD SiO2 Gate DielectricZhang, Yuqing / Peng, Hao / Yang, Huan / Cao, Yunkai / Qin, Ludong / Fu, Haishi / Lu, Lei / Zhang, Shengdong et al. | 2020
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Residual Stress Analysis and Structural Parameters Optimization of Corrugated Diaphragms Applied to MEMs DeviceTang, Chuying / Wang, Liang / Cai, Yao / Zhang, Yi / Wang, Qing / Sun, Chengliang / Yu, Hongyu et al. | 2020
- 1
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Engineering Nanomaterials and Nanostructures for Electronic Applications: A Case Study of Carbon Nanotubes for Memory DevicesSen, Rahul / Kocab, Thomas / Black, Jennifer / McDermott, Joseph / Pal, Sushanta K. / Buffat, Steve / Gilmer, David C. / Rueckes, Thomas et al. | 2020
- 1
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Research Toward Monolithic Three-Dimensional ICsLi, Lance et al. | 2020
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Analysis and Failure Modes of Highly Degraded PV Modules Inspected during the 2018 All India Survey of PV Module ReliabilityGolive, Yogeswara Rao / Zachariah, Sachin / Bhaduri, Sonali / Dubey, Rajiv / Chattopadhyay, Shashwata / Singh, Hemant K. / Kottantharayil, Anil / Shiradkar, Narendra / Vasi, Juzer et al. | 2020
- 1
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Systematic Defect Manipulation in Metal Oxide Semiconductors towards High-Performance Thin-Film TransistorsZhang, Yuqing / Xia, Zhihe / Li, Jiapeng / Shao, Yang / Wang, Sisi / Lu, Lei / Zhang, Shengdong / Kwok, Hoi-Sing / Wong, Man et al. | 2020
- 1
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An agile and scalable manufacturing model to support 5G growthAndia, Luis / Mazure, Carlos / Radu, Ionut / Meil, Jean-Marc Le et al. | 2020
- 1
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Perpendicular STT-MRAM Switching at Fixed Voltage and at Fixed CurrentFiorentini, S. / de Orio, R.L. / Selberherr, S. / Ender, J. / Goes, W. / Sverdlov, V. et al. | 2020
- 1
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The Benefits of Using SiN as a Buried Oxide in Germanium-On-Insulator SubstrateDuangchan, Sethavut / Yamamoto, Keisuke / Wang, Dong / Nakashima, Hiroshi / Baba, Akiyoshi et al. | 2020
- 1
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2D MoWSe2Material Photoluminescence Characterization based on MOS DeviceWang, Xinzhua / Tuo, Zhouhui / Hu, Canbin / Liu, Hongwei et al. | 2020
- 1
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Fully Printed Vertical Transport Edge FETs for High Power Oxide ElectronicsDevabharathi, Nehru / Mondal, Sandeep Kumar / Pradhan, Jyoti Ranjan / Dasgupta, Subho et al. | 2020
- 1
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High Performance Printed Electronics on Large Area Flexible SubstratesSoni, Mahesh / Shakthivel, Dhayalan / Christou, Adamos / Zumeit, Ayoub / Yogeswaran, Nivasan / Dahiya, Ravinder et al. | 2020
- 1
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Optimization of Electron Transport Layers for High Performance Perovskite Solar CellsAidarkhanov, Damir / Maxim, Askar / Ren, Zhiwei / Yelzhanova, Zhuldyz / Ualibek, Oral / Daniyar, Bayan / Saibitihan, Aheyeerke / Balanay, Mannix / Djurisic, Aleksandra / Surya, Charles et al. | 2020
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Organized by| 2020
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Back Gate Tunable Thin Film $\alpha$ – Si Nanowire BioFET for pH Detection By Compatible CMOS Fabrication ProcessShafi, Nawaz / Parmaar, Jaydeep Singh / Porwal, Ankita / Bhat, Aasif Mohammad / Sahu, Chitrakant / Periasamy, C. / Majumdar, Shubhankar et al. | 2020
- 1
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Fabrication and Characterization of SnO2/CH3NH3PbI3 based PhotodetectorUpadhyay, Rishibrind Kumar / Singh, Abhinav Pratap / Upadhyay, Deepchandra / Ratan, Smrity / Jit, Satyabrata et al. | 2020
- 1
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The “Extrinsic” Compact Model of the MOSFET Drain Current Based on a New Interpolation Expression for the Transition Between Linear and Saturation Regimes with a Monotonic Decrease of the Differential Conductance to a Nonzero ValueTurin, Valentin O. / Shkarlat, Roman S. / Zebrev, Gennady I. / Iniguez, Benjamin / Shur, Michael S. et al. | 2020
- 1
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Engineering Atom Scale Defects in Materials for Future Electronic DevicesPramanik, Dipankar / Nardi, Federico / Padovani, Andrea et al. | 2020
- 1
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Adhesion Study on Different Surface Treatment by Button Shear TestLee, Lim Wei / Cheat, Lee Wei et al. | 2020
- 1
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Impact of LER on Mismatch in Nanosheet Transistors for 5nm-CMOSJha, Chandan Kumar / Gupta, Charu / Gupta, Anshul / Vega, Reinaldo A / Dixit, Abhisek et al. | 2020
- 1
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An Accurate Structure Generation and Simulation of LER affected NWFETJain, Agam / Inge, Shashank V. / Amita / Ganguly, Udayan et al. | 2020
- 1
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A Novel Snapback-Free Reverse-Conducting IGBT with Si/SiC HeterojunctionZhang, Jinping / Luo, Junyi / Chen, Zixun / Li, Zehong / Zhang, Bo et al. | 2020
- 1
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Geometrical influence on Self Heating in Nanowire and Nanosheet FETs using TCAD SimulationsKang, Min Jae / Myeong, Ilho / Fobelets, Kristel et al. | 2020
- 1
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3-Dimensional 4H-SiC MOSFETs for Harsh Environment ElectronicsIdris, M. I. / Horsfall, A. B. et al. | 2020
- 1
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Manufacturing of Super Growth Carbon Nanotubes and its Aqueous Solution for Electronic DevicesMurakawa, RShigemi et al. | 2020
- 1
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Implantable Fluorescent CMOS Imaging DeviceSasagawa, Kiyotaka / Haruta, Makito / Ohta, Yasumi / Takehara, Hironari / Ohta, Jun et al. | 2020
- 1
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Rapid Yield Improvement Using Intelligent Data MiningJain, Vivek et al. | 2020
- 1
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Design and Fabrication of Self-Organized Ge Gate/SiO2/Si1-xGex-nanoshell with Raised Source/Drain for Advanced TransistorsWang, I-Hsiang / Peng, Keng-Ping / Lin, Horng-Chih / Li, Pei-Wen et al. | 2020
- 1
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Modeling Thermal Behavior in Multi-layered GaN HEMT-like StructuresNidhin, K / Balanethiram, Suresh / Nair, Deleep R. / Chakravorty, Anjan et al. | 2020
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Compact Model of Read Disturbance by Hot Carrier Injection in 3D NAND Flash MemoryPark, Jaeyeol / Son, Dokyun / Kim, Minsoo / Jo, Hyungjun / Shin, Hyungcheol et al. | 2020
- 1
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High Gain Optical Sensors Enabled by Subthreshold Operation of Photodiode-Gated TransistorsWang, Kai / Liu, Jinming / Hu, Yunfeng / Xu, Yangbing / Qi, Yihong / Xu, Yitong / Zhou, Xianda et al. | 2020
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Improvement in Electrical Properties of A1/La2O3/ZrO2/ Gate Stack Deposited on LaON Passivated GaAs SubstrateBarhate, Viral N. / Agrawal, Khushabu S. / Patil, Vilas S. / Mahajan, Ashok M. et al. | 2020
- 1
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System-level Power Integrity Optimization Based on High-Density Capacitors for enabling HPC/AI applicationsMoon, Sungwook / Nam, Seungki / Son, Jungil / Srikant, Sumant et al. | 2020
- 1
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Neural Network Based Design Optimization of 14-nm Node Fully-Depleted SOI FET for SoC and 3DIC applicationsYun, Hyeok / Yoon, Jun-Sik / Jeong, Jinsu / Lee, Seunghwan / Choi, Hyun-Chul / Baek, Rock-Hyun et al. | 2020
- 1
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Ferroelectric-HfO2Devices Technology and Manufacturing for Memory and Logic ApplicationsMigita, Shinji et al. | 2020
- 1
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Ultralow-Power All-Inkjet-Printed Organic Thin-Film Transistors for WearablesJiang, Chen / Cheng, Xiang / Tsangarides, Constantinos P. / Su, Yang / Ma, Hanbin / Nathan, Arokia et al. | 2020
- 1
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Significance of L-valley charges and a method to include it in electrostatic model of III-V GAA FETsGaneriwala, Mohit D. / Ruiz, Francisco G. / Marin, Enrique G. / Mohapatra, Nihar R. et al. | 2020
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Near Threshold Design Technology Optimization in 12LP ProcessJain, Navneet / Fetherston, Richard / Bagmar, Deepesh / Mudhireddy, Venkata Naresh / Rashed, Mahbub et al. | 2020
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Enhanced WLCSP Reliability for RF ApplicationsWu, Zhuo-Jie / Malinowski, John / Questad, David et al. | 2020
- 1
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Digital Type CMOS-MEMS Cointegrated Pressure Sensor Fabricated Using Cost-Effective Minimal-Fab ProcessLiu, Y. X. / Akita, I. / Matsukawa, T. / Tanaka, H. / Koga, K. / Nemoto, M. / Khumpuang, S. / Nagao, M. / Morita, Y. / Hara, S. et al. | 2020
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Multilithic 3D and Heterogeneous Integration Using Capillary Self-AssemblyFukushima, Takafumi et al. | 2020
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(Invited) 3D-NAND Reliability: Review of key mechanisms and mitigationsRaghunathan, Shyam et al. | 2020
- 1
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Backstepping Position Control of High Frequency Piezoelectric Actuator Used in Ultrasonically Assisted ManufacturingSalah, Mohammad / Saleem, Ashraf et al. | 2020
- 1
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Novel Hybrid MTJ-CMOS Based Programmable Gain Amplifier for Portable ApplicationsVerma, Shivam et al. | 2020
- 1
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A Complete Model of Gate Controlled Lateral PNP Devices in CMOS Technology Valid in All Regions of OperationTan, Wei Zheng / Yew Tan, Philip Beow / Rustagi, Subhash C et al. | 2020
- 1
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A Low Computational Cost Visual Tracking Algorithm Designed for a Multiple Mode Brain-Machine-InterfaceWang, Xuecheng / Zhang, Milin / Peng, Liangrui / Richardson, Andrew G. / Lucas, Timothy H. / Van der Spiegel, Jan et al. | 2020
- 1
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Fabrication and Characterization of Ferroelectric HfZrO-based Synaptic Transistors with Multi-state PlasticityLu, Tianqi / Liang, Renrong / Zhao, Ruiting / Yang, Yi / Ren, Tian-Ling et al. | 2020
- 1
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Logic Block Level Design-Technology Co-Optimization is the New Moore's Law (Invited)Moroz, Victor / Lin, Xi-Wei / Dam, Thuc et al. | 2020
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Sponsors & Exhibitors| 2020
- 7
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Committees| 2020
- 12
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2020 IEEE Electron Devices Technology and Manufacturing Conference (EDTM)| 2020