$1/f$ Noise and Defects in Microelectronic Materials and Devices (Englisch)
Freier Zugriff
- Neue Suche nach: Fleetwood, D. M.
- Neue Suche nach: Fleetwood, D. M.
In:
IEEE Transactions on Nuclear Science
;
62
, 4
;
1462-1486
;
2015
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:$1/f$ Noise and Defects in Microelectronic Materials and Devices
-
Beteiligte:Fleetwood, D. M. ( Autor:in )
-
Erschienen in:IEEE Transactions on Nuclear Science ; 62, 4 ; 1462-1486
-
Verlag:
- Neue Suche nach: IEEE
-
Erscheinungsdatum:01.08.2015
-
Format / Umfang:4688684 byte
-
ISSN:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Elektronische Ressource
-
Sprache:Englisch
-
Datenquelle:
Inhaltsverzeichnis – Band 62, Ausgabe 4
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1437
-
Table of Contents| 2015
- 1439
-
2015 Special Issue of the IEEE Transactions on Nuclear Science Modeling and Simulation of Radiation Effects Editor CommentsFleetwood, Dan / Brown, Dennis / Girard, Sylvain / Gouker, Pascale / Gerardin, Simone / Quinn, Heather / Barnaby, Hugh et al. | 2015
- 1439
-
The papers in this special issue extend the state of the art in modeling and simulation of radiation effects on microelectronics. these papers cover a broad range of topics, including single event effects, total ionizing dose effects, displacement damage effects, defects in microelectronic devices, and electromagnetic pulse effectsFleetwood, Dan et al. | 2015
- 1439
-
2015 Special Issue of IEEE Transactions on Nuclear Science Modeling and Simulation of Radiation Effects Editor CommentsFleetwood, Dan et al. | 2015
- 1440
-
List of Reviewers| 2015
- 1441
-
Physical Processes and Applications of the Monte Carlo Radiative Energy Deposition (MRED) CodeReed, Robert A. / Weller, Robert A. / Mendenhall, Marcus H. / Fleetwood, Daniel M. / Warren, Kevin M. / Sierawski, Brian D. / King, Michael P. / Schrimpf, Ronald D. / Auden, Elizabeth C. et al. | 2015
- 1462
-
$1/f$ Noise and Defects in Microelectronic Materials and DevicesFleetwood, D. M. et al. | 2015
- 1487
-
Validation Techniques for Fault Emulation of SRAM-based FPGAsQuinn, Heather / Wirthlin, Michael et al. | 2015
- 1501
-
Compact Modeling of Total Ionizing Dose and Aging Effects in MOS TechnologiesSanchez Esqueda, I. / Barnaby, H. J. / King, M. P. et al. | 2015
- 1516
-
ECORCE: A TCAD Tool for Total Ionizing Dose and Single Event Effect ModelingMichez, A. / Dhombres, S. / Boch, J. et al. | 2015
- 1528
-
Modeling Single Event Transients in Advanced Devices and ICsArtola, L. / Gaillardin, M. / Hubert, G. / Raine, M. / Paillet, P. et al. | 2015
- 1540
-
Modeling of Single Event Transients With Dual Double-Exponential Current Sources: Implications for Logic Cell CharacterizationBlack, Dolores A. / Robinson, William H. / Wilcox, Ian Z. / Limbrick, Daniel B. / Black, Jeffrey D. et al. | 2015
- 1550
-
Simulation of Laser-Based Two-Photon Absorption Induced Charge Carrier Generation in SiliconHales, Joel M. / Khachatrian, Ani / Roche, Nicolas J-H. / Warner, Jeffrey / Buchner, Stephen P. / McMorrow, Dale et al. | 2015
- 1558
-
Limitations of LET in Predicting the Radiation Response of Advanced DevicesFunkhouser, Erik D. / Weller, Robert A. / Reed, Robert A. / Schrimpf, Ronald D. / Mendenhall, Marcus H. / Asai, Makoto et al. | 2015
- 1568
-
Estimating SEE Error Rates for Complex SoCs With ASERTCabanas-Holmen, Manuel / Cannon, Ethan H. / Amort, Tony / Ballast, Jon / Brees, Roger et al. | 2015
- 1577
-
Circuit Simulation Based Validation of Flip-Flop Robustness to Multiple Node Charge CollectionShambhulingaiah, Sandeep / Lieb, Christopher / Clark, Lawrence T. et al. | 2015
- 1589
-
Geometry-Aware Single-Event Enabled Compact Models for Sub-50 nm Partially Depleted Silicon-on-Insulator TechnologiesKauppila, Jeffrey S. / Massengill, Lloyd W. / Ball, Dennis R. / Alles, Michael L. / Schrimpf, Ronald D. / Loveless, T. Daniel / Maharrey, Jeffrey A. / Quinn, Rachel C. / Rowe, Jason D. et al. | 2015
- 1599
-
Single Event Latch-Up Hardening Using TCAD Simulations in 130 nm and 65 nm Embedded SRAM in Flash-Based FPGAsRezzak, Nadia / Wang, Jih-Jong et al. | 2015
- 1609
-
Automatic Single Event Effects Sensitivity Analysis of a 13-Bit Successive Approximation ADCMarquez, F. / Munoz, F. / Palomo, F. R. / Sanz, L. / Lopez-Morillo, E. / Aguirre, M. A. / Jimenez, A. et al. | 2015
- 1617
-
A Methodology to Emulate Single Event Upsets in Flip-Flops Using FPGAs through Partial Reconfiguration and InstrumentationSerrano, Felipe / Clemente, Juan Antonio / Mecha, Hortensia et al. | 2015
- 1625
-
SPICE Simulations of Single Event Transients in Bipolar Analog Integrated Circuits Using Public Information and Free Open Source ToolsFranco, Francisco J. / Palomar, Carlos / Izquierdo, Jesus G. / Agapito, Juan A. et al. | 2015
- 1634
-
Numerical Simulation of 14.1 MeV Neutron Irradiation Effects on Electrical Characteristics of PIPS Detector for Plasma X-Ray TomographyRaja, P. Vigneshwara / Murty, N. V. L. Narasimha / Rao, C. V. S / Abhangi, Mitul et al. | 2015
- 1642
-
Study of Neutron Soft Error Rate (SER) Sensitivity: Investigation of Upset Mechanisms by Comparative Simulation of FinFET and Planar MOSFET SRAMsNoh, Jinhyun / Correas, Vincent / Lee, Soonyoung / Jeon, Jongsung / Nofal, Issam / Cerba, Jacques / Belhaddad, Hafnaoui / Alexandrescu, Dan / Lee, YoungKeun / Kwon, Steve et al. | 2015
- 1650
-
Total Dose Radiation Damage: A Simulation FrameworkPatrick, Erin / Rowsey, Nicole / Law, Mark E. et al. | 2015
- 1658
-
Improved Model for Increased Surface Recombination Current in Irradiated Bipolar Junction TransistorsBarnaby, H. J. / Vermeire, B. / Campola, M. J. et al. | 2015
- 1665
-
Numerical Modeling of MOS Dosimeters Under Switched Bias IrradiationsSambuco Salomone, L. / Faigon, A. / Redin, E. G. et al. | 2015
- 1674
-
System Health Awareness in Total-Ionizing Dose EnvironmentsDiggins, Zachary J. / Mahadevan, Nagabhushan / Pitt, E. Bryn / Herbison, Daniel / Karsai, Gabor / Sierawski, Brian D. / Barth, Eric J. / Reed, Robert A. / Schrimpf, Ronald D. / Weller, Robert A. et al. | 2015
- 1682
-
$1/f$ Noise Model for NPN Bipolar Junction Transistors Based on Radiation EffectZhao, Qifeng / Zhuang, Yiqi / Bao, Junlin / Hu, Wei et al. | 2015
- 1689
-
Novel Bonner Sphere Spectrometer Response Functions Using MCNP6Decker, Andrew W. / McHale, Stephen R. / Shannon, Michael P. / Clinton, Justin A. / McClory, John W. et al. | 2015
- 1695
-
Effect of Multiple Scattering on the Compton Recoil Current Generated in an EMP, RevisitedFarmer, William A. / Friedman, Alex et al. | 2015
- 1707
-
IEEE Copyright Form| 2015
- 1711
-
Improvement of Real-Time Tritium Monitor for Low-Level Measurement at HANAROKim, M. S. et al. | 2015
- 1716
-
Collimator Design for a Brain SPECT/MRI InsertSalvado, Debora / Erlandsson, Kjell / Bousse, Alexandre / Occhipinti, Michele / Busca, Paolo / Fiorini, Carlo / Hutton, Brian F. et al. | 2015
- 1725
-
Effects of Regularisation Priors and Anatomical Partial Volume Correction on Dynamic PET DataCaldeira, Liliana L. / da Silva, Nuno / Scheins, Jurgen J. / Gaens, Michaela E. / Shah, N. Jon et al. | 2015
- 1732
-
A $z$-Vertex Trigger for Belle IISkambraks, S. / Abudinen, F. / Chen, Y. / Feindt, M. / Fruhwirth, R. / Heck, M. / Kiesling, C. / Knoll, A. / Neuhaus, S. / Paul, S. et al. | 2015
- 1732
-
A Formula Not Shown -Vertex Trigger for Belle IISkambraks, S. / Abudinen, F. / Chen, Y. / Feindt, M. / Fruhwirth, R. / Heck, M. / Kiesling, C. / Knoll, A. / Neuhaus, S. / Paul, S. et al. | 2015
- 1741
-
Readout Electronics for the Central Drift Chamber of the Belle-II DetectorUchida, Tomohisa / Taniguchi, Takashi / Ikeno, Masahiro / Iwasaki, Yoshihito / Saito, Masatoshi / Shimazaki, Shoichi / Tanaka, Manobu M. / Taniguchi, Nanae / Uno, Shoji et al. | 2015
- 1747
-
A 32 Terabit/s Data Acquisition from Mostly COTS ComponentsSchwemmer, Rainer / Neufeld, Niko et al. | 2015
- 1752
-
100 Gbps PCI-Express Readout for the LHCb UpgradeDurante, Paolo / Neufeld, Niko / Schwemmer, Rainer / Marconi, Umberto / Balbi, Gabriele / Lax, Ignazio et al. | 2015
- 1758
-
NSTX-U Advances in Real-Time C++11 on LinuxErickson, Keith G. et al. | 2015
- 1766
-
Improvement of Nonlinearity Correction for BESIII ETOF UpgradeSun, Weijia / Cao, Ping / Ji, Xiaolu / Fan, Huanhuan / Dai, Hongliang / Zhang, Jie / Liu, Shubin / An, Qi et al. | 2015
- 1771
-
Analysis of Hamming EDAC SRAMs Using Simplified Birthday StatisticsTausch, Hans J. / Puchner, Helmut et al. | 2015
- 1779
-
Improving and Characterizing (Cd,Zn)Te Crystals for Detecting Gamma-Ray RadiationDavydov, L. / Fochuk, P. / Zakharchenko, A. / Kutny, V. / Rybka, A. / Kovalenko, N. / Sulima, S. / Terzin, I. / Gerasimenko, A. / Kosmyna, M. et al. | 2015
- 1785
-
Quantification of the Conditioning Phase in Cooled Pixelated TlBr DetectorsKoehler, Will / He, Zhong / O'Neal, Sean / Yang, Hao / Kim, Hadong / Cirignano, Leonard / Shah, Kanai et al. | 2015
- 1791
-
Solid State Organic X-Ray Detectors Based on Rubrene Single CrystalsBasirico, Laura / Ciavatti, Andrea / Sibilia, Mirta / Fraleoni-Morgera, Alessandro / Trabattoni, Silvia / Sassella, Adele / Fraboni, Beatrice et al. | 2015
- 1798
-
Characteristics of an Energy-Resolving System Using Dynamic Time Over Threshold MethodTian, Yang / Takahashi, Hiroyuki / Shimazoe, Kenji et al. | 2015
- 1805
-
Investigation of Geant4 Simulation of Electron BackscatteringBasaglia, Tullio / Han, Min Cheol / Hoff, Gabriela / Kim, Chan Hyeong / Kim, Sung Hun / Pia, Maria Grazia / Saracco, Paolo et al. | 2015
- 1813
-
Effect of Non-Alignment/Alignment of Attenuation Map Without/With Emission Motion Correction in Cardiac SPECT/CTDey, Joyoni / Segars, W. Paul / Pretorius, P. Hendrik / King, Michael A. et al. | 2015
- 1825
-
Characterization of Silicon Photomultipliers for nEXOOstrovskiy, I. / Retiere, F. / Auty, D. / Dalmasson, J. / Didberidze, T. / DeVoe, R. / Gratta, G. / Huth, L. / James, L. / Lupin-Jimenez, L. et al. | 2015
- 1837
-
A Novel Markov Random Field-Based Clustering Algorithm to Detect High-Z Objects With Cosmic RaysThomay, C. / Velthuis, J. J. / Baesso, P. / Cussans, D. / Steer, C. / Burns, J. / Quillin, S. / Stapleton, M. et al. | 2015
- 1849
-
Estimation of Minimum DNBR Using Cascaded Fuzzy Neural NetworksKim, Dong Yeong / Yoo, Kwae Hwan / Na, Man Gyun et al. | 2015
- 1857
-
Adaptive fading memory filter design for compensation of delayed components in self powered flux detectorsTamboli, P.K et al. | 2015
- 1857
-
Adaptive Fading Memory \infty} Filter Design for Compensation of Delayed Components in Self Powered Flux DetectorsTamboli, Prakash Kumar et al. | 2015
- 1857
-
Adaptive Fading Memory ${{\bf H}_\infty} $ Filter Design for Compensation of Delayed Components in Self Powered Flux DetectorsTamboli, Prakash Kumar / Duttagupta, Siddhartha P. / Roy, Kallol et al. | 2015
- 1865
-
Methodology for the Determination of the Photon Detection Efficiency of Large-Area Multi-Pixel Photon CountersBeattie, T. / Lolos, G. J. / Papandreou, Z. / Semenov, A. Yu. / Teigrob, L. A. et al. | 2015
- 1873
-
Radiation Induced Response of 3 Based Tunable Capacitors Under Gamma IrradiationBarala, Surendra Singh et al. | 2015
- 1873
-
Radiation Induced Response of ${\rm Ba}_{0.5}{\rm Sr}_{0.5}{\rm TiO}_3$ Based Tunable Capacitors Under Gamma IrradiationBarala, Surendra Singh / Singh, Jitendra / Ranwa, Sapana / Kumar, Mahesh et al. | 2015
- 1873
-
Radiation induced response of based tunable capacitors under gamma irradiationBarala, S.S et al. | 2015
- 1879
-
3D Thermal and Mechanical Analysis of a Single Event BurnoutPeretti, Gabriela / Demarco, Gustavo / Romero, Eduardo / Tais, Carlos et al. | 2015
- 1888
-
Supply Voltage Dependency on the Single Event Upset Susceptibility of Temporal Dual-Feedback Flip-Flops in a 90 nm Bulk CMOS ProcessHasanbegovic, Amir / Aunet, Snorre et al. | 2015
- 1898
-
Supply Voltage Dependence of Heavy Ion Induced SEEs on 65 nm CMOS Bulk SRAMsWu, Qiong / Li, Yuanqing / Chen, Li / He, Anlin / Guo, Gang / Baeg, Sang H. / Wang, Haibin / Liu, Rui / Li, Lixiang / Wen, Shi-Jie et al. | 2015
- 1905
-
Application of p-Channel Power VDMOSFET as a High Radiation Doses SensorPejovic, Milic M. et al. | 2015
- 1911
-
A Filtered Back-Projection Algorithm for $4\pi $ Compton Camera DataHaefner, Andrew / Gunter, Donald / Barnowski, Ross / Vetter, Kai et al. | 2015
- 1911
-
A Filtered Back-Projection Algorithm for 4π Compton Camera DataHaefner, Andrew et al. | 2015
- 1918
-
X-Ray Transmission Characteristic Measurements of Polycapillary Optics Installed in an Analytical Electron MicroscopeTakano, Akira / Maehata, Keisuke / Iyomoto, Naoko / Hara, Toru / Mitsuda, Kazuhisa / Yamasaki, Noriko / Tanaka, Keiichi et al. | 2015
- 1923
-
IEEE membership can help you reach your personal goals| 2015
- 1924
-
2015 IEEE nuclear science symposium and medical imaging conference| 2015
- C1
-
frontcover| 2015
- C2
-
IEEE Transactions on Nuclear Science publication information| 2015
- C3
-
IEEE Transactions on Nuclear Science information for authors| 2015
- C4
-
Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2015