Application of Transimpedance Amplifiers in PIN Photodiode Dosimetry (Englisch)
- Neue Suche nach: Spahic, L.
- Neue Suche nach: Ilic, S.
- Neue Suche nach: Andelkovic, M.
- Neue Suche nach: Palma, A. J.
- Neue Suche nach: Ristic, G. S.
- Neue Suche nach: Spahic, L.
- Neue Suche nach: Ilic, S.
- Neue Suche nach: Andelkovic, M.
- Neue Suche nach: Palma, A. J.
- Neue Suche nach: Ristic, G. S.
In:
2021 IEEE 32nd International Conference on Microelectronics (MIEL)
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317-320
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2021
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Application of Transimpedance Amplifiers in PIN Photodiode Dosimetry
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Beteiligte:Spahic, L. ( Autor:in ) / Ilic, S. ( Autor:in ) / Andelkovic, M. ( Autor:in ) / Palma, A. J. ( Autor:in ) / Ristic, G. S. ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: IEEE
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Erscheinungsdatum:12.09.2021
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Format / Umfang:702379 byte
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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2021 IEEE 32nd International Conference on Microelectronics Proceedings [Title page]| 2021
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2021 IEEE 32nd International Conference on Microelectronics Proceedings| 2021
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[Copyright notice]| 2021
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MIEL 2019 Best Paper Awards [4 awards]| 2021
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Passivation Properties of Atomic-Layer-Deposited Hafnium Oxide on Black Silicon SurfaceAyvazyan, G. Y. / Aghabekyan, A.V. / Hakhoyan, L.A. / Katkov, M.V. / Lebedev, M.S. et al. | 2021
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Optimization of HfO2/Al2O3 Dielectric Stacks for Charge Trapping MemoriesSpassov, D. / Paskaleva, A. et al. | 2021
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Structural, Electrical and Mechanical Behavior of Thin Copper Coatings Obtained by Various Electrodeposition ProcessesMladenovic, I. / Boskovic, M. / Lamovec, J. / Vuksanovic, M. / Nikolic, N. D. / Radojevic, V. / Vasiljevic-Radovic, D. et al. | 2021
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Process Considerations for Screen-Printed Thick-Film MEMSStanimirovic, Z. / Stanimirovic, I. et al. | 2021
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Examples of Wide Microwave Bandpass Microstrip Filters on Felt SubstrateNesic, D. et al. | 2021
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A New Optimization and Statistical Analysis for Widlar Current Source using Predictive MOSFET ModelsGheorghe, L. A. / Dobrescu, D. / Busu, I. / Dobrescu, L. et al. | 2021
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AMOS Temperature-Insensitive Voltage Divider and Its Application for Voltage Reference DesignDanilov, I. A. / Gorbunov, M. S. / Nikiforov, A. Y. et al. | 2021
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The WEAF Mnecosystem - A Vision of Micro/Nanotechnologies to Empower the 6G and Super-IoT Future ParadigmsIannacci, J. et al. | 2021
- 317
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Application of Transimpedance Amplifiers in PIN Photodiode DosimetrySpahic, L. / Ilic, S. / Andelkovic, M. / Palma, A. J. / Ristic, G. S. et al. | 2021
- 321
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Masking of SET in a CMOS Triple Majority Gate on Logic NAND under Impacts of Single Ionizing ParticlesKatunin, Yu. V. / Stenin, V. Ya. et al. | 2021
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Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS TransistorsVeljkovic, S. / Mitrovic, N. / Djoric-Veljkovic, S. / Davidovic, V. / Manic, I. / Golubovic, S. / Paskaleva, A. / Spassov, D. / Prijic, Z. / Prijic, A. et al. | 2021
- 351
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Application of MISFETs for Irradiation Dose Rate MeasurementPodlepetsky, B. / Pershenkov, V. / Bakerenkov, A. / Felitsyn, V. et al. | 2021
- 357
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Evaluation of Organic Light-Emitting Diodes Total Ionizing Dose Sensitivity in Temperature RangeMozhaev, R. K. / Pechenkin, A. A. / Ukolov, D. S. / Ulanova, A. V. / Nikiforov, A. Yu. et al. | 2021
- 361
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Testing for Enhanced Low Dose Rate Sensitivity and Reduced Low Dose Rate Sensitivity Bipolar DevicesPershenkov, V. S. / Felitsyn, V. A. / Bakerenkov, A. S. / Rodin, A. S. / Telets, V. A. / Belyakov, V. V. / Kovsharov, I. D. / Zhukov, A. I. et al. | 2021
- 365
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Total Ionizing Dose Sensitivity of 180 nm Silicon-on-Insulator Microwave Low-Noise AmplifierGorbunov, M.S. / Zhidkov, N.M. / Sotskov, D. I. / Kuznetsov, A. G. / Kotov, V. N. / Elesin, V. V. / Selishchev, I. A. et al. | 2021
- 369
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Technique for Numerical Simulation of Post-irradiation Annealing Including Temperature Drift of Electrical Parameters of Devices under TestBakerenkov, A. S. / Rodin, A. S. / Felitsyn, V. A. / Pershenkov, V. S. / Zhukov, A. I. et al. | 2021
- 371
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TID Impact on SEL Sensitivity in the Case of High Latchup Holding VoltageNovikov, A. A. / Shvetsov-Shilovskiy, I. I. / Oblova, E. N. / Pechenkin, A. A. / Chumakov, A. I. et al. | 2021
- 375
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The Effects of the External Conditions of CMOS IC Functioning on Latchup Occurrence under Uniform Laser IrradiationShvetsov-Shilovskiy, I. I. / Chumakov, A. I. / Pechenkin, A. A. / Bobrovskiy, D. V. et al. | 2021
- 379
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A CMOS 10-Bit 3MS/s Rad-Hard DAC Based on Resistor String Poly-MatrixCalligaro, C. / Gatti, U. et al. | 2021
- 383
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Author Index| 2021
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Steering Committee| 2021
- V
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Contents| 2021
- XV
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In Respectful Memory of Professor Ninoslav Stojadinović| 2021