Sequential circuits applicable for detecting different types of faults (Englisch)
- Neue Suche nach: Levin, I.
- Neue Suche nach: Sinelnikov, V.
- Neue Suche nach: Karpovsky, M.
- Neue Suche nach: Ostanin, S.
- Neue Suche nach: Levin, I.
- Neue Suche nach: Sinelnikov, V.
- Neue Suche nach: Karpovsky, M.
- Neue Suche nach: Ostanin, S.
In:
Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)
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44-48
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2002
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ISBN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Sequential circuits applicable for detecting different types of faults
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Beteiligte:Levin, I. ( Autor:in ) / Sinelnikov, V. ( Autor:in ) / Karpovsky, M. ( Autor:in ) / Ostanin, S. ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: IEEE
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Erscheinungsdatum:01.01.2002
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Format / Umfang:306008 byte
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ISBN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
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Author index| 2002
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Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)| 2002