Challenges in Automotive Memory Solutions (Englisch)
- Neue Suche nach: Wang, Hai
- Neue Suche nach: Wang, Hai
In:
2018 IEEE International Memory Workshop (IMW)
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1-7
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2018
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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Engineering and Stack Optimization of Cu -Based Selector Devices for Low Power SCM ApplicationsBarci, Marinela / Fantini, Andrea / Redolfi, Augusto / Kundu, Shreya / Belmonte, Attilio / Devulder, Wouter / Opsomer, Karl / Delhougne, Romain / Goux, Ludovic / Sankar Kar, Gouri et al. | 2018
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High-Quality PUF Extraction from Commercial RRAM Using Switching-Time VariabilitySuri, Manan / Chakraborty, Supriya et al. | 2018
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Scaling of Split-Gate Flash Memory with 1.05V Select Transistor for 28 nm Embedded Flash TechnologyDo, Nhan / Yang, J.W. / Sheng, Y. J. / Su, C. S. / Wu, M. T. / Ouyang, H. / Liang, H. / Hariharan, S. / Tadayoni, M. / Norman, J. et al. | 2018
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Atom Switch with Improved Cycle Endurance using Field Enhancement for Nonvolatile SoCSakamoto, Toshitsugu / Tsuji, Yukihide / Bai, Xu / Miyamura, Makoto / Morioka, Ayuka / Nebashi, Ryusuke / Banno, Naoki / Okamoto, Koichiro / Iguchi, Noriyuki / Hada, Hiromitsu et al. | 2018
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Cross Point Cu-ReRAM with BC-Doped SelectorOhba, Kazuhiro / Yasuda, Shuichiro / Mizuguchi, Tetsuya / Sei, Hiroaki / Tsushima, Tomohito / Shimuta, Masayuki / Shiimoto, Tsunenori / Yamamoto, Tetsuya / Sone, Takeyuki / Nonoguchi, Seiji et al. | 2018
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High-Endurance Ferroelectric NOR Flash Memory Using (Ca,Sr)Bi2Ta2O9 FeFETsTakahashi, Mitsue / Zhang, Wei / Sakai, Shigeki et al. | 2018
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Low Cost Diode as Selector Device for Embedded Phase Change Memory in Advanced FD-SOI TechnologyFagot, Jean-Jacques / Boivin, Philippe / Della-Marca, Vincenzo / Postel-Pellerin, Jeremie / Deleruyelle, Damien / Weber, Olivier / Richard, Emmanuel / Arnaud, Franck et al. | 2018
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3D Flash Memory for Data-Intensive ApplicationsInaba, Satoshi et al. | 2018
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On the Key Impact of Composition of Ge-Te and Ge-Se Electrolytes on CBRAM PropertiesRadhakrishnan, Janaki / Belmonte, Attilio / Witters, Thomas / Clima, Sergiu / Redolfi, Augusto / Kar, Gouri Sankar / Houssa, Michel / Goux, Ludovic et al. | 2018
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Optimizing Programming Energy for Improved RRAM Reliability for High Endurance ApplicationsSassine, Gilbert / Alfaro Robayo, Diego / Nail, Cecile / Nodin, Jean-Francois / Coignus, Jean / Molas, Gabriel / Nowak, Etienne et al. | 2018
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Phase-Change Memory: Performance, Roles and ChallengesNavarro, Gabriele / Bourgeois, Guillaume / Kluge, Julia / Serra, Anna Lisa / Verdy, Anthonin / Garrione, Julien / Cyrille, Marie-Claire / Bernier, Nicolas / Jannaud, Audrey / Sabbione, Chiara et al. | 2018
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Oxygen Distribution around Filament in Ta-O Resistive RAM Fabricated Using 40 nm CMOS TechnologyArita, Masashi / Tsurumaki-Fukuchi, Atsushi / Takahashi, Yasuo / Wei, Zhiqiang / Muraoka, Shunsaku / Ito, Satoru / Yoneda, Shinichi et al. | 2018
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Self-Referenced Read Methodology for EMsSforzin, Marco / Mirichigni, Graziano / Orlando, Alessandro / Amato, Paolo et al. | 2018
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Temperature Limits of Single and Composite Storage Layer with Different Thicknesses and Capping Materials for p-STT-MRAM ApplicationsTillie, Luc / Chatterjee, Jyotirmoy / Sousa, Ricardo / Auffret, Stephane / Guelfucci, Jude / Nowak, Etienne / Dieny, Bernard / Prejbeanu, Ioan-Lucian / Lamard, N. et al. | 2018
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Challenges in Automotive Memory SolutionsWang, Hai et al. | 2018
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Error Characterization and ECC Usage Relaxation beyond 20nm Floating Gate NAND Flash MemoryKu, S.H. / Lin, T.W. / Cheng, C.H. / Lee, C.W. / Chen, Ti-Wen / Tsai, Wen-Jer / Lu, T.C. / Lu, W.P. / Chen, K.C. / Wang, Tahui et al. | 2018
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Ferroelectric HfO2 and Its Impact on the Memory LandscapeMueller, Stefan et al. | 2018
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Error-Reduction Controller Techniques of TaOx-Based ReRAM for Deep Neural Networks to Extend Data-Retention Lifetime by Over 1700xDeguchi, Yoshiaki / Maeda, Kazuki / Suzuki, Shun / Nakamura, Toshiki / Takeuchi, Ken et al. | 2018
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Understanding Endurance in TiN/a-Si/TiOx/TiN RRAM DevicesSubhechha, Subhali / Degraeve, Robin / Belmonte, Attilio / Goux, Ludovic / Luca Donadio, Gabriele / Roussel, Philippe / De Meyer, Kristin / Van Houdt, Jan / Kar, Gouri Sankar et al. | 2018
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A Built-In Self Test Compensating Process-Voltage Variation in Data Paths of High Performance DRAMsPark, Juseop / Kwon, Kee-Won et al. | 2018
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Cost Effective FinFET Platform for Stand Alone DRAM 1Y and Beyond Memory PeripherySpessot, Alessio / Sharan, Neha / Oh, Hyungrock / Ritzenthaler, Romain / Litta, Eugenio Dentoni / O'Sullivan, Barry / Mallik, Arindam / De Keersgieter, An / Parvais, Bertrand / Sherazi, Yasser et al. | 2018
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Cu Filament Based Resistive Switching and Oxidation Reduction through Dopamine Sensing in Novel Cu/MoS2/TinN StructureDutta, Mrinmoy / Ginnaram, Sreekanth / Roy, Anisha / Maikap, Siddheswar et al. | 2018
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DRAM Retention at Cryogenic TemperaturesWang, Fiona / Vogelsang, Thomas / Haukness, Brent / Magee, Stephen C. et al. | 2018
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Enhancing Magnetic Immunity of STT-MRAM with Magnetic ShieldingBhushan, Bharat / Guan, Lim Teck / Shum, Danny / Ching, Eva Wai Leong / Jung, Boo Yang / Lim, Wei Yi / Yi, Wanbing / Poh, Francis / Tan, Juan Boon et al. | 2018
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System Performance Analysis of Bit-Alterable 3D NAND Flash Devices for High-Performance Solid-State Drive (SSD) ApplicationsChang, Hung-Sheng / Lue, Hang-Ting / Chang, Yuan-Hao / Li, Hsiang-Pang / Wang, Keh-Chung / Lu, Chih-Yuan et al. | 2018
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Study of Thyristor-Mode Dual-Channel NAND Flash DevicesLo, Roger / Lue, Hang-Ting / Chen, Wei-Chen / Du, Pei-Ying / Hsu, Tzu-Hsuan / Hou, Tuo-Hung / Wang, Keh-Chung / Lu, Chih-Yuan et al. | 2018
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High Density 3D Cross-Point STT-MRAMHuai, Yiming / Yang, Hongxin / Hao, Xiaojie / Wang, Zihui / Malmhall, Roger / Sato, Kimihiro / Zhang, Jing / Jung, Dong Ha / Wang, Xiaobin / Xu, Pengfa et al. | 2018
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RRAM/CMOS-Hybrid Architecture of Annealing Processor for Fully Connected Ising ModelMatsumoto, Shogo / Gyoten, Hidenori / Hiromoto, Masayuki / Sato, Takashi et al. | 2018
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The Analysis of Erase Voltage Variability in 70-nm Split-Gate Flash Memory ArraysTkachev, Yuri / Yoo, Jong-Won / Kotov, Alexander / Clark, Lawrence T. / Holbert, Keith E. et al. | 2018
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40nm & 22nm Embedded Charge Trap Flash for Automotive ApplicationsPak, James / Chen, Chun / Chang, Kuo-Tung / Shetty, Shiva / Tu, Amy / Neo, Jonas / Singh, Pawan / Amato, Stefano / Givant, Amichai / Thurgate, Tim et al. | 2018
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40 nm Ultralow-Power Charge-Trap Embedded NVM Technology for IoT ApplicationsKouznetsov, Igor / Ramkumar, Krishnaswamy / Prabhakar, Venkatraman / Hinh, Long / Shih, H.M. / Saha, S. / Govindaswamy, S. / Amundson, M. / Dalton, D. / Phan, T. et al. | 2018
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In-Memory Computing with Memristor ArraysLi, Can / Belkin, Daniel / Li, Yunning / Yan, Peng / Hu, Miao / Ge, Ning / Jiang, Hao / Montgomery, Eric / Lin, Peng / Wang, Zhonguir et al. | 2018
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Mott Memory Devices Based on the Mott Insulator (V1-xCrx)2O3Tranchant, Julien / Querre, Madec / Janod, Etienne / Besland, Marie-Paule / Corraze, Benoet / Cario, Laurent et al. | 2018
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1T-1MTJ Type Embedded STT-MRAM with Advanced Low-Damage and Short-Failure-Free RIE Technology down to 32 nmφ MTJ PatterningSato, Hideo / Watanabe, Toshinari / Koike, Hiroki / Saito, Takashi / Miura, Sadahiko / Honjo, Hiroaki / Inoue, Hirofumi / Ikeda, Shoji / Noguchi, Yasuo / Tanigawa, Takaho et al. | 2018
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Materials and Processes for Emerging MemoriesPakala, Mahendra / Xue, Lin / Yu, Minrui / Frei, Michel / Nistor, Lavinia / Ahn, Jaesoo et al. | 2018
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Switching and Failure Mechanism of Self-Selective Cell in 3D VRRAM by RTN-Based Defect Tracking TechniqueGong, Tiancheng / Luo, Qing / Lv, Hangbing / Xu, Xiaoxin / Yu, Jie / Yuan, Peng / Dong, Danian / Chen, Chuanbing / Yin, Jiahao / Tai, Lu et al. | 2018
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A Comprehensive Study on DDR4 MRAM and ReRAM Power Estimation Using a Parameterized NVM Power CalculatorChoi, Won Ho / Lueker-Boden, Martin / Grobis, Michael / Robertson, Neil / Bandic, Zvonimir et al. | 2018
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Implementation of Functionally Complete Boolean Logic and 8-Bit Adder in CMOS Compatible 1T1R RRAMs for In-Memory ComputingWang, Zhuorui / Li, Yi / Su, Yu-Ting / Zhou, Yaxiong / Yin, Kangsheng / Cheng, Long / Chang, Ting-Chang / Xue, Kanhao / Sze, Simon / Miao, Xiangshui et al. | 2018
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ReRAM Technologies for Embedded Memory and Further ApplicationsIto, Satoru / Hayakawa, Yukio / Wei, Zhiqiang / Muraoka, Shunsaku / Kawashima, Koichi / Kotani, Hideto / Kouno, Kazuyuki / Nakamura, Masayoshi / Du, Guo An / Chen, Jiann Fu et al. | 2018
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High Temperature Stability and Performance Analysis of N-doped Ge-Se-Sb Based OTS Selector DevicesVerdy, Anthonin / Navarro, Gabriele / Bernard, Mathieu / Noe, Pierre / Bourgeois, Guillaume / Garrione, Julien / Cyrille, Marie-Claire / Sousa, Veronique / Nowak, Etienne et al. | 2018
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Study of Counter-Pulse (CP) Programming Method to Improve the Vt Distribution for 3D Charge-Trapping NAND Flash DevicesLee, Yung Chun / Chen, Wei-Chen / Lue, Hang-Ting / Hsieh, Chih-Chang / Chang, Kuo-Ping / Lin, Ping-Hsien / Li, Hsiang-Pang / Wang, Keh-Chung / Lu, Chih-Yuan et al. | 2018
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3D-NAND Flash Solid-State Drive (SSD) for Deep Neural Network Weight Storage of IoT Edge Devices with 700x Data-Retention Lifetime ExtentionDeguchi, Yoshiaki / Takeuchi, Ken et al. | 2018
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Ferroelectric TiN/Hf0.5Zr0.5O2/TiN Capacitors with Low-Voltage Operation and High Reliability for Next-Generation FRAM ApplicationsKim, Si Joon / Mohan, Jaidah / Young, Chadwin D. / Colombo, Luigi / Kim, Jiyoung / Summerfelt, Scott R. / San, Tamer et al. | 2018
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