Photoconductive terahertz emitter with an integrated semiconductor Bragg mirror (Englisch)
- Neue Suche nach: Darmo, J.
- Neue Suche nach: Muller, T.
- Neue Suche nach: Strasser, G.
- Neue Suche nach: Unterrainer, K.
- Neue Suche nach: Le, T.
- Neue Suche nach: Tempea, G.
- Neue Suche nach: Stingl, A.
- Neue Suche nach: Darmo, J.
- Neue Suche nach: Muller, T.
- Neue Suche nach: Strasser, G.
- Neue Suche nach: Unterrainer, K.
- Neue Suche nach: Le, T.
- Neue Suche nach: Tempea, G.
- Neue Suche nach: Stingl, A.
In:
The Fourth International Conference on Advanced Semiconductor Devices and Microsystem
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179-182
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2002
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ISBN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Photoconductive terahertz emitter with an integrated semiconductor Bragg mirror
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Beteiligte:Darmo, J. ( Autor:in ) / Muller, T. ( Autor:in ) / Strasser, G. ( Autor:in ) / Unterrainer, K. ( Autor:in ) / Le, T. ( Autor:in ) / Tempea, G. ( Autor:in ) / Stingl, A. ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: IEEE
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Erscheinungsdatum:01.01.2002
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Format / Umfang:186314 byte
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ISBN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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- 13
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- 35
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- 71
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Charge properties of MIS structures Ni-Dy/sub x/O/sub y/-n-Si [100]Babushkina, N.V. / Malyshev, S.A. / Romanova, L.I. / Chizh, A.L. / Zhygulin, D.V. et al. | 2002
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- 79
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- 79
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Electron emission from diamond layer on tungsten wire measured in cylindrical electrode system configurationJanik, J. / Balon, F. / Kromka, A. / Dubravcova, V. / Kadlecikova, M. / Krepsova, P. / IEEE / Slovak University of Technology et al. | 2002
- 83
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Studies of dielectric characteristics of spin-coated polyimide filmsMatay, L. et al. | 2002
- 87
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- 91
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- 95
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- 125
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- 133
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Author index| 2002
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ASDAM '02. Conference Proceedings. Fourth International Conference on Advanced Semiconductor Devices and Microsystems| 2002