Deep Photometric Stereo Networks for Determining Surface Normal and Reflectances (Englisch)
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- Neue Suche nach: Santo, Hiroaki
- Weitere Informationen zu Santo, Hiroaki:
- https://orcid.org/0000-0003-2891-5993
- Neue Suche nach: Samejima, Masaki
- Weitere Informationen zu Samejima, Masaki:
- https://orcid.org/0000-0002-9704-2711
- Neue Suche nach: Sugano, Yusuke
- Weitere Informationen zu Sugano, Yusuke:
- https://orcid.org/0000-0003-4206-710X
- Neue Suche nach: Shi, Boxin
- Weitere Informationen zu Shi, Boxin:
- https://orcid.org/0000-0001-6749-0364
- Neue Suche nach: Matsushita, Yasuyuki
- Weitere Informationen zu Matsushita, Yasuyuki:
- https://orcid.org/0000-0002-1935-4752
- Neue Suche nach: Santo, Hiroaki
- Weitere Informationen zu Santo, Hiroaki:
- https://orcid.org/0000-0003-2891-5993
- Neue Suche nach: Samejima, Masaki
- Weitere Informationen zu Samejima, Masaki:
- https://orcid.org/0000-0002-9704-2711
- Neue Suche nach: Sugano, Yusuke
- Weitere Informationen zu Sugano, Yusuke:
- https://orcid.org/0000-0003-4206-710X
- Neue Suche nach: Shi, Boxin
- Weitere Informationen zu Shi, Boxin:
- https://orcid.org/0000-0001-6749-0364
- Neue Suche nach: Matsushita, Yasuyuki
- Weitere Informationen zu Matsushita, Yasuyuki:
- https://orcid.org/0000-0002-1935-4752
In:
IEEE Transactions on Pattern Analysis and Machine Intelligence
;
44
, 1
;
114-128
;
2022
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Deep Photometric Stereo Networks for Determining Surface Normal and Reflectances
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Beteiligte:Santo, Hiroaki ( Autor:in ) / Samejima, Masaki ( Autor:in ) / Sugano, Yusuke ( Autor:in ) / Shi, Boxin ( Autor:in ) / Matsushita, Yasuyuki ( Autor:in )
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Erschienen in:IEEE Transactions on Pattern Analysis and Machine Intelligence ; 44, 1 ; 114-128
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Verlag:
- Neue Suche nach: IEEE
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Erscheinungsdatum:01.01.2022
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Format / Umfang:9057656 byte
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Lizenzbestimmungen:
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Datenquelle:
Inhaltsverzeichnis – Band 44, Ausgabe 1
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Table of Contents| 2022
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[Front inside cover]| 2022
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[Back inside cover]| 2022
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[Back cover]| 2022